Abstract

A 134-control-channel adaptive-optics system consisting of a microelectromechanical mirror array (μ-mirror), a wave-front tilt-control mirror, and a very large scale integration controller utilizing a stochastic gradient-descent optimization of a performance metric is presented. A maximum adaptation rate of 11,000 iterations/s was achieved. The system was used to demonstrate real-time compensation for dynamic phase distortions from a laboratory-generated turbulence simulator in a laser-focusing experiment.

© 2002 Optical Society of America

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  1. T. G. Bifano, J. Perreault, R. Krishnamoorthy Mali, and M. N. Horenstein, IEEE J. Sel. Top. Quantum Electron. 5, 83 (1999).
    [CrossRef]
  2. R. T. Edwards, M. Cohen, G. Cauwenberghs, M. A. Vorontsov, and G. W. Carhart, in Learning on Silicon, G. Cauwenberghs and M. A. Bayoumi, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 359–382.
  3. M. A. Vorontsov, G. W. Carhart, and J. C. Ricklin, Opt. Lett. 22, 907 (1997).
    [CrossRef] [PubMed]
  4. M. A. Vorontsov and V. P. Sivokon, J. Opt. Soc. Am. A 15, 2745 (1998).
    [CrossRef]
  5. J. C. Spall, in Proceedings of the American Control Conference (Institute of Electrical and Electronics Engineers, Piscataway, N.J., 1987), pp. 1161–1167.
  6. T. Weyrauch, M. A. Vorontsov, T. G. Bifano, and M. K. Giles, Proc. SPIE 412, 178 (2000).
    [CrossRef]
  7. T. Weyrauch, M. A. Vorontsov, T. G. Bifano, J. A. Hammer, M. Cohen, and G. Cauwenberghs, Appl. Opt. 40, 4243 (2001).
    [CrossRef]
  8. M. A. Vorontsov, G. W. Carhart, M. Cohen, and G. Cauwenberghs, J. Opt. Soc. Am. A 17, 1440 (2000).
    [CrossRef]

2001 (1)

2000 (2)

M. A. Vorontsov, G. W. Carhart, M. Cohen, and G. Cauwenberghs, J. Opt. Soc. Am. A 17, 1440 (2000).
[CrossRef]

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, and M. K. Giles, Proc. SPIE 412, 178 (2000).
[CrossRef]

1999 (1)

T. G. Bifano, J. Perreault, R. Krishnamoorthy Mali, and M. N. Horenstein, IEEE J. Sel. Top. Quantum Electron. 5, 83 (1999).
[CrossRef]

1998 (1)

1997 (1)

Bifano, T. G.

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, J. A. Hammer, M. Cohen, and G. Cauwenberghs, Appl. Opt. 40, 4243 (2001).
[CrossRef]

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, and M. K. Giles, Proc. SPIE 412, 178 (2000).
[CrossRef]

T. G. Bifano, J. Perreault, R. Krishnamoorthy Mali, and M. N. Horenstein, IEEE J. Sel. Top. Quantum Electron. 5, 83 (1999).
[CrossRef]

Carhart, G. W.

M. A. Vorontsov, G. W. Carhart, M. Cohen, and G. Cauwenberghs, J. Opt. Soc. Am. A 17, 1440 (2000).
[CrossRef]

M. A. Vorontsov, G. W. Carhart, and J. C. Ricklin, Opt. Lett. 22, 907 (1997).
[CrossRef] [PubMed]

R. T. Edwards, M. Cohen, G. Cauwenberghs, M. A. Vorontsov, and G. W. Carhart, in Learning on Silicon, G. Cauwenberghs and M. A. Bayoumi, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 359–382.

Cauwenberghs, G.

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, J. A. Hammer, M. Cohen, and G. Cauwenberghs, Appl. Opt. 40, 4243 (2001).
[CrossRef]

M. A. Vorontsov, G. W. Carhart, M. Cohen, and G. Cauwenberghs, J. Opt. Soc. Am. A 17, 1440 (2000).
[CrossRef]

R. T. Edwards, M. Cohen, G. Cauwenberghs, M. A. Vorontsov, and G. W. Carhart, in Learning on Silicon, G. Cauwenberghs and M. A. Bayoumi, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 359–382.

Cohen, M.

