Abstract

An optical device based on a photonic bandgap heterostructure is designed, fabricated, and characterized. The sample contains two sets of Si/SiO2 photonic crystals with different periods. When the device is working in air, it reflects omnidirectionally both TE and TM mode lights at the wavelength near 1.3 µm. The reflectivity measured in the bandgap is higher than 98% in an incident angle range 0°70°. When the device is surrounded with silica n>1.33, it permits the total transmission for the TM mode but prevents the TE mode from propagating, thus behaving as a polarization splitter. The experimental extinction ratio of the reflected TE/TM is 31 dB. The uniformity of the device performance over a large sample area is demonstrated.

© 2003 Optical Society of America

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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  7. K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]

2002 (1)

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

2001 (5)

D. Lusk, I. Abdulhalim, and F. Placido, Opt. Commun. 198, 273 (2001).
[CrossRef]

Z. M. Jiang, B. Shi, D. T. Zhao, J. Liu, and X. Wang, Appl. Phys. Lett. 79, 3395 (2001).
[CrossRef]

R. Rengarajan, P. Jiang, D. C. Larrabee, V. L. Colvin, and D. M. Mittleman, Phys. Rev. B 64, 205103 (2001).
[CrossRef]

L. L. Lin and Z. Y. Li, Phys. Rev. B 63, 033310 (2001).
[CrossRef]

M. Deopura, L. K. Ullal, B. Temelkuran, and Y. Fink, Opt. Lett. 26, 1197 (2001).
[CrossRef]

1999 (2)

D. N. Chigrin, A. V. Lavrinenko, D. A. Yarotsky, and S. V. Gaponenko, Appl. Phys. A 68, 25 (1999).
[CrossRef]

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

1998 (3)

J. N. Winn, Y. Fink, S. Fan, and J. D. Joannopoulos, Opt. Lett. 23, 1573 (1998).
[CrossRef]

E. Yablonovitch, Opt. Lett. 23, 1648 (1998).
[CrossRef]

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

1987 (3)

M. Kohmoto, B. Sutherland, and K. Iguchi, Phys. Rev. Lett. 58, 2436 (1987).
[CrossRef] [PubMed]

E. Yablonovitch, Phys. Rev. Lett. 58, 2059 (1987).
[CrossRef] [PubMed]

S. John, Phys. Rev. Lett. 58, 2486 (1987).
[CrossRef] [PubMed]

Abdulhalim, I.

D. Lusk, I. Abdulhalim, and F. Placido, Opt. Commun. 198, 273 (2001).
[CrossRef]

Chen, C. P.

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

Chen, K. M.

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

Chigrin, D. N.

D. N. Chigrin, A. V. Lavrinenko, D. A. Yarotsky, and S. V. Gaponenko, Appl. Phys. A 68, 25 (1999).
[CrossRef]

Colvin, V. L.

R. Rengarajan, P. Jiang, D. C. Larrabee, V. L. Colvin, and D. M. Mittleman, Phys. Rev. B 64, 205103 (2001).
[CrossRef]

Deopura, M.

Fan, S.

Fan, S. H.

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

Fink, Y.

M. Deopura, L. K. Ullal, B. Temelkuran, and Y. Fink, Opt. Lett. 26, 1197 (2001).
[CrossRef]

J. N. Winn, Y. Fink, S. Fan, and J. D. Joannopoulos, Opt. Lett. 23, 1573 (1998).
[CrossRef]

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

Gaponenko, S. V.

D. N. Chigrin, A. V. Lavrinenko, D. A. Yarotsky, and S. V. Gaponenko, Appl. Phys. A 68, 25 (1999).
[CrossRef]

Hu, X. H.

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Iguchi, K.

M. Kohmoto, B. Sutherland, and K. Iguchi, Phys. Rev. Lett. 58, 2436 (1987).
[CrossRef] [PubMed]

Jia, W. L.

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Jiang, P.

R. Rengarajan, P. Jiang, D. C. Larrabee, V. L. Colvin, and D. M. Mittleman, Phys. Rev. B 64, 205103 (2001).
[CrossRef]

Jiang, Z. M.

Z. M. Jiang, B. Shi, D. T. Zhao, J. Liu, and X. Wang, Appl. Phys. Lett. 79, 3395 (2001).
[CrossRef]

Joannopoulos, J. D.

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

J. N. Winn, Y. Fink, S. Fan, and J. D. Joannopoulos, Opt. Lett. 23, 1573 (1998).
[CrossRef]

John, S.

S. John, Phys. Rev. Lett. 58, 2486 (1987).
[CrossRef] [PubMed]

Kimerling, C.

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

Kohmoto, M.

M. Kohmoto, B. Sutherland, and K. Iguchi, Phys. Rev. Lett. 58, 2436 (1987).
[CrossRef] [PubMed]

Larrabee, D. C.

R. Rengarajan, P. Jiang, D. C. Larrabee, V. L. Colvin, and D. M. Mittleman, Phys. Rev. B 64, 205103 (2001).
[CrossRef]

Lavrinenko, A. V.

D. N. Chigrin, A. V. Lavrinenko, D. A. Yarotsky, and S. V. Gaponenko, Appl. Phys. A 68, 25 (1999).
[CrossRef]

Li, Y. Z.

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Li, Z. Y.

L. L. Lin and Z. Y. Li, Phys. Rev. B 63, 033310 (2001).
[CrossRef]

Lim, D. R.

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

Lin, L. L.

L. L. Lin and Z. Y. Li, Phys. Rev. B 63, 033310 (2001).
[CrossRef]

Liu, J.

