Abstract

We present a demonstrator photonic system for mathematical morphology image processing. Optically interconnected arrays of differential pairs of optoelectronic transceivers realize morphological erosion and dilation in an 8×8 pixel size image.

© 2002 Optical Society of America

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  1. T. Szoplik, ed., Mophological Image Processing: Fundamentals and Optoelectronic Implementations, Vol. MS127 of SPIE Milestone Series (SPIE Press, Bellingham, Wash., 1996).
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
  4. R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).
  5. J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
    [CrossRef]
  6. P. Heremans, M. Kuijik, R. Vounkx, and G. Borghs, Appl. Phys. Lett. 65, 191 (1994).
    [CrossRef]
  7. A. Kirk, A. Goulet, H. Thienpont, N. McArdle, K. H. Brenner, M. Kuijk, P. Heremans, and I. Veretennicoff, Appl. Opt. 36, 3070 (1997).
    [CrossRef] [PubMed]
  8. R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).
  9. R. Buczynski, T. Szoplik, I. Veretennicoff, and H. Thienpont, in Optoelectronic Information Processing: Optics for Information Systems, P. Refregier, B. Javidi, C. Ferreira, and S. Vallmitjana, eds., Vol. CR81 of SPIE Critical Review Series (SPIE Press, Bellingham, Wash., 2001), pp. 289¿313.
  10. R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
    [CrossRef]
  11. J. M. Wu, C. B. Kuznia, B. Hoanca, C. H. Chen, and A. A. Sawchuk, Appl. Opt. 38, 2270 (1999).
    [CrossRef]
  12. M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. Rozier, F. Kiamilev, Y. Liu, and M. Hibbs-Brenner, Appl. Opt. 38, 6190 (1999).
    [CrossRef]
  13. A. Cassinelli, P. Chavel, and M. P. Y. Desmulliez, Appl. Opt. 40, 6479 (2001).
    [CrossRef]

2001

R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).

R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).

A. Cassinelli, P. Chavel, and M. P. Y. Desmulliez, Appl. Opt. 40, 6479 (2001).
[CrossRef]

1999

1997

1996

1994

P. Heremans, M. Kuijik, R. Vounkx, and G. Borghs, Appl. Phys. Lett. 65, 191 (1994).
[CrossRef]

1988

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Arent, D. J.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Asher, S.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Baukens, V.

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

Borghs, G.

P. Heremans, M. Kuijik, R. Vounkx, and G. Borghs, Appl. Phys. Lett. 65, 191 (1994).
[CrossRef]

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Brenner, K. H.

Buczynski, R.

R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).

R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

R. Buczynski, T. Szoplik, I. Veretennicoff, and H. Thienpont, in Optoelectronic Information Processing: Optics for Information Systems, P. Refregier, B. Javidi, C. Ferreira, and S. Vallmitjana, eds., Vol. CR81 of SPIE Critical Review Series (SPIE Press, Bellingham, Wash., 2001), pp. 289¿313.

Cassinelli, A.

Chandramani, P.

Chavel, P.

Chen, C. H.

Christensen, M. P.

Debaes, N.

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

Desmulliez, M. P. Y.

Ekman, J.

Goulet, A.

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

A. Kirk, A. Goulet, H. Thienpont, N. McArdle, K. H. Brenner, M. Kuijk, P. Heremans, and I. Veretennicoff, Appl. Opt. 36, 3070 (1997).
[CrossRef] [PubMed]

Haney, M. W.

Hanna, M.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Harvey, M. G.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Hayes, R.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Heremans, P.

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

A. Kirk, A. Goulet, H. Thienpont, N. McArdle, K. H. Brenner, M. Kuijk, P. Heremans, and I. Veretennicoff, Appl. Opt. 36, 3070 (1997).
[CrossRef] [PubMed]

P. Heremans, M. Kuijik, R. Vounkx, and G. Borghs, Appl. Phys. Lett. 65, 191 (1994).
[CrossRef]

Hibbs-Brenner, M.

