Abstract

We demonstrate what is to our knowledge the first ultrabroadband monolithically grown AlGaAs/CaF2 semiconductor saturable-absorber mirror (SESAM) that covers nearly the entire gain spectrum of a Ti:sapphire laser. A large high-reflectivity bandwidth of more than 300 nm is provided by a device consisting of only six material layers. This fluoride SESAM had a modulation depth of 2.2%, a fast recovery time constant of less than 150 fs, and a slow recovery time constant of 1.2 ps. Using this SESAM inside a Ti:sapphire laser produced self-starting sub-10-femtosecond pulses.

© 2002 Optical Society of America

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  1. U. Keller, D. A. B. Miller, G. D. Boyd, T. H. Chiu, J. F. Ferguson, and M. T. Asom, Opt. Lett. 17, 505 (1992).
    [CrossRef] [PubMed]
  2. U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
    [CrossRef]
  3. L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
    [CrossRef]
  4. I. D. Jung, L. R. Brovelli, M. Kamp, U. Keller, and M. Moser, Opt. Lett. 20, 1559 (1995).
    [CrossRef] [PubMed]
  5. R. Fluck, I. D. Jung, G. Zhang, F. X. Kärtner, and U. Keller, Opt. Lett. 21, 743 (1996).
    [CrossRef] [PubMed]
  6. D. H. Sutter, G. Steinmeyer, L. Gallmann, N. Matuschek, F. Morier-Genoud, U. Keller, V. Scheuer, G. Angelow, and T. Tschudi, Opt. Lett. 24, 631 (1999).
    [CrossRef]
  7. I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
    [CrossRef]
  8. Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
    [CrossRef]
  9. S. Schön, M. Haiml, and U. Keller, Appl. Phys. Lett. 77, 782 (2000).
    [CrossRef]
  10. C. C. Desai, Surf. Technol. 14, 353 (1981).
    [CrossRef]
  11. S. Schön, H. Zogg, and U. Keller, J. Cryst. Growth 201/202, 1020 (1999).
    [CrossRef]
  12. S. Schön, M. Haiml, L. Gallmann, and U. Keller, J. Cryst. Growth 227–228, 172 (2001).
    [CrossRef]
  13. S. Schön, M. Haiml, M. Achermann, and U. Keller, J. Vac. Sci. Technol. B 18, 1701 (2000).
    [CrossRef]
  14. U. Keller, in Nonlinear Optics in Semiconductors, E. Garmire and A. Kost, eds. (Academic, Boston, Mass., 1999), Chap. 59, p. 211.
  15. S. Schön, M. Haiml, L. Gallmann, M. Achermann, and U. Keller, in Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (Institute of Electrical and Electronics Engineers, Piscataway, N.J., to be published).
  16. L. Gallmann, D. H. Sutter, N. Matuschek, G. Steinmeyer, U. Keller, C. Iaconis, and I. A. Walmsley, Opt. Lett. 24, 1314 (1999).
    [CrossRef]

2001 (1)

S. Schön, M. Haiml, L. Gallmann, and U. Keller, J. Cryst. Growth 227–228, 172 (2001).
[CrossRef]

2000 (3)

S. Schön, M. Haiml, M. Achermann, and U. Keller, J. Vac. Sci. Technol. B 18, 1701 (2000).
[CrossRef]

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

S. Schön, M. Haiml, and U. Keller, Appl. Phys. Lett. 77, 782 (2000).
[CrossRef]

1999 (3)

1997 (1)

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

1996 (2)

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

R. Fluck, I. D. Jung, G. Zhang, F. X. Kärtner, and U. Keller, Opt. Lett. 21, 743 (1996).
[CrossRef] [PubMed]

1995 (2)

I. D. Jung, L. R. Brovelli, M. Kamp, U. Keller, and M. Moser, Opt. Lett. 20, 1559 (1995).
[CrossRef] [PubMed]

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

1992 (1)

1981 (1)

C. C. Desai, Surf. Technol. 14, 353 (1981).
[CrossRef]

Achermann, M.

