Abstract

We comment on the recent Letter by Cai et al. [Opt. Lett. 28, 1808 (2003)] in which an approach to phase-shifting interferometry with arbitrary phase steps was proposed. Cai et al. based their method of phase shifting on the idea that the intensities of the reference and object beams can be measured previously, which actually makes the whole posterior phase-shifting procedure absolutely unnecessary. Their method is also based on the statement that the phase of the Fresnel diffraction pattern of a test object if generally a spatially random distribution, which in most situations is wrong.

© 2004 Optical Society of America

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References

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  1. L. Z. Cai, Q. Liu, and X. L. Yang, Opt. Lett. 28, 1808 (2003).
    [CrossRef] [PubMed]
  2. E. Greivenkamp and J. H. Bruning, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), pp. 501–598.

2003 (1)

Bruning, J. H.

E. Greivenkamp and J. H. Bruning, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), pp. 501–598.

Cai, L. Z.

Greivenkamp, E.

E. Greivenkamp and J. H. Bruning, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), pp. 501–598.

Liu, Q.

Yang, X. L.

Opt. Lett. (1)

Other (1)

E. Greivenkamp and J. H. Bruning, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), pp. 501–598.

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Equations (2)

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Ijx,y=A02x,y+Ar2+2A0x,yAr cosφ0x,y-δj.
sinφ0x,y-δj+δj+1/2=sin φ0x,y=2/π

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