Z. M. Jiang, B. Shi, D. T. Zhao, J. Liu, and X. Wang, Appl. Phys. Lett. 79, 3395 (2001).
[CrossRef]

Liu, X. H.

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Luan, H. C.

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

Lusk, D.

D. Lusk, I. Abdulhalim, and F. Placido, Opt. Commun. 198, 273 (2001).
[CrossRef]

Michel, J.

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

Mittleman, D. M.

R. Rengarajan, P. Jiang, D. C. Larrabee, V. L. Colvin, and D. M. Mittleman, Phys. Rev. B 64, 205103 (2001).
[CrossRef]

Placido, F.

D. Lusk, I. Abdulhalim, and F. Placido, Opt. Commun. 198, 273 (2001).
[CrossRef]

Rengarajan, R.

R. Rengarajan, P. Jiang, D. C. Larrabee, V. L. Colvin, and D. M. Mittleman, Phys. Rev. B 64, 205103 (2001).
[CrossRef]

Shi, B.

Z. M. Jiang, B. Shi, D. T. Zhao, J. Liu, and X. Wang, Appl. Phys. Lett. 79, 3395 (2001).
[CrossRef]

Sparke, A. W.

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

Sutherland, B.

M. Kohmoto, B. Sutherland, and K. Iguchi, Phys. Rev. Lett. 58, 2436 (1987).
[CrossRef] [PubMed]

Temelkuran, B.

Thomas, E. L.

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

Ullal, L. K.

Wada, K.

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

Wang, X.

Z. M. Jiang, B. Shi, D. T. Zhao, J. Liu, and X. Wang, Appl. Phys. Lett. 79, 3395 (2001).
[CrossRef]

Wang, Xin

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Winn, J. N.

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

J. N. Winn, Y. Fink, S. Fan, and J. D. Joannopoulos, Opt. Lett. 23, 1573 (1998).
[CrossRef]

Xu, C.

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Yablonovitch, E.

E. Yablonovitch, Opt. Lett. 23, 1648 (1998).
[CrossRef]

E. Yablonovitch, Phys. Rev. Lett. 58, 2059 (1987).
[CrossRef] [PubMed]

Yarotsky, D. A.

D. N. Chigrin, A. V. Lavrinenko, D. A. Yarotsky, and S. V. Gaponenko, Appl. Phys. A 68, 25 (1999).
[CrossRef]

Zhao, D. T.

Z. M. Jiang, B. Shi, D. T. Zhao, J. Liu, and X. Wang, Appl. Phys. Lett. 79, 3395 (2001).
[CrossRef]

Zi, J.

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Appl. Phys. A (1)

D. N. Chigrin, A. V. Lavrinenko, D. A. Yarotsky, and S. V. Gaponenko, Appl. Phys. A 68, 25 (1999).
[CrossRef]

Appl. Phys. Lett. (3)

K. M. Chen, A. W. Sparke, H. C. Luan, D. R. Lim, K. Wada, and C. Kimerling, Appl. Phys. Lett. 75, 3805 (1999).
[CrossRef]

Z. M. Jiang, B. Shi, D. T. Zhao, J. Liu, and X. Wang, Appl. Phys. Lett. 79, 3395 (2001).
[CrossRef]

Xin Wang, X. H. Hu, Y. Z. Li, W. L. Jia, C. Xu, X. H. Liu, and J. Zi, Appl. Phys. Lett. 80, 4291 (2002).
[CrossRef]

Opt. Commun. (1)

D. Lusk, I. Abdulhalim, and F. Placido, Opt. Commun. 198, 273 (2001).
[CrossRef]

Opt. Lett. (3)

Phys. Rev. B (2)

R. Rengarajan, P. Jiang, D. C. Larrabee, V. L. Colvin, and D. M. Mittleman, Phys. Rev. B 64, 205103 (2001).
[CrossRef]

L. L. Lin and Z. Y. Li, Phys. Rev. B 63, 033310 (2001).
[CrossRef]

Phys. Rev. Lett. (3)

E. Yablonovitch, Phys. Rev. Lett. 58, 2059 (1987).
[CrossRef] [PubMed]

S. John, Phys. Rev. Lett. 58, 2486 (1987).
[CrossRef] [PubMed]

M. Kohmoto, B. Sutherland, and K. Iguchi, Phys. Rev. Lett. 58, 2436 (1987).
[CrossRef] [PubMed]

Science (1)

Y. Fink, J. N. Winn, S. H. Fan, C. P. Chen, J. Michel, J. D. Joannopoulos, and E. L. Thomas, Science 287, 1678 (1998).

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Figures (3)

Fig. 1
Fig. 1

(a) Calculated transmission spectra of the two PCs and the heterostructure for (solid curves) TE and TM (dotted curves) modes at an incident angle of 45°. The spectra from top to bottom are those for the upper PC1, the lower PC2, and the heterostructures without and with thickness fluctuation ±7%, respectively. The outer medium is air. (b) Reflectance for both polarizations as a function of incident angle for the two PCs and the heterostructure at λ=1.3 µm. The curves from top to bottom are those for PC1, PC2, and the heterostructure, respectively. The outer medium is fused silica.

Fig. 2
Fig. 2

Calculated (dotted curves) and measured (solid curves) reflectance spectra at normal, 45°, and 70° angles of incident in air.

Fig. 3
Fig. 3

(a) Measured reflectance as a function of incident angle for TE and TM modes at a wavelength of 1.3 µm. (b) Measured reflectance data at different positions apart from the wafer center on the sample surface.

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