Abstract

Experimental results on resonantly excited second-harmonic generation (SHG) in a periodic ionically self-assembled monolayer (ISAM) film are reported. A double-layer guided-mode resonance filter (GMRF) structure is coated with 40 bilayers of pyrlium-based χ2 ISAM thin film and excited with the fundamental of a Nd:YAG laser. Enhanced second-harmonic conversion in the ISAM film is achieved because of the local field enhancement associated with the fundamental resonating leaky mode. This method of SHG is particularly promising, as the ISAM films under investigation exhibit anomalous dispersion that may be applied for phase matching to improve nonlinear conversion efficiency.

© 2004 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
    [CrossRef]
  2. Z. Chen and H. J. Simon, Opt. Lett. 13, 1008 (1988).
    [CrossRef] [PubMed]
  3. G. Blau, J. L. Coutaz, and R. Reinisch, Opt. Lett. 18, 1352 (1993).
    [CrossRef]
  4. M. Kull, J. L. Coutaz, and R. Meyrueix, Opt. Lett. 16, 1930 (1991).
    [CrossRef] [PubMed]
  5. G. Blau, E. Popov, F. Kajzar, A. Raimond, J. F. Roux, and J. L. Coutaz, Opt. Lett. 20, 1101 (1995).
    [CrossRef] [PubMed]
  6. P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
    [CrossRef]
  7. R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
    [CrossRef]
  8. M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).
  9. G. Decher, J. D. Hong, and J. Schmitt, Thin Solid Films 210, 831 (1992).
    [CrossRef]
  10. T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
    [CrossRef]
  11. P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
    [CrossRef]
  12. J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
    [CrossRef]
  13. R. Reinisch, M. Neviere, E. Popov, and H. Akhouayri, Opt. Commun. 112, 339 (1994).
    [CrossRef]

2003

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

2002

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

1999

J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
[CrossRef]

1995

1994

R. Reinisch, M. Neviere, E. Popov, and H. Akhouayri, Opt. Commun. 112, 339 (1994).
[CrossRef]

1993

1992

G. Decher, J. D. Hong, and J. Schmitt, Thin Solid Films 210, 831 (1992).
[CrossRef]

1991

1988

1985

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

1970

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

1962

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Akhouayri, H.

R. Reinisch, M. Neviere, E. Popov, and H. Akhouayri, Opt. Commun. 112, 339 (1994).
[CrossRef]

Black, T. D.

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Blau, G.

Chen, Z.

Claus, R. O.

J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
[CrossRef]

Coutaz, J. L.

Decher, G.

G. Decher, J. D. Hong, and J. Schmitt, Thin Solid Films 210, 831 (1992).
[CrossRef]

Ding, Y.

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

Figura, C.

J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
[CrossRef]

Gaylord, T. K.

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

Heflin, J. R.

J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
[CrossRef]

Hong, J. D.

G. Decher, J. D. Hong, and J. Schmitt, Thin Solid Films 210, 831 (1992).
[CrossRef]

Jerphagnon, J.

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

Johnson, D. H.

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Kajzar, F.

Kull, M.

Kurtz, S. K.

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

Lee, K. J.

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

Liu, Y.

J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
[CrossRef]

Magnusson, R.

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

Maker, P. D.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Maldonado, T. A.

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Marciu, D.

J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
[CrossRef]

Meyrueix, R.

Moharam, M. G.

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

Neviere, M.

R. Reinisch, M. Neviere, E. Popov, and H. Akhouayri, Opt. Commun. 112, 339 (1994).
[CrossRef]

Nisenoff, M.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Pomerantz, M.

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Popov, E.

Priambodo, P. S.

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

Purvinis, G.

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Raimond, A.

Reinisch, R.

R. Reinisch, M. Neviere, E. Popov, and H. Akhouayri, Opt. Commun. 112, 339 (1994).
[CrossRef]

G. Blau, J. L. Coutaz, and R. Reinisch, Opt. Lett. 18, 1352 (1993).
[CrossRef]

Roux, J. F.

Savage, C. M.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Schmitt, J.

G. Decher, J. D. Hong, and J. Schmitt, Thin Solid Films 210, 831 (1992).
[CrossRef]

Shin, D.

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

Simon, H. J.

Sudduth, M. R.

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Terhune, R. W.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Waller, L. K.

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Young, P. P.

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

Appl. Phys. Lett.

P. S. Priambodo, T. A. Maldonado, and R. Magnusson, Appl. Phys. Lett. 83, 3248 (2003).
[CrossRef]

J. R. Heflin, C. Figura, D. Marciu, Y. Liu, and R. O. Claus, Appl. Phys. Lett. 74, 495 (1999).
[CrossRef]

J. Appl. Phys.

J. Jerphagnon and S. K. Kurtz, J. Appl. Phys. 41, 1667 (1970).
[CrossRef]

Opt. Commun.

R. Reinisch, M. Neviere, E. Popov, and H. Akhouayri, Opt. Commun. 112, 339 (1994).
[CrossRef]

Opt. Lett.

Phys. Rev. Lett.

P. D. Maker, R. W. Terhune, M. Nisenoff, and C. M. Savage, Phys. Rev. Lett. 8, 21 (1962).
[CrossRef]

Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem.

M. Pomerantz, T. A. Maldonado, T. D. Black, D. H. Johnson, L. K. Waller, G. Purvinis, and M. R. Sudduth, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 43(2), 562 (2002).

Proc. IEEE

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

Proc. SPIE

R. Magnusson, Y. Ding, K. J. Lee, D. Shin, P. S. Priambodo, P. P. Young, and T. A. Maldonado, Proc. SPIE 5225, 20 (2003).
[CrossRef]

Thin Solid Films

G. Decher, J. D. Hong, and J. Schmitt, Thin Solid Films 210, 831 (1992).
[CrossRef]

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Nonlinear optical GMRF structure showing the measured resonant fundamental λ and SH λ/2 diffracted orders. The numbered layers are 1, 40-bilayers PTOPDT–PSS ISAM film, 90 nm thick; 2, a SiO2 grating with a fill factor f=0.5, 145 nm, Λ=416 nm; 3, SiO2, 20 nm; 4, HfO2, 195 nm, n=1.975 at 1064 nm; and 5, fused silica of 2.54-cm diameter.

Fig. 2
Fig. 2

(a) Chemical structures of cationic PTOPDT and anionic PSS and (b) dispersion curves of the resultant 40-bilayer film. ADPM SHG is possible in the low-loss blue window from 425 to 460 nm, as shown by the horizontal dashed line.

Fig. 3
Fig. 3

Angular and spectral (inset) resonance computed with rigorous coupled-wave theory for the structure of Fig. 1. Experimentally, the device is resonant for λ=1064 nm for TE polarization at incident angle θi=64°.

Fig. 4
Fig. 4

Maker fringe plot showing SH power from NLO GMRF (black) versus planar 40-bilayer PTOPDT–PSS (gray) referenced to y-cut quartz.9 At resonance (λ=1064 nm and θi=64°), the SH power in the transmission direction increases by a factor of 9.

Metrics