Abstract

A novel profilometry method based on two-photon absorption in a silicon avalanche photodiode is proposed. This method has a wide dynamic range, from millimeters to tens of meters. The principle is experimentally confirmed with a fiber-optic Mach–Zehnder interferometer.

© 2003 Optical Society of America

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References

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  1. M. Takeda and H. Yamamoto, Appl. Opt. 33, 7829 (1994).
    [CrossRef] [PubMed]
  2. I. Fujima, K. Seta, H. Matsumoto, and H. Yoshida, Proc. SPIE 2684, 199 (1996).
    [CrossRef]
  3. L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
    [CrossRef]
  4. Y. Takagi, T. Kobayashi, and K. Yoshihara, Opt. Lett. 17, 658 (1992).
    [CrossRef] [PubMed]
  5. F. Sakai, Y. Tanaka, and T. Kurokawa, presented at the 2001 Annual Meeting of the Optical Society of America, Long Beach, Calif., October 14–18, 2001.
  6. P. G. Chua, Y. Tanaka, M. Takeda, and T. Kurokawa, in Conference on Lasers and Electro-Optics/Pacific Rim (Optical Society of America, Washington, D.C., 2001), paper TuG2-3.
  7. D. Panasenko and Y. Fainman, Opt. Lett. 27, 1475 (2002).
    [CrossRef]

2002 (1)

1996 (2)

I. Fujima, K. Seta, H. Matsumoto, and H. Yoshida, Proc. SPIE 2684, 199 (1996).
[CrossRef]

L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
[CrossRef]

1994 (1)

1992 (1)

Barry, L. P.

L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
[CrossRef]

Bollond, P. G.

L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
[CrossRef]

Chua, P. G.

P. G. Chua, Y. Tanaka, M. Takeda, and T. Kurokawa, in Conference on Lasers and Electro-Optics/Pacific Rim (Optical Society of America, Washington, D.C., 2001), paper TuG2-3.

Dudley, J. M.

L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
[CrossRef]

Fainman, Y.

Fujima, I.

I. Fujima, K. Seta, H. Matsumoto, and H. Yoshida, Proc. SPIE 2684, 199 (1996).
[CrossRef]

Harvey, J. D.

L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
[CrossRef]

Kobayashi, T.

Kurokawa, T.

F. Sakai, Y. Tanaka, and T. Kurokawa, presented at the 2001 Annual Meeting of the Optical Society of America, Long Beach, Calif., October 14–18, 2001.

P. G. Chua, Y. Tanaka, M. Takeda, and T. Kurokawa, in Conference on Lasers and Electro-Optics/Pacific Rim (Optical Society of America, Washington, D.C., 2001), paper TuG2-3.

Leonhardt, R.

L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
[CrossRef]

Matsumoto, H.

I. Fujima, K. Seta, H. Matsumoto, and H. Yoshida, Proc. SPIE 2684, 199 (1996).
[CrossRef]

Panasenko, D.

Sakai, F.

F. Sakai, Y. Tanaka, and T. Kurokawa, presented at the 2001 Annual Meeting of the Optical Society of America, Long Beach, Calif., October 14–18, 2001.

Seta, K.

I. Fujima, K. Seta, H. Matsumoto, and H. Yoshida, Proc. SPIE 2684, 199 (1996).
[CrossRef]

Takagi, Y.

Takeda, M.

M. Takeda and H. Yamamoto, Appl. Opt. 33, 7829 (1994).
[CrossRef] [PubMed]

P. G. Chua, Y. Tanaka, M. Takeda, and T. Kurokawa, in Conference on Lasers and Electro-Optics/Pacific Rim (Optical Society of America, Washington, D.C., 2001), paper TuG2-3.

Tanaka, Y.

P. G. Chua, Y. Tanaka, M. Takeda, and T. Kurokawa, in Conference on Lasers and Electro-Optics/Pacific Rim (Optical Society of America, Washington, D.C., 2001), paper TuG2-3.

F. Sakai, Y. Tanaka, and T. Kurokawa, presented at the 2001 Annual Meeting of the Optical Society of America, Long Beach, Calif., October 14–18, 2001.

Yamamoto, H.

Yoshida, H.

I. Fujima, K. Seta, H. Matsumoto, and H. Yoshida, Proc. SPIE 2684, 199 (1996).
[CrossRef]

Yoshihara, K.

Appl. Opt. (1)

Electron. Lett. (1)

L. P. Barry, P. G. Bollond, J. M. Dudley, J. D. Harvey, and R. Leonhardt, Electron. Lett. 32, 1922 (1996).
[CrossRef]

Opt. Lett. (2)

Proc. SPIE (1)

I. Fujima, K. Seta, H. Matsumoto, and H. Yoshida, Proc. SPIE 2684, 199 (1996).
[CrossRef]

Other (2)

F. Sakai, Y. Tanaka, and T. Kurokawa, presented at the 2001 Annual Meeting of the Optical Society of America, Long Beach, Calif., October 14–18, 2001.

P. G. Chua, Y. Tanaka, M. Takeda, and T. Kurokawa, in Conference on Lasers and Electro-Optics/Pacific Rim (Optical Society of America, Washington, D.C., 2001), paper TuG2-3.

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Figures (5)

Fig. 1
Fig. 1

Schematic of profilometry based on TPA in a silicon photodetector.

Fig. 2
Fig. 2

Experimental setup.

Fig. 3
Fig. 3

Photocurrent of silicon APD that is due to TPA for (a) a short path-length difference and (b) a long path-length difference.

Fig. 4
Fig. 4

Fourier-transformed spectra for (a) a short path-length difference and (b) a long path-length difference.

Fig. 5
Fig. 5

Phase change in intensity correlation versus modulation frequency for (a) a short path-length difference and (b) a long path-length difference.

Equations (4)

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ISt=α1+a cos2πfmt-2nlSc,
IRt=β1+a cos2πfmt-2nlRc,
iIS+IR2¯=1+a22α2+β2+αβ1+a22cos4πfmnlS-lRc.
F=c2nΔl,

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