Abstract

A new real-time phase-shifting readout system is developed for quantitative evaluation of full-field correlation fringes obtained by means of Fourier filtering in speckle photography. The proposed method, which uses photorefractive crystals as the recording medium, is capable of mapping the whole-field displacement data from the recorded phase-shifted fringe patterns. Experimental results are presented on a diffuse surface subjected to rotation in its own plane.

© 2002 Optical Society of America

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References

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  1. G. H. Kaufmann, in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993), Chap. 9, pp. 427–472.
  2. K. Creath, in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1988), Vol. XXV, pp. 349–393.
    [CrossRef]
  3. G. H. Kaufmann and P. Jacquot, Appl. Opt. 29, 3570 (1990).
    [CrossRef] [PubMed]
  4. L. Liu, H. Helmers, and K. Hinsch, Opt. Commun. 100, 19 (1993).
    [CrossRef]
  5. P. R. Sreedhar, N. Krishna Mohan, and R. S. Sirohi, Opt. Eng. 33, 1989 (1994).
    [CrossRef]

1994 (1)

P. R. Sreedhar, N. Krishna Mohan, and R. S. Sirohi, Opt. Eng. 33, 1989 (1994).
[CrossRef]

1993 (1)

L. Liu, H. Helmers, and K. Hinsch, Opt. Commun. 100, 19 (1993).
[CrossRef]

1990 (1)

Creath, K.

K. Creath, in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1988), Vol. XXV, pp. 349–393.
[CrossRef]

Helmers, H.

L. Liu, H. Helmers, and K. Hinsch, Opt. Commun. 100, 19 (1993).
[CrossRef]

Hinsch, K.

L. Liu, H. Helmers, and K. Hinsch, Opt. Commun. 100, 19 (1993).
[CrossRef]

Jacquot, P.

Kaufmann, G. H.

G. H. Kaufmann and P. Jacquot, Appl. Opt. 29, 3570 (1990).
[CrossRef] [PubMed]

G. H. Kaufmann, in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993), Chap. 9, pp. 427–472.

Krishna Mohan, N.

P. R. Sreedhar, N. Krishna Mohan, and R. S. Sirohi, Opt. Eng. 33, 1989 (1994).
[CrossRef]

Liu, L.

L. Liu, H. Helmers, and K. Hinsch, Opt. Commun. 100, 19 (1993).
[CrossRef]

Sirohi, R. S.

P. R. Sreedhar, N. Krishna Mohan, and R. S. Sirohi, Opt. Eng. 33, 1989 (1994).
[CrossRef]

Sreedhar, P. R.

P. R. Sreedhar, N. Krishna Mohan, and R. S. Sirohi, Opt. Eng. 33, 1989 (1994).
[CrossRef]

Appl. Opt. (1)

Opt. Commun. (1)

L. Liu, H. Helmers, and K. Hinsch, Opt. Commun. 100, 19 (1993).
[CrossRef]

Opt. Eng. (1)

P. R. Sreedhar, N. Krishna Mohan, and R. S. Sirohi, Opt. Eng. 33, 1989 (1994).
[CrossRef]

Other (2)

G. H. Kaufmann, in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993), Chap. 9, pp. 427–472.

K. Creath, in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1988), Vol. XXV, pp. 349–393.
[CrossRef]

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Figures (3)

Fig. 1
Fig. 1

Schematic of a phase-shifting whole-field speckle photography setup for measurement of object deformations in real time.

Fig. 2
Fig. 2

(a) Whole-field fringes obtained on a diffuse surface subjected to in-plane rotation in its own plane. The fringe pattern displays the in-plane displacement component along the x direction. (b) Corresponding raw phase map.

Fig. 3
Fig. 3

Three-dimensional plot of the in-plane displacement component obtained from the phase map after the removal of the 2π phase ambiguity.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

IN=2I01+cosϕx,y+φN,
ϕx,y=tan-1I4-I2I1-I3.
dξ=mλ/sin ξ,
dξ=ϕx,yλ2π sin ξ.

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