Abstract

We describe a series of experiments in order to test a new sampling criterion for wavefront reconstruction from a carrier-frequency signal as obtained in electronic holography. Both a Fourier-transform configuration and a Fresnel-zone form of a digital holographic microscope are described. Direct coarse sampling of holograms with no phase-shifting elements can be used to obtain wavefront reconstruction, with the number of samples required reduced by the ratio f0/2Bs, where f0 is the carrier frequency and 2Bs is the signal bandwidth.

© 2003 Optical Society of America

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References

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  1. K. Khare and N. George, Opt. Commun. 211, 85 (2002).
    [CrossRef]
  2. E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
    [CrossRef]
  3. E. Leith, P. Naulleau, and D. Dilworth, Opt. Lett. 21, 1691 (1996).
    [CrossRef] [PubMed]
  4. M. Servin and M. Kujawinska, in Handbook of Optical Engineering, D. Malacara and B. J. Thompson, eds. (Marcel Dekker, New York, 2001).
  5. J. C. Marron and T. J. Schulz, Opt. Lett. 17, 285 (1992).
    [CrossRef] [PubMed]
  6. E. Tajahuerce and B. Javidi, Appl. Opt. 39, 6595 (2000).
    [CrossRef]
  7. I. Yamaguchi, T. Matsumura, and J. Kato, Opt. Lett. 27, 1108 (2002).
    [CrossRef]

2002

2000

1996

1992

1991

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Chen, H.

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Chen, Y.

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Dilworth, D.

E. Leith, P. Naulleau, and D. Dilworth, Opt. Lett. 21, 1691 (1996).
[CrossRef] [PubMed]

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

George, N.

K. Khare and N. George, Opt. Commun. 211, 85 (2002).
[CrossRef]

Javidi, B.

Kato, J.

Khare, K.

K. Khare and N. George, Opt. Commun. 211, 85 (2002).
[CrossRef]

Kujawinska, M.

M. Servin and M. Kujawinska, in Handbook of Optical Engineering, D. Malacara and B. J. Thompson, eds. (Marcel Dekker, New York, 2001).

Leith, E.

E. Leith, P. Naulleau, and D. Dilworth, Opt. Lett. 21, 1691 (1996).
[CrossRef] [PubMed]

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Lopez, J.

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Marron, J. C.

Masri, R.

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Matsumura, T.

Naulleau, P.

Rudd, J.

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Schulz, T. J.

Servin, M.

M. Servin and M. Kujawinska, in Handbook of Optical Engineering, D. Malacara and B. J. Thompson, eds. (Marcel Dekker, New York, 2001).

Tajahuerce, E.

Valdmanis, J.

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Yamaguchi, I.

Appl. Opt.

Opt. Commun.

K. Khare and N. George, Opt. Commun. 211, 85 (2002).
[CrossRef]

Opt. Lett.

Proc. SPIE

E. Leith, H. Chen, Y. Chen, D. Dilworth, J. Lopez, R. Masri, J. Rudd, and J. Valdmanis, Proc. SPIE 1600, 172 (1991).
[CrossRef]

Other

M. Servin and M. Kujawinska, in Handbook of Optical Engineering, D. Malacara and B. J. Thompson, eds. (Marcel Dekker, New York, 2001).

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Figures (3)

Fig. 1
Fig. 1

Experimental setup: La, laser; M1, M2, mirrors; f2/f1=5.5; other abbreviations defined in text.

Fig. 2
Fig. 2

Fourier-transform configuration: (a) object (three pinholes, 500µm diameter), (b) amplitude (log scale) of the Fourier transform, (c) phase of the Fourier transform, (d) reconstruction of object by inverse Fourier transform.

Fig. 3
Fig. 3

Fresnel-zone configuration: (a) resolution chart, 4-line/mm object; (b) recovery; (c) four-pinhole object; (d) recovery by inverse Fresnel calculation.

Equations (8)

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gx,y=ax,yexpi2πf0x+a*x,yexp-i2πf0x.
f02Bx0=N+12,
gx,y=m=-n=-gm4Bx0,n2By0×sinc2Bx0x-m4Bx0sinc2By0y-n2By0×cos2πf0x-m4Bx0,
ax,y=12m=-n=-gm4Bx0,n2By0×sinc2Bx0x-m4Bx0sinc2By0y-n2By0×exp-i2πf0m4Bx0.
exp-i2πf0m4Bx0=-1mN-im,
ax,y=i exp-i4πf/λλf--dxdyaobjx,y×expi2πxx+yyλf
ax,y=i exp-i2πz/λλz--dxdyaobjx,y×exp-iπλz[x-x2+y-y2
Ix,y=ax,y+exp-i2πf0x2=1+ax,y2+ax,yexpi2πf0x+a*x,y×exp-i2πf0x.

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