Classic dense wavelength-division multiplexing thin-film filters can be spectrally tuned through the substrate’s strain. We analyze the theoretical shift of the design wavelength of a narrow-bandpass filter when uniform, uniaxial compressive stress is applied to the substrate, and we compare calculated sensitivity with experimental data. We measure the transmittance shape of a 200-GHz standard filter for several loading cases to quantify the increase of insertion losses.

© 2003 Optical Society of America

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Rémy Parmentier and Michel Lequime, "Substrate-strain-induced tunability of dense wavelength-division multiplexing thin- film filters: erratum," Opt. Lett. 28, 1279-1279 (2003)


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  1. M. Lequime, R. Parmentier, F. Lemarchand, and C. Amra, Appl. Opt. 41, 3277 (2002).
    [Crossref] [PubMed]
  2. R. Parmentier, F. Lemarchand, M. Cathelinaud, M. Lequime, C. Amra, S. Labat, S. Bozzo, F. Bocquet, A. Charaï, C. Dominici, and O. Thomas, Appl. Opt. 41, 3270 (2002).
    [Crossref] [PubMed]
  3. H. Takashashi, Appl. Opt. 34, 667 (1995).
    [Crossref] [PubMed]

2002 (2)

1995 (1)

Amra, C.

Bocquet, F.

Bozzo, S.

Cathelinaud, M.

Charaï, A.

Dominici, C.

Labat, S.

Lemarchand, F.

Lequime, M.

Parmentier, R.

Takashashi, H.

Thomas, O.

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Figures (3)

Fig. 1
Fig. 1

Geometry used for the tensor calculation of changes in refractive index and mechanical thickness when the filter is loaded with a uniform uniaxial force F.

Fig. 2
Fig. 2

Center wavelength shift: experimental data, solid line; simulated data, dashed line.

Fig. 3
Fig. 3

Experimental transmittance curves for several cases of uniform loading.

Equations (7)

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if=1+νfYfσif-νfYfσ1f+σ2f+σ3f, i=1,2,3,