Abstract

The experimental results of self-injection locking of an antireflection-coated broad-area diode laser with a 1000-μm-wide emitting area are presented. To our knowledge, it is the broadest single-element diode laser that has been used in an external-feedback cavity until now. Usually, wide diode lasers suffer from filamentation, which leads to poor spatial beam quality. We show, however, that the beam quality of the diode laser is improved significantly when we use asymmetric self-injection locking. An output power of 2.05W is obtained with a beam quality factor M2 of 2.7. The self-injection locking technique improves the beam quality by a factor of 107. By comparing the results with those obtained with an ordinarily coated diode laser with a 1000-μm-wide emitter we show that antireflection coating on the front facet is decisive for this improvement in the beam quality.

© 2005 Optical Society of America

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2004 (2)

M. Chi, N.-S. Bøgh, B. Thestrup, and P. M. Petersen, Appl. Phys. Lett. 85, 1107 (2004).
[CrossRef]

M. Chi, B. Thestrup, and P. M. Petersen, Proc. SPIE 5336, 33 (2004).
[CrossRef]

2003 (1)

S. Wolff, A. Rodionov, V. E. Sherstobitov, and H. Fouckhardt, IEEE J. Quantum Electron. 39, 448 (2003).
[CrossRef]

2002 (1)

2000 (1)

S. Juul Jensen, M. Løbel, and P. M. Petersen, Appl. Phys. Lett. 76, 535 (2000).
[CrossRef]

1999 (2)

H. Horiuchi, T. Shimura, T. Omatsu, O. Matoba, and K. Kuroda, Appl. Phys. B 68, 1021 (1999).
[CrossRef]

S. Wolff, D. Messerschmidt, and H. Fouckhardt, Opt. Express 5, 32 (1999), http://www.opticsexpress.org.
[CrossRef] [PubMed]

1998 (1)

1996 (1)

R. M. R. Pillai and E. M. Garmire, IEEE J. Quantum Electron. 32, 996 (1996).
[CrossRef]

1994 (1)

1990 (1)

J.-M. Verdiell and R. Frey, IEEE J. Quantum Electron. 26, 270 (1990).
[CrossRef]

1988 (1)

L. Goldberg and M. K. Chun, Appl. Phys. Lett. 53, 1900 (1988).
[CrossRef]

1987 (1)

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

Berger, J.

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

Bøgh, N.-S.

M. Chi, N.-S. Bøgh, B. Thestrup, and P. M. Petersen, Appl. Phys. Lett. 85, 1107 (2004).
[CrossRef]

Chang-Hasnain, C. J.

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

Chi, M.

M. Chi, N.-S. Bøgh, B. Thestrup, and P. M. Petersen, Appl. Phys. Lett. 85, 1107 (2004).
[CrossRef]

M. Chi, B. Thestrup, and P. M. Petersen, Proc. SPIE 5336, 33 (2004).
[CrossRef]

Chun, M. K.

L. Goldberg and M. K. Chun, Appl. Phys. Lett. 53, 1900 (1988).
[CrossRef]

Dienes, A.

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

Feinberg, J.

Fouckhardt, H.

S. Wolff, A. Rodionov, V. E. Sherstobitov, and H. Fouckhardt, IEEE J. Quantum Electron. 39, 448 (2003).
[CrossRef]

S. Wolff, D. Messerschmidt, and H. Fouckhardt, Opt. Express 5, 32 (1999), http://www.opticsexpress.org.
[CrossRef] [PubMed]

Frey, R.

J.-M. Verdiell and R. Frey, IEEE J. Quantum Electron. 26, 270 (1990).
[CrossRef]

Garmire, E. M.

R. M. R. Pillai and E. M. Garmire, IEEE J. Quantum Electron. 32, 996 (1996).
[CrossRef]

Garrett, M. H.

Goldberg, L.

L. Goldberg and M. K. Chun, Appl. Phys. Lett. 53, 1900 (1988).
[CrossRef]

Horiuchi, H.

H. Horiuchi, T. Shimura, T. Omatsu, O. Matoba, and K. Kuroda, Appl. Phys. B 68, 1021 (1999).
[CrossRef]

Jensen, S. Juul

S. Juul Jensen, M. Løbel, and P. M. Petersen, Appl. Phys. Lett. 76, 535 (2000).
[CrossRef]

Johansen, P. M.

Kuroda, K.

H. Horiuchi, T. Shimura, T. Omatsu, O. Matoba, and K. Kuroda, Appl. Phys. B 68, 1021 (1999).
[CrossRef]

Løbel, M.

S. Juul Jensen, M. Løbel, and P. M. Petersen, Appl. Phys. Lett. 76, 535 (2000).
[CrossRef]

M. Løbel, P. M. Petersen, and P. M. Johansen, Opt. Lett. 23, 825 (1998).
[CrossRef]

MacCormack, S.

Matoba, O.

H. Horiuchi, T. Shimura, T. Omatsu, O. Matoba, and K. Kuroda, Appl. Phys. B 68, 1021 (1999).
[CrossRef]

Menzel, R.

Messerschmidt, D.

