Abstract

A technique for automatic detection of targets from their infrared signature’s state-of-polarization vector is described. The bounds on the Bayesian total probability of errors are estimated from the observed Stokes vector imagery and used as metrics for separating targets from background clutter. The performance of the proposed approach for objects under various geometries is studied in terms of receiver operating characteristic curves. The new results, which have been obtained from data from the U.S. Air Force’s Infrared Modeling and Analysis polarimetric infrared simulation tool, indicate the usefulness of polarimetric infrared signatures for the automatic detection of small targets.

© 2003 Optical Society of America

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References

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  1. F. A. Sadjadi and C. S. L. Chun, IEEE Trans. Aerosp. Electron. Syst. 37, 740 (2001).
    [CrossRef]
  2. A. Srivastava, X. Liu, and U. Grenander, IEEE Trans. Pattern. Anal. Mach. Intell. 24, 1200 (2002).
    [CrossRef]
  3. W. Nee and S.-M. F. Nee, Proc. SPIE 2469, 231 (1995).
    [CrossRef]
  4. R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis (Wiley, New York, 1973).

2002

A. Srivastava, X. Liu, and U. Grenander, IEEE Trans. Pattern. Anal. Mach. Intell. 24, 1200 (2002).
[CrossRef]

2001

F. A. Sadjadi and C. S. L. Chun, IEEE Trans. Aerosp. Electron. Syst. 37, 740 (2001).
[CrossRef]

1995

W. Nee and S.-M. F. Nee, Proc. SPIE 2469, 231 (1995).
[CrossRef]

Chun, C. S. L.

F. A. Sadjadi and C. S. L. Chun, IEEE Trans. Aerosp. Electron. Syst. 37, 740 (2001).
[CrossRef]

Duda, R. O.

R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis (Wiley, New York, 1973).

Grenander, U.

A. Srivastava, X. Liu, and U. Grenander, IEEE Trans. Pattern. Anal. Mach. Intell. 24, 1200 (2002).
[CrossRef]

Hart, P. E.

R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis (Wiley, New York, 1973).

Liu, X.

A. Srivastava, X. Liu, and U. Grenander, IEEE Trans. Pattern. Anal. Mach. Intell. 24, 1200 (2002).
[CrossRef]

Nee, S.-M. F.

W. Nee and S.-M. F. Nee, Proc. SPIE 2469, 231 (1995).
[CrossRef]

Nee, W.

W. Nee and S.-M. F. Nee, Proc. SPIE 2469, 231 (1995).
[CrossRef]

Sadjadi, F. A.

F. A. Sadjadi and C. S. L. Chun, IEEE Trans. Aerosp. Electron. Syst. 37, 740 (2001).
[CrossRef]

Srivastava, A.

A. Srivastava, X. Liu, and U. Grenander, IEEE Trans. Pattern. Anal. Mach. Intell. 24, 1200 (2002).
[CrossRef]

IEEE Trans. Aerosp. Electron. Syst.

F. A. Sadjadi and C. S. L. Chun, IEEE Trans. Aerosp. Electron. Syst. 37, 740 (2001).
[CrossRef]

IEEE Trans. Pattern. Anal. Mach. Intell.

A. Srivastava, X. Liu, and U. Grenander, IEEE Trans. Pattern. Anal. Mach. Intell. 24, 1200 (2002).
[CrossRef]

Proc. SPIE

W. Nee and S.-M. F. Nee, Proc. SPIE 2469, 231 (1995).
[CrossRef]

Other

R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis (Wiley, New York, 1973).

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Figures (4)

Fig. 1
Fig. 1

Polarimetric images at a range of 1 km (the closest distance). Left, T72 tank; right, M35 truck.

Fig. 2
Fig. 2

ROC curves for (left) a T72 tank and (right) an M35 truck at a range of 1 km.

Fig. 3
Fig. 3

ROC curves for (left) a T72 tank and (right) an M35 truck at a range of 5 km.

Fig. 4
Fig. 4

ROC curves for (left) a T72 tank and (right) an M35 truck at a range of 12 km.

Equations (8)

Equations on this page are rendered with MathJax. Learn more.

P=100Q2+U2I,    ϕ=12arctanUQ.
I=12i0+i45+i90+i135, Q=i0-i90, U=i45-i135,
Yτ=ylτ,
Tˆc=argmaxTcpTcYτ.
F=μt-μb2σt2+σb2,
d=Ffused=mIμtI-μbI2σtI2+σbI2+mPμtP-μbP2σtP2+σbP2+mϕμtϕ-μbϕ2σtϕ2+σbϕ2,
l=PEdPE¯d>pTargetpBackground.
P.d=Pd.P.i=12PdEiPEi,

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