S. Schön, M. Haiml, M. Achermann, and U. Keller, J. Vac. Sci. Technol. B 18, 1701 (2000).
[CrossRef]

S. Schön, M. Haiml, L. Gallmann, M. Achermann, and U. Keller, in Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (Institute of Electrical and Electronics Engineers, Piscataway, N.J., to be published).

Angelow, G.

Asom, M. T.

Aus der Au, J.

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

Boyd, G. D.

Braun, B.

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

Brovelli, L. R.

I. D. Jung, L. R. Brovelli, M. Kamp, U. Keller, and M. Moser, Opt. Lett. 20, 1559 (1995).
[CrossRef] [PubMed]

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

Chiu, T. H.

Desai, C. C.

C. C. Desai, Surf. Technol. 14, 353 (1981).
[CrossRef]

Ferguson, J. F.

Fluck, R.

R. Fluck, I. D. Jung, G. Zhang, F. X. Kärtner, and U. Keller, Opt. Lett. 21, 743 (1996).
[CrossRef] [PubMed]

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

Gallmann, L.

S. Schön, M. Haiml, L. Gallmann, and U. Keller, J. Cryst. Growth 227–228, 172 (2001).
[CrossRef]

L. Gallmann, D. H. Sutter, N. Matuschek, G. Steinmeyer, U. Keller, C. Iaconis, and I. A. Walmsley, Opt. Lett. 24, 1314 (1999).
[CrossRef]

D. H. Sutter, G. Steinmeyer, L. Gallmann, N. Matuschek, F. Morier-Genoud, U. Keller, V. Scheuer, G. Angelow, and T. Tschudi, Opt. Lett. 24, 631 (1999).
[CrossRef]

S. Schön, M. Haiml, L. Gallmann, M. Achermann, and U. Keller, in Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (Institute of Electrical and Electronics Engineers, Piscataway, N.J., to be published).

Haiml, M.

S. Schön, M. Haiml, L. Gallmann, and U. Keller, J. Cryst. Growth 227–228, 172 (2001).
[CrossRef]

S. Schön, M. Haiml, M. Achermann, and U. Keller, J. Vac. Sci. Technol. B 18, 1701 (2000).
[CrossRef]

S. Schön, M. Haiml, and U. Keller, Appl. Phys. Lett. 77, 782 (2000).
[CrossRef]

S. Schön, M. Haiml, L. Gallmann, M. Achermann, and U. Keller, in Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (Institute of Electrical and Electronics Engineers, Piscataway, N.J., to be published).

Hönninger, C.

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

Iaconis, C.

Jung, I. D.

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

R. Fluck, I. D. Jung, G. Zhang, F. X. Kärtner, and U. Keller, Opt. Lett. 21, 743 (1996).
[CrossRef] [PubMed]

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

I. D. Jung, L. R. Brovelli, M. Kamp, U. Keller, and M. Moser, Opt. Lett. 20, 1559 (1995).
[CrossRef] [PubMed]

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

Kamp, M.

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

I. D. Jung, L. R. Brovelli, M. Kamp, U. Keller, and M. Moser, Opt. Lett. 20, 1559 (1995).
[CrossRef] [PubMed]

Kärtner, F. X.

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

R. Fluck, I. D. Jung, G. Zhang, F. X. Kärtner, and U. Keller, Opt. Lett. 21, 743 (1996).
[CrossRef] [PubMed]

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

Keller, U.

