Abstract

By use of a numerical calculation based on Green’s integral equation, we study the near-field speckles produced by the random self-affine fractal surfaces of a dielectric medium. The speckle intensities evolve considerably in the near-field region, and the local fluctuations in them disappear before they have traversed the distance of a wavelength. The transition of the speckle contrast either on the surface or in the near field and in the neighborhood non-near-field regions depends on lateral correlation length ξ and roughness exponent α of the random surfaces.

© 2003 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. J. C. Dainty, Laser Speckle and Related Phenomena, 2nd ed. (Springer-Verlag, Berlin, 1984).
  2. Y. Y. Hung, Opt. Eng. 21, 391 (1982).
    [Crossref]
  3. J. Trautner and G. Leuchs, Appl. Opt. 41, 6200 (2002).
    [Crossref] [PubMed]
  4. O. Matoba and B. Javidi, Opt. Lett. 24, 762 (1999).
    [Crossref]
  5. R. C. Dunn, Chem. Rev. 99, 2891 (1999).
    [Crossref]
  6. C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1996).
    [Crossref]
  7. D. L. Jaggard and X. Sun, J. Opt. Soc. Am. A 7, 1131 (1990).
    [Crossref]
  8. Y.-P. Zhao, G.-C. Wang, and T.-H. Lu, Characterization of Amorphous and Crystalline Rough Surfaces: Principles and Applications (Academic, New York, 2001).
  9. D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).
  10. J. A. Sánchez-Gil and M. Nieto-Vesperinas, J. Opt. Soc. Am. A 8, 1270 (1991).
    [Crossref]
  11. J. A. Sánchez-Gil, J. V. García-Ramos, and E. R. Méndez, Opt. Lett. 26, 1286 (2001).
    [Crossref]
  12. C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
    [Crossref]
  13. J. W. Goodman, Opt. Commun. 14, 324 (1975).
    [Crossref]
  14. E. Jakeman and T. W. Welford, Opt. Commun. 21, 72 (1977).
    [Crossref]
  15. T. W. Welford, Opt. Quantum Electron. 9, 269 (1977).
    [Crossref]
  16. S. Frankenthal and A. M. Whitman, J. Opt. Soc. Am. A 6, 1827 (1991).
    [Crossref]
  17. L. C. Andrews, R. L. Phillips, C. Y. Hopen, and M. A. Al-Habash, J. Opt. Soc. Am. A 16, 1417 (1999).
    [Crossref]

2002 (2)

J. Trautner and G. Leuchs, Appl. Opt. 41, 6200 (2002).
[Crossref] [PubMed]

C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
[Crossref]

2001 (1)

2000 (1)

D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).

1999 (3)

1996 (1)

C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1996).
[Crossref]

1991 (2)

1990 (1)

1982 (1)

Y. Y. Hung, Opt. Eng. 21, 391 (1982).
[Crossref]

1977 (2)

E. Jakeman and T. W. Welford, Opt. Commun. 21, 72 (1977).
[Crossref]

T. W. Welford, Opt. Quantum Electron. 9, 269 (1977).
[Crossref]

1975 (1)

J. W. Goodman, Opt. Commun. 14, 324 (1975).
[Crossref]

Al-Habash, M. A.

Andrews, L. C.

Cheng, C. F.

C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
[Crossref]

D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).

Dainty, J. C.

J. C. Dainty, Laser Speckle and Related Phenomena, 2nd ed. (Springer-Verlag, Berlin, 1984).

Dereux, A.

C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1996).
[Crossref]

Dunn, R. C.

R. C. Dunn, Chem. Rev. 99, 2891 (1999).
[Crossref]

Frankenthal, S.

García-Ramos, J. V.

Girard, C.

C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1996).
[Crossref]

Goodman, J. W.

J. W. Goodman, Opt. Commun. 14, 324 (1975).
[Crossref]

Hopen, C. Y.

Hung, Y. Y.

Y. Y. Hung, Opt. Eng. 21, 391 (1982).
[Crossref]

Jaggard, D. L.

Jakeman, E.

