Abstract

We describe a method of characterizing ultrashort optical pulses that is based on the technique of spectral phase interferometry for direct electric-field reconstruction and is capable of simultaneously measuring the amplitude and the phase of the electric field of a sub-10-fs pulse at kilohertz acquisition rates on a single-shot basis. Use of this technique results in a dramatic increase (>50×) in acquisition rate compared with that of existing diagnostics for full E-field characterization and opens the door to a range of new experiments in which shot-to-shot phase and amplitude fluctuations are studied at kilohertz rates.

© 2003 Optical Society of America

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  1. R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
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  3. L. Gallmann, D. H. Sutter, N. Matuschek, G. Steinmeyer, U. Keller, C. Iaconis, and I. A. Walmsley, Opt. Lett. 24, 1314 (1999).
    [CrossRef]
  4. C. Dorrer and I. A. Walmsley, J. Opt. Soc. Am. B 19, 1019 (2002).
    [CrossRef]
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    [CrossRef]
  6. L. Gallmann, G. Steinmeyer, D. H. Sutter, T. Rupp, C. Iaconis, I. A. Walmsley, and U. Keller, Opt. Lett. 26, 96 (2001).
    [CrossRef]
  7. C. Dorrer, B. de Beauvoir, C. Le Blanc, S. Ranc, J.-P. Rousseau, P. Rousseau, and J.-P. Chambaret, Opt. Lett. 24, 1644 (1999).
    [CrossRef]
  8. P. Salières and M. Lewenstein, Meas. Sci. Technol. 12, 1818 (2001).
    [CrossRef]
  9. C. Dorrer and I. A. Walmsley, in Conference on Lasers and Electro-Optics (CLEO), Vol. 73 of OSA Trends in Optics and Photonics Series (Optical Society of America, Washington, D.C., 2002), paper CMR5.
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    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]

2002 (2)

2001 (2)

2000 (1)

1999 (5)

1997 (2)

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

M. Nisoli, S. De Silvestri, O. Svelto, R. Szipocs, K. Ferencz, C. Spielmann, S. Sartania, and F. Krausz, Opt. Lett. 22, 522 (1997).
[CrossRef] [PubMed]

1996 (1)

M. Nisoli, S. De Silvestri, and O. Svelto, Appl. Phys. Lett. 68, 2793 (1996).
[CrossRef]

Chambaret, J.-P.

de Beauvoir, B.

De Silvestri, S.

DeLong, K. W.

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

Dorrer, C.

Dunlop, A. E.

H. R. Telle, G. Steinmeyer, A. E. Dunlop, J. Stenger, D. H. Sutter, and U. Keller, Appl. Phys. B 69, 327 (1999).
[CrossRef]

Ferencz, K.

Fittinghoff, D. N.

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

Gallmann, L.

Huignard, J.-P.

Iaconis, C.

Keller, U.

Krausz, F.

Krumbügel, M. A.

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

Laude, V.

Le Blanc, C.

Lewenstein, M.

P. Salières and M. Lewenstein, Meas. Sci. Technol. 12, 1818 (2001).
[CrossRef]

Matuschek, N.

Migus, A.

Nisoli, M.

Ranc, S.

Richman, B.

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

Rousseau, J.-P.

Rousseau, P.

Rupp, T.

Salières, P.

P. Salières and M. Lewenstein, Meas. Sci. Technol. 12, 1818 (2001).
[CrossRef]

Sartania, S.

Spielmann, C.

Steinmeyer, G.

Stenger, J.

H. R. Telle, G. Steinmeyer, A. E. Dunlop, J. Stenger, D. H. Sutter, and U. Keller, Appl. Phys. B 69, 327 (1999).
[CrossRef]

Sutter, D. H.

Svelto, O.

Sweetser, J.

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

Szipocs, R.

Telle, H. R.

H. R. Telle, G. Steinmeyer, A. E. Dunlop, J. Stenger, D. H. Sutter, and U. Keller, Appl. Phys. B 69, 327 (1999).
[CrossRef]

Tournois, P.

Trebino, R.

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

Verluise, F.

Walmsley, I. A.

Appl. Phys. B (1)

H. R. Telle, G. Steinmeyer, A. E. Dunlop, J. Stenger, D. H. Sutter, and U. Keller, Appl. Phys. B 69, 327 (1999).
[CrossRef]

Appl. Phys. Lett. (1)

M. Nisoli, S. De Silvestri, and O. Svelto, Appl. Phys. Lett. 68, 2793 (1996).
[CrossRef]

IEEE J. Quantum Electron. (1)

C. Iaconis and I. A. Walmsley, IEEE J. Quantum Electron. 35, 501 (1999).
[CrossRef]

J. Opt. Soc. Am. B (3)

Meas. Sci. Technol. (1)

P. Salières and M. Lewenstein, Meas. Sci. Technol. 12, 1818 (2001).
[CrossRef]

Opt. Lett. (5)

Rev. Sci. Instrum. (1)

R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. Sweetser, M. A. Krumbügel, and B. Richman, Rev. Sci. Instrum. 68, 1 (1997).
[CrossRef]

Other (1)

C. Dorrer and I. A. Walmsley, in Conference on Lasers and Electro-Optics (CLEO), Vol. 73 of OSA Trends in Optics and Photonics Series (Optical Society of America, Washington, D.C., 2002), paper CMR5.

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Figures (5)

Fig. 1
Fig. 1

Measurement taken at 1 kHz of the spectrum of a Ti:sapphire laser for which a spectral hole alternated between two spectral positions (A=776 nm and B=799 nm) at a rate of 500 Hz. The alternation can clearly be seen, thus demonstrating kilohertz acquisition.

Fig. 2
Fig. 2

Fundamental spectrum of the first 1000 shots as a function of wavelength. The two curves display two consecutive shots; the dashed curve has been shifted.

Fig. 3
Fig. 3

Spectral phase of the first 1000 shots as a function of wavelength. The two-dimensional figure displays two consecutive shots; the dashed curve has been shifted.

Fig. 4
Fig. 4

Reconstructed temporal intensity profile of the first 1000 shots. The curves show two consecutive shots; the dashed curve has been shifted.

Fig. 5
Fig. 5

Time series of 10,000 shots of the FWHM pulse duration. Inset, the same plot for the first 100 shots on a magnified vertical scale.

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