S. Schön, M. Haiml, L. Gallmann, and U. Keller, J. Cryst. Growth 227–228, 172 (2001).
[CrossRef]

S. Schön, M. Haiml, M. Achermann, and U. Keller, J. Vac. Sci. Technol. B 18, 1701 (2000).
[CrossRef]

S. Schön, M. Haiml, and U. Keller, Appl. Phys. Lett. 77, 782 (2000).
[CrossRef]

L. Gallmann, D. H. Sutter, N. Matuschek, G. Steinmeyer, U. Keller, C. Iaconis, and I. A. Walmsley, Opt. Lett. 24, 1314 (1999).
[CrossRef]

D. H. Sutter, G. Steinmeyer, L. Gallmann, N. Matuschek, F. Morier-Genoud, U. Keller, V. Scheuer, G. Angelow, and T. Tschudi, Opt. Lett. 24, 631 (1999).
[CrossRef]

S. Schön, H. Zogg, and U. Keller, J. Cryst. Growth 201/202, 1020 (1999).
[CrossRef]

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

R. Fluck, I. D. Jung, G. Zhang, F. X. Kärtner, and U. Keller, Opt. Lett. 21, 743 (1996).
[CrossRef] [PubMed]

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

I. D. Jung, L. R. Brovelli, M. Kamp, U. Keller, and M. Moser, Opt. Lett. 20, 1559 (1995).
[CrossRef] [PubMed]

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

U. Keller, D. A. B. Miller, G. D. Boyd, T. H. Chiu, J. F. Ferguson, and M. T. Asom, Opt. Lett. 17, 505 (1992).
[CrossRef] [PubMed]

S. Schön, M. Haiml, L. Gallmann, M. Achermann, and U. Keller, in Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (Institute of Electrical and Electronics Engineers, Piscataway, N.J., to be published).

U. Keller, in Nonlinear Optics in Semiconductors, E. Garmire and A. Kost, eds. (Academic, Boston, Mass., 1999), Chap. 59, p. 211.

Kobayashi, K.

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Kopf, D.

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

Matuschek, N.

L. Gallmann, D. H. Sutter, N. Matuschek, G. Steinmeyer, U. Keller, C. Iaconis, and I. A. Walmsley, Opt. Lett. 24, 1314 (1999).
[CrossRef]

D. H. Sutter, G. Steinmeyer, L. Gallmann, N. Matuschek, F. Morier-Genoud, U. Keller, V. Scheuer, G. Angelow, and T. Tschudi, Opt. Lett. 24, 631 (1999).
[CrossRef]

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

Miller, D. A. B.

Mirua, T.

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Morier-Genoud, F.

D. H. Sutter, G. Steinmeyer, L. Gallmann, N. Matuschek, F. Morier-Genoud, U. Keller, V. Scheuer, G. Angelow, and T. Tschudi, Opt. Lett. 24, 631 (1999).
[CrossRef]

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

Moser, M.

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

I. D. Jung, L. R. Brovelli, M. Kamp, U. Keller, and M. Moser, Opt. Lett. 20, 1559 (1995).
[CrossRef] [PubMed]

Nakagawa, T.

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Scheuer, V.

D. H. Sutter, G. Steinmeyer, L. Gallmann, N. Matuschek, F. Morier-Genoud, U. Keller, V. Scheuer, G. Angelow, and T. Tschudi, Opt. Lett. 24, 631 (1999).
[CrossRef]

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

Schön, S.

S. Schön, M. Haiml, L. Gallmann, and U. Keller, J. Cryst. Growth 227–228, 172 (2001).
[CrossRef]

S. Schön, M. Haiml, M. Achermann, and U. Keller, J. Vac. Sci. Technol. B 18, 1701 (2000).
[CrossRef]

S. Schön, M. Haiml, and U. Keller, Appl. Phys. Lett. 77, 782 (2000).
[CrossRef]

S. Schön, H. Zogg, and U. Keller, J. Cryst. Growth 201/202, 1020 (1999).
[CrossRef]

S. Schön, M. Haiml, L. Gallmann, M. Achermann, and U. Keller, in Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (Institute of Electrical and Electronics Engineers, Piscataway, N.J., to be published).

Shi, Z.

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

Steinmeyer, G.

Sugaya, T.

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Sutter, D. H.

Takada, H.

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Tilsch, M.

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

Torizuka, K.

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Tschudi, T.

D. H. Sutter, G. Steinmeyer, L. Gallmann, N. Matuschek, F. Morier-Genoud, U. Keller, V. Scheuer, G. Angelow, and T. Tschudi, Opt. Lett. 24, 631 (1999).
[CrossRef]

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

Walmsley, I. A.

