Abstract

We describe a polarization-maintaining fiber–based polarization-sensitive optical low-coherence reflectometer for measurement of depth-resolved birefringence. Unlike for other fiber-based polarization-sensitive optical low-coherence reflectometers, here the linear birefringence of a sample can be measured from data recorded in a single A scan. Simultaneous measurement of retardation and orientation of birefringent axes with mica wave plates is demonstrated. The measured retardation is insensitive to sample rotation in the plane perpendicular to ranging.

© 2003 Optical Society of America

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References

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  1. B. Wang and W. Hellman, Rev. Sci. Instrum. 72, 4066 (2001).
    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
  7. J. E. Roth, J. A. Kozak, S. Yazdanfar, A. M. Rollins, and J. A. Izatt, Opt. Lett. 22, 934 (1997).
    [CrossRef]
  8. E. A. Swanson, D. Huang, J. G. Fujimoto, C. Puliafito, and J. S. Schuman, “Method and apparatus for performing optical measurements,” U.S. patent 5, 459, 570 (October 17, 1995).
  9. D. P. Davé and T. E. Milner, Electron. Lett. 37, 215 (2001).
    [CrossRef]
  10. G. J. Tearney, B. E. Bouma, and J. G. Fujimoto, Opt. Lett. 22, 1811 (1997).
    [CrossRef]

2002 (1)

S. Cattaneo, O. Zehnder, P. Gunter, and M. Kauranen, Phys. Rev. Lett. 88, 215 (2002).
[CrossRef]

2001 (3)

B. Wang and W. Hellman, Rev. Sci. Instrum. 72, 4066 (2001).
[CrossRef]

C. K. Hitzenberger, E. Gotzinger, M. Sticker, M. Pircher, and A. F. Fercher, Opt. Express 9, 780 (2001), http://www.opticsexpress.org.
[CrossRef] [PubMed]

D. P. Davé and T. E. Milner, Electron. Lett. 37, 215 (2001).
[CrossRef]

2000 (1)

1997 (3)

1991 (1)

Bouma, B. E.

Cattaneo, S.

S. Cattaneo, O. Zehnder, P. Gunter, and M. Kauranen, Phys. Rev. Lett. 88, 215 (2002).
[CrossRef]

Chen, Z.

Davé, D. P.

D. P. Davé and T. E. Milner, Electron. Lett. 37, 215 (2001).
[CrossRef]

de Boer, J. F.

Fercher, A. F.

Fujimoto, J. G.

E. A. Swanson, D. Huang, J. G. Fujimoto, C. Puliafito, and J. S. Schuman, “Method and apparatus for performing optical measurements,” U.S. patent 5, 459, 570 (October 17, 1995).

G. J. Tearney, B. E. Bouma, and J. G. Fujimoto, Opt. Lett. 22, 1811 (1997).
[CrossRef]

M. R. Hee, D. Huang, E. A. Swanson, and J. G. Fujimoto, J. Opt. Soc. Am. B 9, 903 (1991).
[CrossRef]

Gotzinger, E.

Gunter, P.

S. Cattaneo, O. Zehnder, P. Gunter, and M. Kauranen, Phys. Rev. Lett. 88, 215 (2002).
[CrossRef]

Hee, M. R.

Hellman, W.

B. Wang and W. Hellman, Rev. Sci. Instrum. 72, 4066 (2001).
[CrossRef]

Hitzenberger, C. K.

Huang, D.

E. A. Swanson, D. Huang, J. G. Fujimoto, C. Puliafito, and J. S. Schuman, “Method and apparatus for performing optical measurements,” U.S. patent 5, 459, 570 (October 17, 1995).

M. R. Hee, D. Huang, E. A. Swanson, and J. G. Fujimoto, J. Opt. Soc. Am. B 9, 903 (1991).
[CrossRef]

Izatt, J. A.

Kauranen, M.

S. Cattaneo, O. Zehnder, P. Gunter, and M. Kauranen, Phys. Rev. Lett. 88, 215 (2002).
[CrossRef]

Kozak, J. A.

Milner, T. E.

Nelson, J. S.

Park, B. H.

Pircher, M.

Puliafito, C.

E. A. Swanson, D. Huang, J. G. Fujimoto, C. Puliafito, and J. S. Schuman, “Method and apparatus for performing optical measurements,” U.S. patent 5, 459, 570 (October 17, 1995).

Rollins, A. M.

Roth, J. E.

Saxer, C. E.

Schuman, J. S.

E. A. Swanson, D. Huang, J. G. Fujimoto, C. Puliafito, and J. S. Schuman, “Method and apparatus for performing optical measurements,” U.S. patent 5, 459, 570 (October 17, 1995).

Sticker, M.

Swanson, E. A.

E. A. Swanson, D. Huang, J. G. Fujimoto, C. Puliafito, and J. S. Schuman, “Method and apparatus for performing optical measurements,” U.S. patent 5, 459, 570 (October 17, 1995).

M. R. Hee, D. Huang, E. A. Swanson, and J. G. Fujimoto, J. Opt. Soc. Am. B 9, 903 (1991).
[CrossRef]

Tearney, G. J.

van Gemert, M. J. C.

Wang, B.

B. Wang and W. Hellman, Rev. Sci. Instrum. 72, 4066 (2001).
[CrossRef]

Yazdanfar, S.

Zehnder, O.

S. Cattaneo, O. Zehnder, P. Gunter, and M. Kauranen, Phys. Rev. Lett. 88, 215 (2002).
[CrossRef]

Zhao, Y.

Electron. Lett. (1)

D. P. Davé and T. E. Milner, Electron. Lett. 37, 215 (2001).
[CrossRef]

J. Opt. Soc. Am. B (1)

Opt. Express (1)

Opt. Lett. (4)

Phys. Rev. Lett. (1)

S. Cattaneo, O. Zehnder, P. Gunter, and M. Kauranen, Phys. Rev. Lett. 88, 215 (2002).
[CrossRef]

Rev. Sci. Instrum. (1)

B. Wang and W. Hellman, Rev. Sci. Instrum. 72, 4066 (2001).
[CrossRef]

Other (1)

E. A. Swanson, D. Huang, J. G. Fujimoto, C. Puliafito, and J. S. Schuman, “Method and apparatus for performing optical measurements,” U.S. patent 5, 459, 570 (October 17, 1995).

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Figures (4)

Fig. 1
Fig. 1

Schematic diagram of the PM-fiber-based PS-OLCR: LS, broadband light source; Ms, mirrors; Ls, lenses; G, diffraction grating; Ds, photoreceivers; W, Wollaston prism; FBP, fiber bench polarizer. A splice is depicted by a rectangle between fibers, and the angle between the slow or fast axes of the two spliced PM-fiber segments is given in degrees.

Fig. 2
Fig. 2

Demodulated interference intensity signals in Ch 1 and Ch 2 recorded from the front and back surfaces of a 100-µm mica QWP at 1300 nm.

Fig. 3
Fig. 3

Measured single-pass phase retardation versus the angular rotation of a sample mica wave plate.

Fig. 4
Fig. 4

Measured and actual orientation of the fast axis of a sample mica wave plate with respect to the horizontal axis.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

I1z=k1Rszexp-Δz/lc2×sinδcos4πΔz/λ0+2θ,
I2z=k2Rszexp-Δz/lc2×cosδcos4πΔz/λ0,
δz=arctanA1z/A2z;
ϕmz=arctanHImz/Imz,    m=1,2,
Amz=HImz2+Imz21/2.

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