E. Jakeman and T. W. Welford, Opt. Commun. 21, 72 (1977).
[Crossref]

Javidi, B.

Leuchs, G.

Liu, C. X.

C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
[Crossref]

Liu, D. L.

D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).

Liu, M.

C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
[Crossref]

Lu, T.-H.

Y.-P. Zhao, G.-C. Wang, and T.-H. Lu, Characterization of Amorphous and Crystalline Rough Surfaces: Principles and Applications (Academic, New York, 2001).

Matoba, O.

Méndez, E. R.

Nieto-Vesperinas, M.

Phillips, R. L.

Qi, D. P.

D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).

Sánchez-Gil, J. A.

Sun, X.

Teng, S. Y.

C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
[Crossref]

D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).

Trautner, J.

Wang, G.-C.

Y.-P. Zhao, G.-C. Wang, and T.-H. Lu, Characterization of Amorphous and Crystalline Rough Surfaces: Principles and Applications (Academic, New York, 2001).

Welford, T. W.

E. Jakeman and T. W. Welford, Opt. Commun. 21, 72 (1977).
[Crossref]

T. W. Welford, Opt. Quantum Electron. 9, 269 (1977).
[Crossref]

Whitman, A. M.

Zhang, N. Y.

D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).

Zhang, N.Y.

C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
[Crossref]

Zhao, Y.-P.

Y.-P. Zhao, G.-C. Wang, and T.-H. Lu, Characterization of Amorphous and Crystalline Rough Surfaces: Principles and Applications (Academic, New York, 2001).

Acta Phys. Sin. (1)

D. P. Qi, D. L. Liu, S. Y. Teng, N. Y. Zhang, and C. F. Cheng, Acta Phys. Sin. 49, 1260 (2000).

Appl. Opt. (1)

Chem. Rev. (1)

R. C. Dunn, Chem. Rev. 99, 2891 (1999).
[Crossref]

J. Opt. Soc. Am. A (4)

Opt. Commun. (2)

J. W. Goodman, Opt. Commun. 14, 324 (1975).
[Crossref]

E. Jakeman and T. W. Welford, Opt. Commun. 21, 72 (1977).
[Crossref]

Opt. Eng. (1)

Y. Y. Hung, Opt. Eng. 21, 391 (1982).
[Crossref]

Opt. Lett. (2)

Opt. Quantum Electron. (1)

T. W. Welford, Opt. Quantum Electron. 9, 269 (1977).
[Crossref]

Phys. Rev. E (1)

C. F. Cheng, C. X. Liu, S. Y. Teng, N.Y. Zhang, and M. Liu, Phys. Rev. E 65, 061104 (2002).
[Crossref]

Rep. Prog. Phys. (1)

C. Girard and A. Dereux, Rep. Prog. Phys. 59, 657 (1996).
[Crossref]

Other (2)

Y.-P. Zhao, G.-C. Wang, and T.-H. Lu, Characterization of Amorphous and Crystalline Rough Surfaces: Principles and Applications (Academic, New York, 2001).

J. C. Dainty, Laser Speckle and Related Phenomena, 2nd ed. (Springer-Verlag, Berlin, 1984).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (3)

Fig. 1
Fig. 1

(a) The real part and (b) the imaginary part of the electric field calculated by Green’s integral method and by the KA. (c) Surface height distribution and (d) intensity distributions from Green’s integral method and from the KA.

Fig. 2
Fig. 2

Intensity distributions in the near-field region of random self-affine fractal surfaces for various values of roughness exponent α. The distances that correspond to the curves from bottom to top in each figure are 0, 0.1λ, 0.5λ, and λ.

Fig. 3
Fig. 3

Speckle contrast versus distance for random surfaces (a) with α=1.0 but different ξ and (b) with ξ=3.0 and different α. The curves in the insets are speckle contrast on the surfaces with R=0.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

Eix,Dx+14π-+dx×ExGz-DxGx-GFx=Ex,
-14π-+dx×ExG0z-DxG0x-G0Fx=0,
Er=-14π-+dx×ExG0z-DxG0x-G0Fx,
A+IBA0-IB0EF=2Ei0,

Metrics