Abstract

Fabrics that have superstructures of colored squares, bands, etc., superimposed upon the basic web structure can be advantageously analyzed by use of near-infrared (NIR) illumination and a conventional monochrome camera. The reduction in contrast of the superstructure signal in the NIR image facilitates inspection of the fabric’s structure and defect segmentation. Underdetection and misdetection errors are noticeably reduced. This inspection takes advantage of the residual sensitivity of a monochrome camera, which can reach 1000 nm. The light source is an array of NIR LEDs emitting in a band to which the camera is still sensitive. NIR visual inspection can be performed by machines or by humans. In the latter case the observer looks at the NIR image of the fabric displayed on a TV monitor.

© 2004 Optical Society of America

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References

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  1. L. Northon, M. Bradshaw, and A. J. Jewell, Machine Vision Inspection of Web Textile Fabric, Vol. MS97 of SPIE Milestone Series (SPIE, Bellingham, Wash., 1994).
  2. R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
    [Crossref]
  3. E. J. Wood, Textile Res. J. 60, 212 (1990).
    [Crossref]
  4. M. S. Millán and J. Escofet, Appl. Opt. 35, 6253 (1996).
    [Crossref]
  5. J. Escofet, R. Navarro, M. S. Millán, and J. Pladellorens, Opt. Eng. 37, 2297 (1998).
    [Crossref]
  6. A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recognition 35, 2973 (2002).
    [Crossref]
  7. D. A. Burns and E. W. Ciurczak, Handbook of Near-Infrared Analysis (NIR Publications, Chichester, UK, 1999).
  8. K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
    [Crossref]
  9. http://www.pulnix.com/PDFs/IMG-PDFs/sptrlrspds.pdf .

2002 (1)

A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recognition 35, 2973 (2002).
[Crossref]

2001 (1)

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

1998 (1)

J. Escofet, R. Navarro, M. S. Millán, and J. Pladellorens, Opt. Eng. 37, 2297 (1998).
[Crossref]

1996 (1)

1994 (1)

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

1990 (1)

E. J. Wood, Textile Res. J. 60, 212 (1990).
[Crossref]

Aldrich, B.

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

Bennamoun, M.

A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recognition 35, 2973 (2002).
[Crossref]

Bodnarova, A.

A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recognition 35, 2973 (2002).
[Crossref]

Bradshaw, M.

L. Northon, M. Bradshaw, and A. J. Jewell, Machine Vision Inspection of Web Textile Fabric, Vol. MS97 of SPIE Milestone Series (SPIE, Bellingham, Wash., 1994).

Bunding Lee, K. A.

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

Burns, D. A.

D. A. Burns and E. W. Ciurczak, Handbook of Near-Infrared Analysis (NIR Publications, Chichester, UK, 1999).

Ciurczak, E. W.

D. A. Burns and E. W. Ciurczak, Handbook of Near-Infrared Analysis (NIR Publications, Chichester, UK, 1999).

Escofet, J.

J. Escofet, R. Navarro, M. S. Millán, and J. Pladellorens, Opt. Eng. 37, 2297 (1998).
[Crossref]

M. S. Millán and J. Escofet, Appl. Opt. 35, 6253 (1996).
[Crossref]

Jewell, A. J.

L. Northon, M. Bradshaw, and A. J. Jewell, Machine Vision Inspection of Web Textile Fabric, Vol. MS97 of SPIE Milestone Series (SPIE, Bellingham, Wash., 1994).

Karayiannis, Y.

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

Koubias, S.

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

Koulamas, C.

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

Kuesten, C. L.

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

Latham, S.

A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recognition 35, 2973 (2002).
[Crossref]

Luccas, M. H.

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

Millán, M. S.

J. Escofet, R. Navarro, M. S. Millán, and J. Pladellorens, Opt. Eng. 37, 2297 (1998).
[Crossref]

M. S. Millán and J. Escofet, Appl. Opt. 35, 6253 (1996).
[Crossref]

Mitropulos, P.

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

Navarro, R.

J. Escofet, R. Navarro, M. S. Millán, and J. Pladellorens, Opt. Eng. 37, 2297 (1998).
[Crossref]

Northon, L.

L. Northon, M. Bradshaw, and A. J. Jewell, Machine Vision Inspection of Web Textile Fabric, Vol. MS97 of SPIE Milestone Series (SPIE, Bellingham, Wash., 1994).

O’Brien, J.

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

Papadopoulos, G.

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

Pladellorens, J.

J. Escofet, R. Navarro, M. S. Millán, and J. Pladellorens, Opt. Eng. 37, 2297 (1998).
[Crossref]

Sramek, J.

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

Stojanovic, R.

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

Wood, E. J.

E. J. Wood, Textile Res. J. 60, 212 (1990).
[Crossref]

Appl. Opt. (1)

J. Near Infrared Spectrosc. (1)

K. A. Bunding Lee, J. O’Brien, C. L. Kuesten, J. Sramek, M. H. Luccas, and B. Aldrich, J. Near Infrared Spectrosc. 2, 101 (1994).
[Crossref]

Opt. Eng. (1)

J. Escofet, R. Navarro, M. S. Millán, and J. Pladellorens, Opt. Eng. 37, 2297 (1998).
[Crossref]

Pattern Recognition (1)

A. Bodnarova, M. Bennamoun, and S. Latham, Pattern Recognition 35, 2973 (2002).
[Crossref]

Real-Time Imag. (1)

R. Stojanovic, P. Mitropulos, C. Koulamas, Y. Karayiannis, S. Koubias, and G. Papadopoulos, Real-Time Imag. 7, 507 (2001).
[Crossref]

Textile Res. J. (1)

E. J. Wood, Textile Res. J. 60, 212 (1990).
[Crossref]

Other (3)

http://www.pulnix.com/PDFs/IMG-PDFs/sptrlrspds.pdf .

D. A. Burns and E. W. Ciurczak, Handbook of Near-Infrared Analysis (NIR Publications, Chichester, UK, 1999).

L. Northon, M. Bradshaw, and A. J. Jewell, Machine Vision Inspection of Web Textile Fabric, Vol. MS97 of SPIE Milestone Series (SPIE, Bellingham, Wash., 1994).

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Figures (4)

Fig. 1
Fig. 1

Spectral reflectance of fabrics of varied colors and compositions: (a) artificial fibers including natural and synthetic polymers; natural fibers including (b) cotton and (c) wool.

Fig. 2
Fig. 2

Zebra-patterned fabric: (a) VIS image, (b) NIR image. Defect segmentation by use of (c) the VIS image and (d) the NIR image as input.

Fig. 3
Fig. 3

Spectral sensitivity of the monochrome Pulnix TM-765 camera (dashed curve). Spectral radiant power distribution of the NIR LEDs (solid curve).

Fig. 4
Fig. 4

Square-patterned fabric: (a) VIS image, (b) NIR image. Defect segmentation by use of (c) the VIS image and (d) the NIR image as input.

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