Abstract

Analysis and synthesis operations for a stack of dielectric layers with equal optical thickness are described in terms of the Wiener–Khintchine theorem with variables reflectance R and distribution of optical paths f. The method yields an infinite sequence of refractive indices that converge to a substrate index. An iterative process is used to determine the minimum phase solution, and all practical solutions are constructed from it by a root-shifting procedure. Realizability and practicability conditions are discussed.

© 1978 Optical Society of America

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