Abstract

We demonstrate accurate two-dimensional mapping of the phase retardation induced by the electro-optic effect in lithium niobate crystals. Off-axis digital holography is used to investigate congruent z-cut crystals. The spatially resolved optical path difference is interferometrically measured while a linearly rising voltage ramp is applied to the crystal. This procedure provides information on the uniformity of crystals’ electro-optic properties and offers the ability to detect the presence of defects that is of fundamental importance for reliable processing of photonic devices.

© 2005 Optical Society of America

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