Weingarten, K. J.

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

Zhang, G.

Zhang, Z.

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Zogg, H.

S. Schön, H. Zogg, and U. Keller, J. Cryst. Growth 201/202, 1020 (1999).
[CrossRef]

Appl. Phys. B (1)

I. D. Jung, F. X. Kärtner, N. Matuschek, D. H. Sutter, F. Morier-Genoud, Z. Shi, V. Scheuer, M. Tilsch, T. Tschudi, and U. Keller, Appl. Phys. B 65, 137 (1997).
[CrossRef]

Appl. Phys. Lett. (1)

S. Schön, M. Haiml, and U. Keller, Appl. Phys. Lett. 77, 782 (2000).
[CrossRef]

Electron. Lett. (1)

L. R. Brovelli, I. D. Jung, D. Kopf, M. Kamp, M. Moser, F. X. Kärtner, and U. Keller, Electron. Lett. 31, 287 (1995).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (1)

U. Keller, K. J. Weingarten, F. X. Kärtner, D. Kopf, B. Braun, I. D. Jung, R. Fluck, C. Hönninger, N. Matuschek, and J. Aus der Au, IEEE J. Sel. Top. Quantum Electron. 2, 435 (1996).
[CrossRef]

J. Cryst. Growth (2)

S. Schön, H. Zogg, and U. Keller, J. Cryst. Growth 201/202, 1020 (1999).
[CrossRef]

S. Schön, M. Haiml, L. Gallmann, and U. Keller, J. Cryst. Growth 227–228, 172 (2001).
[CrossRef]

J. Vac. Sci. Technol. B (1)

S. Schön, M. Haiml, M. Achermann, and U. Keller, J. Vac. Sci. Technol. B 18, 1701 (2000).
[CrossRef]

Opt. Commun. (1)

Z. Zhang, T. Nakagawa, H. Takada, K. Torizuka, T. Sugaya, T. Mirua, and K. Kobayashi, Opt. Commun. 176, 171 (2000).
[CrossRef]

Opt. Lett. (5)

Surf. Technol. (1)

C. C. Desai, Surf. Technol. 14, 353 (1981).
[CrossRef]

Other (2)

U. Keller, in Nonlinear Optics in Semiconductors, E. Garmire and A. Kost, eds. (Academic, Boston, Mass., 1999), Chap. 59, p. 211.

S. Schön, M. Haiml, L. Gallmann, M. Achermann, and U. Keller, in Proceedings of the Conference on Optoelectronic and Microelectronic Materials and Devices (Institute of Electrical and Electronics Engineers, Piscataway, N.J., to be published).

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Figures (5)

Fig. 1
Fig. 1

(a) Design and (b) reflectivity spectrum of an ultrabroadband AlGaAs/CaF2 SESAM with a GaAs semiconductor saturable absorber. The reflectivity spectrum was measured with a Cary 5E photospectrometer with a standard silver mirror of 97% reflectivity used as a reference.

Fig. 2
Fig. 2

Nonlinear reflectivity versus pulse energy fluence. A modulation depth ΔRlin of 2.2% and nonsaturable losses ΔRns of 2.7% were measured.

Fig. 3
Fig. 3

Nonlinear reflectivity modulation ΔR as a function of time measured with a standard degenerate pump–probe setup at 830 nm. Biexponential recovery times of 150 fs (thermalization) and 1.2 ps (carrier trapping–thermalization) were measured.

Fig. 4
Fig. 4

Temporal pulse shape reconstructed by SPIDER of a sub-10-fs pulse generated by a Kerr-lens mode-locked Ti:sapphire laser with an AlGaAs/CaF2 SESAM. The corresponding pulse spectrum has a transform limit of 8.2 fs.

Fig. 5
Fig. 5

Reflectivity spectra (left axis) of the AlGaAs/CaF2 SESAM and of the output coupler and pulse spectrum (right axis) with a transform limit of 8.2 fs.

Metrics