Omatsu, T.

H. Horiuchi, T. Shimura, T. Omatsu, O. Matoba, and K. Kuroda, Appl. Phys. B 68, 1021 (1999).
[CrossRef]

Petersen, P. M.

M. Chi, B. Thestrup, and P. M. Petersen, Proc. SPIE 5336, 33 (2004).
[CrossRef]

M. Chi, N.-S. Bøgh, B. Thestrup, and P. M. Petersen, Appl. Phys. Lett. 85, 1107 (2004).
[CrossRef]

S. Juul Jensen, M. Løbel, and P. M. Petersen, Appl. Phys. Lett. 76, 535 (2000).
[CrossRef]

M. Løbel, P. M. Petersen, and P. M. Johansen, Opt. Lett. 23, 825 (1998).
[CrossRef]

Pillai, R. M. R.

R. M. R. Pillai and E. M. Garmire, IEEE J. Quantum Electron. 32, 996 (1996).
[CrossRef]

Raab, V.

Rodionov, A.

S. Wolff, A. Rodionov, V. E. Sherstobitov, and H. Fouckhardt, IEEE J. Quantum Electron. 39, 448 (2003).
[CrossRef]

Scifres, D. R.

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

Sherstobitov, V. E.

S. Wolff, A. Rodionov, V. E. Sherstobitov, and H. Fouckhardt, IEEE J. Quantum Electron. 39, 448 (2003).
[CrossRef]

Shimura, T.

H. Horiuchi, T. Shimura, T. Omatsu, O. Matoba, and K. Kuroda, Appl. Phys. B 68, 1021 (1999).
[CrossRef]

Streifer, W.

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

Thestrup, B.

M. Chi, N.-S. Bøgh, B. Thestrup, and P. M. Petersen, Appl. Phys. Lett. 85, 1107 (2004).
[CrossRef]

M. Chi, B. Thestrup, and P. M. Petersen, Proc. SPIE 5336, 33 (2004).
[CrossRef]

Verdiell, J.-M.

J.-M. Verdiell and R. Frey, IEEE J. Quantum Electron. 26, 270 (1990).
[CrossRef]

Whinnery, J. R.

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

Wolff, S.

S. Wolff, A. Rodionov, V. E. Sherstobitov, and H. Fouckhardt, IEEE J. Quantum Electron. 39, 448 (2003).
[CrossRef]

S. Wolff, D. Messerschmidt, and H. Fouckhardt, Opt. Express 5, 32 (1999), http://www.opticsexpress.org.
[CrossRef] [PubMed]

Appl. Phys. B (1)

H. Horiuchi, T. Shimura, T. Omatsu, O. Matoba, and K. Kuroda, Appl. Phys. B 68, 1021 (1999).
[CrossRef]

Appl. Phys. Lett. (4)

C. J. Chang-Hasnain, J. Berger, D. R. Scifres, W. Streifer, J. R. Whinnery, and A. Dienes, Appl. Phys. Lett. 50, 1465 (1987).
[CrossRef]

L. Goldberg and M. K. Chun, Appl. Phys. Lett. 53, 1900 (1988).
[CrossRef]

M. Chi, N.-S. Bøgh, B. Thestrup, and P. M. Petersen, Appl. Phys. Lett. 85, 1107 (2004).
[CrossRef]

S. Juul Jensen, M. Løbel, and P. M. Petersen, Appl. Phys. Lett. 76, 535 (2000).
[CrossRef]

IEEE J. Quantum Electron. (3)

S. Wolff, A. Rodionov, V. E. Sherstobitov, and H. Fouckhardt, IEEE J. Quantum Electron. 39, 448 (2003).
[CrossRef]

J.-M. Verdiell and R. Frey, IEEE J. Quantum Electron. 26, 270 (1990).
[CrossRef]

R. M. R. Pillai and E. M. Garmire, IEEE J. Quantum Electron. 32, 996 (1996).
[CrossRef]

Opt. Express (1)

Opt. Lett. (3)

Proc. SPIE (1)

M. Chi, B. Thestrup, and P. M. Petersen, Proc. SPIE 5336, 33 (2004).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Experimental setup of the BAL system with SIL: NF, near field; FF, far field; HMR, half-mirror and razor blade (the units are millimeters).

Fig. 2
Fig. 2

Far-field profiles measured along the slow axis for the freely running laser (dotted curves) and the SIL laser system (solid curves) at injected current of (a) 7.0 A and (b) 11.0 A . For clarity, the data for the freely running laser have been multiplied by 10.

Fig. 3
Fig. 3

Beam width (FWHM) measurement of the output beam from the SIL laser system for the slow axis with injected currents of 7.0 A (squares) and 11.0 A (circles). The curves represent hyperbolic fits to the data. The relative positions of these curves are offset for clarity.

Fig. 4
Fig. 4

Near-field profile measurements in the slow axis for the freely running laser system (left curve) and the SIL laser system (right curve) at an operating current of 11.0 A .

Tables (1)

Tables Icon

Table 1 M 2 Values and Output Powers of the SIL System Based on BALs with Different Coatings

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