Abstract

A novel technique for characterization of the second-order nonlinearity in nonlinear crystals is presented. It utilizes group-velocity walk-off between femtosecond pulses in type II SHG to achieve three-dimensional resolution of the nonlinearity. The longitudinal and transversal spatial resolution can be set independently. The technique is especially useful for characterizing quasi-phase-matched nonlinear crystals, and it is demonstrated in potassium titanyl phosphate.

© 2003 Optical Society of America

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References

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  1. C. Canalias, V. Pasiskevicius, A. Fragemann, and F. Laurell, “High resolution domain imaging on the non-polar y-face of periodically poled KTiOPO4 by means of atomic force microscopy,” Appl. Phys. Lett. (to be published).
  2. A. Reichert and K. Betzel, J. Appl. Phys. 79, 2209 (1996).
    [CrossRef]
  3. S. Wang, V. Pasiskevicius, J. Hellström, F. Laurell, and H. Karlsson, Opt. Lett. 24, 978 (1999).
    [CrossRef]
  4. V. Pasiskevicius, S. J. Holmgren, S. Wang, and F. Laurell, Opt. Lett. 27, 1628 (2002).
    [CrossRef]
  5. M. M. Fejer, G. A. Magel, D. H. Jundt, and R. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
    [CrossRef]

2002 (1)

1999 (1)

1996 (1)

A. Reichert and K. Betzel, J. Appl. Phys. 79, 2209 (1996).
[CrossRef]

1992 (1)

M. M. Fejer, G. A. Magel, D. H. Jundt, and R. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
[CrossRef]

Betzel, K.

A. Reichert and K. Betzel, J. Appl. Phys. 79, 2209 (1996).
[CrossRef]

Byer, R.

M. M. Fejer, G. A. Magel, D. H. Jundt, and R. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
[CrossRef]

Canalias, C.

C. Canalias, V. Pasiskevicius, A. Fragemann, and F. Laurell, “High resolution domain imaging on the non-polar y-face of periodically poled KTiOPO4 by means of atomic force microscopy,” Appl. Phys. Lett. (to be published).

Fejer, M. M.

M. M. Fejer, G. A. Magel, D. H. Jundt, and R. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
[CrossRef]

Fragemann, A.

C. Canalias, V. Pasiskevicius, A. Fragemann, and F. Laurell, “High resolution domain imaging on the non-polar y-face of periodically poled KTiOPO4 by means of atomic force microscopy,” Appl. Phys. Lett. (to be published).

Hellström, J.

Holmgren, S. J.

Jundt, D. H.

M. M. Fejer, G. A. Magel, D. H. Jundt, and R. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
[CrossRef]

Karlsson, H.

Laurell, F.

V. Pasiskevicius, S. J. Holmgren, S. Wang, and F. Laurell, Opt. Lett. 27, 1628 (2002).
[CrossRef]

S. Wang, V. Pasiskevicius, J. Hellström, F. Laurell, and H. Karlsson, Opt. Lett. 24, 978 (1999).
[CrossRef]

C. Canalias, V. Pasiskevicius, A. Fragemann, and F. Laurell, “High resolution domain imaging on the non-polar y-face of periodically poled KTiOPO4 by means of atomic force microscopy,” Appl. Phys. Lett. (to be published).

Magel, G. A.

M. M. Fejer, G. A. Magel, D. H. Jundt, and R. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
[CrossRef]

Pasiskevicius, V.

V. Pasiskevicius, S. J. Holmgren, S. Wang, and F. Laurell, Opt. Lett. 27, 1628 (2002).
[CrossRef]

S. Wang, V. Pasiskevicius, J. Hellström, F. Laurell, and H. Karlsson, Opt. Lett. 24, 978 (1999).
[CrossRef]

C. Canalias, V. Pasiskevicius, A. Fragemann, and F. Laurell, “High resolution domain imaging on the non-polar y-face of periodically poled KTiOPO4 by means of atomic force microscopy,” Appl. Phys. Lett. (to be published).

Reichert, A.

A. Reichert and K. Betzel, J. Appl. Phys. 79, 2209 (1996).
[CrossRef]

Wang, S.

Appl. Phys. Lett. (1)

C. Canalias, V. Pasiskevicius, A. Fragemann, and F. Laurell, “High resolution domain imaging on the non-polar y-face of periodically poled KTiOPO4 by means of atomic force microscopy,” Appl. Phys. Lett. (to be published).

IEEE J. Quantum Electron. (1)

M. M. Fejer, G. A. Magel, D. H. Jundt, and R. Byer, IEEE J. Quantum Electron. 28, 2631 (1992).
[CrossRef]

J. Appl. Phys. (1)

A. Reichert and K. Betzel, J. Appl. Phys. 79, 2209 (1996).
[CrossRef]

Opt. Lett. (2)

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Figures (4)

Fig. 1
Fig. 1

Delaying the polarization with largest group velocity by a distance xd moves the point of interaction by a distance xc from the crystal face to the interior.

Fig. 2
Fig. 2

Experimental setup: SAF, sapphire; other abbreviations defined in text.

Fig. 3
Fig. 3

Measured distribution of the effective nonlinearity in PPKTP. The distance between subsequent frames is 0.75 mm along the crystal’s x axis. The black spots in the lower-left corners are due to a filter defect.

Fig. 4
Fig. 4

Distribution of the effective nonlinearity d33 eff along the PPKTP x axis.

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