Abstract

A simple method for improving the input coupling in uncleaved waveguide photodetectors is demonstrated. A wedge-shaped recess is incorporated into the input facet to reduce reflection. Over a range of device sizes and wedge shapes, mean quantum efficiency was increased by 16% relative to flat, uncleaved input facets.

© 2002 Optical Society of America

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References

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  1. K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
    [Crossref]
  2. C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
    [Crossref]
  3. B. Sweetman, AIR & SPACE/Smithsonian Mag. 12, 18 (1997).

2000 (1)

C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
[Crossref]

1997 (1)

B. Sweetman, AIR & SPACE/Smithsonian Mag. 12, 18 (1997).

1994 (1)

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

Ho, C.-L.

C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
[Crossref]

Ho, W.-J.

C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
[Crossref]

Itaya, Y.

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

Kato, K.

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

Kozen, A.

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

Liaw, J.-W.

C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
[Crossref]

Muramoto, Y.

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

Nagatsuma, T.

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

Sweetman, B.

B. Sweetman, AIR & SPACE/Smithsonian Mag. 12, 18 (1997).

Wang, H.-L.

C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
[Crossref]

Wu, M. C.

C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
[Crossref]

Yaita, M.

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

AIR & SPACE/Smithsonian Mag. (1)

B. Sweetman, AIR & SPACE/Smithsonian Mag. 12, 18 (1997).

IEEE Photon. Technol. Lett. (1)

K. Kato, A. Kozen, Y. Muramoto, Y. Itaya, T. Nagatsuma, and M. Yaita, IEEE Photon. Technol. Lett. 6, 719 (1994).
[Crossref]

J. Quantum Electron. (1)

C.-L. Ho, M. C. Wu, W.-J. Ho, J.-W. Liaw, and H.-L. Wang, J. Quantum Electron. 36, 333 (2000).
[Crossref]

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Figures (3)

Fig. 1
Fig. 1

14 µm×40 µm wedge-facet and flat-facet devices.

Fig. 2
Fig. 2

Effect of cleaving on the reverse-bias dc photocurrent and dark current. In cleaved devices, dark current is increased and exceeds the photocurrent at breakdown.

Fig. 3
Fig. 3

Ratio of the photocurrent of devices of various sizes to that of a cleaved 14 µm×50 µm standard device. The standard device had a maximum quantum efficiency of 45% at 866 nm.

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