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, J. A. Hammer, M. Cohen, and G. Cauwenberghs, Appl. Opt. 40, 4243 (2001).
[CrossRef]

M. A. Vorontsov, G. W. Carhart, M. Cohen, and G. Cauwenberghs, J. Opt. Soc. Am. A 17, 1440 (2000).
[CrossRef]

R. T. Edwards, M. Cohen, G. Cauwenberghs, M. A. Vorontsov, and G. W. Carhart, in Learning on Silicon, G. Cauwenberghs and M. A. Bayoumi, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 359–382.

Edwards, R. T.

R. T. Edwards, M. Cohen, G. Cauwenberghs, M. A. Vorontsov, and G. W. Carhart, in Learning on Silicon, G. Cauwenberghs and M. A. Bayoumi, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 359–382.

Giles, M. K.

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, and M. K. Giles, Proc. SPIE 412, 178 (2000).
[CrossRef]

Hammer, J. A.

Horenstein, M. N.

T. G. Bifano, J. Perreault, R. Krishnamoorthy Mali, and M. N. Horenstein, IEEE J. Sel. Top. Quantum Electron. 5, 83 (1999).
[CrossRef]

Krishnamoorthy Mali, R.

T. G. Bifano, J. Perreault, R. Krishnamoorthy Mali, and M. N. Horenstein, IEEE J. Sel. Top. Quantum Electron. 5, 83 (1999).
[CrossRef]

Perreault, J.

T. G. Bifano, J. Perreault, R. Krishnamoorthy Mali, and M. N. Horenstein, IEEE J. Sel. Top. Quantum Electron. 5, 83 (1999).
[CrossRef]

Ricklin, J. C.

Sivokon, V. P.

Spall, J. C.

J. C. Spall, in Proceedings of the American Control Conference (Institute of Electrical and Electronics Engineers, Piscataway, N.J., 1987), pp. 1161–1167.

Vorontsov, M. A.

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, J. A. Hammer, M. Cohen, and G. Cauwenberghs, Appl. Opt. 40, 4243 (2001).
[CrossRef]

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, and M. K. Giles, Proc. SPIE 412, 178 (2000).
[CrossRef]

M. A. Vorontsov, G. W. Carhart, M. Cohen, and G. Cauwenberghs, J. Opt. Soc. Am. A 17, 1440 (2000).
[CrossRef]

M. A. Vorontsov and V. P. Sivokon, J. Opt. Soc. Am. A 15, 2745 (1998).
[CrossRef]

M. A. Vorontsov, G. W. Carhart, and J. C. Ricklin, Opt. Lett. 22, 907 (1997).
[CrossRef] [PubMed]

R. T. Edwards, M. Cohen, G. Cauwenberghs, M. A. Vorontsov, and G. W. Carhart, in Learning on Silicon, G. Cauwenberghs and M. A. Bayoumi, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 359–382.

Weyrauch, T.

Appl. Opt. (1)

IEEE J. Sel. Top. Quantum Electron. (1)

T. G. Bifano, J. Perreault, R. Krishnamoorthy Mali, and M. N. Horenstein, IEEE J. Sel. Top. Quantum Electron. 5, 83 (1999).
[CrossRef]

J. Opt. Soc. Am. A (2)

Opt. Lett. (1)

Proc. SPIE (1)

T. Weyrauch, M. A. Vorontsov, T. G. Bifano, and M. K. Giles, Proc. SPIE 412, 178 (2000).
[CrossRef]

Other (2)

J. C. Spall, in Proceedings of the American Control Conference (Institute of Electrical and Electronics Engineers, Piscataway, N.J., 1987), pp. 1161–1167.

R. T. Edwards, M. Cohen, G. Cauwenberghs, M. A. Vorontsov, and G. W. Carhart, in Learning on Silicon, G. Cauwenberghs and M. A. Bayoumi, eds. (Kluwer Academic, Dordrecht, The Netherlands, 1999), pp. 359–382.

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Figures (2)

Fig. 1
Fig. 1

Adaptive laser-beam-focusing system setup.

Fig. 2
Fig. 2

PDFs, ρ, of metric values J (laser beam power inside the pinhole) and frame-averaged focal-plane intensity distributions (insets a and b) for [curves (1)–(4)] wave-front phase distortion correction in the presence of generated turbulence and [curve (5)] without turbulence. Curve (1), TCS and μAOS system off; curve (2), TCS off and μAOS on; curve (3), TCS on and μAOS off; curve (4) TCS and μAOS on; curve (5) TCS and μAOS on (no turbulence). The insets show the averaged focal-plane intensity distributions a, without and b, with wave-front distortion compensation. In b, both the TCS and the μAOS are on.

Metrics