Abstract

We demonstrate a Mueller polarimeter in which the polarization-state generator and analyzer are both composed of a linear polarizer and two liquid-crystal variable retarders. The polarimeter is designed to optimize the accuracy of the final results by minimization of the condition numbers of the modulation and analysis matrices. The polarimeter calibration, a difficult task by conventional procedures, is achieved easily by use of the eigenvalue method of Compain et al. [Appl. Opt. 38, 3490 (1999)]. The overall polarimeter performance is tested with a linear polarizer at various angles and a compensator at various retardations.

© 2003 Optical Society of America

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References

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2002 (1)

2001 (1)

2000 (2)

1999 (4)

1998 (1)

E. Compain and B. Drévillon, Rev. Sci. Instrum. 69, 1574 (1998).
[CrossRef]

1997 (2)

1994 (1)

J. L. Pezzaniti and R. A. Chipman, Proc. SPIE 2297, 468 (1994).
[CrossRef]

1992 (1)

1977 (1)

1969 (1)

S. N. Jasperson and S. E. Schatterly, Rev. Sci. Instrum. 40, 7611 (1969).
[CrossRef]

Artal, P.

Azzam, R. M. A.

Boulbry, B.

Bousquet, B.

Bueno, J. M.

Chipman, R. A.

J. L. Pezzaniti and R. A. Chipman, Proc. SPIE 2297, 468 (1994).
[CrossRef]

Collins, R. W.

Compain, E.

E. Compain, S. Poirier, and B. Drévillon, Appl. Opt. 38, 3490 (1999).
[CrossRef]

E. Compain and B. Drévillon, Rev. Sci. Instrum. 69, 1574 (1998).
[CrossRef]

Delplancke, F.

Dereniak, E. L.

Descour, M. R.

Drévillon, B.

E. Compain, S. Poirier, and B. Drévillon, Appl. Opt. 38, 3490 (1999).
[CrossRef]

E. Compain and B. Drévillon, Rev. Sci. Instrum. 69, 1574 (1998).
[CrossRef]

Goldstein, D. H.

Guern, Y.

Jasperson, S. N.

S. N. Jasperson and S. E. Schatterly, Rev. Sci. Instrum. 40, 7611 (1969).
[CrossRef]

Jellison, G. E.

Kemme, S. A.

Koh, J. J.

Le Jeune, B.

Lotrian, J.

Modine, F. A.

Pezzaniti, J. L.

J. L. Pezzaniti and R. A. Chipman, Proc. SPIE 2297, 468 (1994).
[CrossRef]

Phipps, G. S.

Poirier, S.

Sabatke, D. S.

Schatterly, S. E.

S. N. Jasperson and S. E. Schatterly, Rev. Sci. Instrum. 40, 7611 (1969).
[CrossRef]

Smith, M. H.

Sweatt, W. C.

Turner, T. S.

J. S. Tyo and T. S. Turner, Proc. SPIE 3753, 214 (1999).
[CrossRef]

Tyo, J. S.

J. S. Tyo, Opt. Lett. 25, 1198 (2000).
[CrossRef]

J. S. Tyo and T. S. Turner, Proc. SPIE 3753, 214 (1999).
[CrossRef]

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Figures (3)

Fig. 1
Fig. 1

Schematic of the polarimeter: S, source; P, linear polarizer; A, analyzer; D, detector. The variable-index axes of the LCs, shown as solid lines, are oriented at θi θi azimuthal angles with respect to the transmission axis of the linear polarizer (the analyzer). The xy axes in the transverse plane are defined by the calibration procedure.

Fig. 2
Fig. 2

Mueller matrices measured with a linear polarizer set at various orientations in the xy plane. Top, nonvanishing elements (symbols) and single parameter fits (solid curves); bottom, elements that are expected to vanish.

Fig. 3
Fig. 3

Mueller matrices measured with a compensator, aligned with the x axis, for different settings of the micrometric screw controlling the compensator retardation. Top, nonvanishing elements (symbols) and fits (solid curves); bottom, other elements, which are expected to vanish.

Equations (5)

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B=AMW,
Δ1=315°+p90°,    Δ2=135°+p90°,
θ1=ϵ27.4°+q90°,    θ2=ϵ72.4°+r90°,
M11=M22=τ,    M12=M21=-τ cos 2Ψ, M33=M44=τ sin 2Ψ cos Δ, M43=-M34=τ sin 2Ψ sinΔ,
Mi=R-ϕiMτi,Ψi,ΔiRϕi,

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