Abstract
We propose and demonstrate a new method for fabricating a compact all-fiber spectrometer by using a tilted superstructure fiber grating to couple light out of a fiber core and produce an interference pattern in the near field. The Fourier transform of the interference pattern serves as a direct measurement of the optical input spectrum, and the superstructure grating design offers several degrees of freedom that permit control over the resolution and bandwidth of the spectrometer. For single-wavelength operation, the proposed scheme offers the possibility of making wavelength measurements with picometer-level precision over a broad 80-nm wavelength range while simultaneously providing coarser precision over a 160-nm range.
© 2004 Optical Society of America
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