Hoanca, B.

Huang, G.

Ichioka, Y.

Jankowski, S.

R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).

Jin, G.

Kiamilev, F.

Kirk, A.

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

A. Kirk, A. Goulet, H. Thienpont, N. McArdle, K. H. Brenner, M. Kuijk, P. Heremans, and I. Veretennicoff, Appl. Opt. 36, 3070 (1997).
[CrossRef] [PubMed]

Konishi, T.

Kuijik, M.

P. Heremans, M. Kuijik, R. Vounkx, and G. Borghs, Appl. Phys. Lett. 65, 191 (1994).
[CrossRef]

Kuijk, M.

Kuznia, C. B.

Liu, Y.

Majerfeld, A.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Matson, R.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

McArdle, N.

Milojkovic, P.

Oh, E. G.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Pankove, J. I.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Rozier, R.

Sawchuk, A. A.

Suda, D.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Szmyd, D. M.

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

Szoplik, T.

R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).

R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

R. Buczynski, T. Szoplik, I. Veretennicoff, and H. Thienpont, in Optoelectronic Information Processing: Optics for Information Systems, P. Refregier, B. Javidi, C. Ferreira, and S. Vallmitjana, eds., Vol. CR81 of SPIE Critical Review Series (SPIE Press, Bellingham, Wash., 2001), pp. 289¿313.

Tanida, J.

Taniguchi, S.

Thienpont, H.

R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).

R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

A. Kirk, A. Goulet, H. Thienpont, N. McArdle, K. H. Brenner, M. Kuijk, P. Heremans, and I. Veretennicoff, Appl. Opt. 36, 3070 (1997).
[CrossRef] [PubMed]

R. Buczynski, T. Szoplik, I. Veretennicoff, and H. Thienpont, in Optoelectronic Information Processing: Optics for Information Systems, P. Refregier, B. Javidi, C. Ferreira, and S. Vallmitjana, eds., Vol. CR81 of SPIE Critical Review Series (SPIE Press, Bellingham, Wash., 2001), pp. 289¿313.

Veretennicoff, I.

R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).

R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

A. Kirk, A. Goulet, H. Thienpont, N. McArdle, K. H. Brenner, M. Kuijk, P. Heremans, and I. Veretennicoff, Appl. Opt. 36, 3070 (1997).
[CrossRef] [PubMed]

R. Buczynski, T. Szoplik, I. Veretennicoff, and H. Thienpont, in Optoelectronic Information Processing: Optics for Information Systems, P. Refregier, B. Javidi, C. Ferreira, and S. Vallmitjana, eds., Vol. CR81 of SPIE Critical Review Series (SPIE Press, Bellingham, Wash., 2001), pp. 289¿313.

Viet, K. B.

R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).

Vounckx, R.

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

Vounkx, R.

P. Heremans, M. Kuijik, R. Vounkx, and G. Borghs, Appl. Phys. Lett. 65, 191 (1994).
[CrossRef]

Wu, J. M.

Wu, M.

Yan, Y.

Appl. Opt.

Appl. Phys. Lett.

P. Heremans, M. Kuijik, R. Vounkx, and G. Borghs, Appl. Phys. Lett. 65, 191 (1994).
[CrossRef]

IEEE Photon. Technol. Lett.

R. Buczynski, V. Baukens, T. Szoplik, A. Goulet, N. Debaes, A. Kirk, P. Heremans, R. Vounckx, I. Veretennicoff, and H. Thienpont, IEEE Photon. Technol. Lett. 11, 367 (1999).
[CrossRef]

Opt. Appl.

R. Buczynski, T. Szoplik, S. Jankowski, I. Veretennicoff, and H. Thienpont, Opt. Appl. 31, 453 (2001).

Opto-electron. Rev.

R. Buczynski, K. B. Viet, T. Szoplik, I. Veretennicoff, and H. Thienpont, Opto-electron. Rev. 9, 215 (2001).

Proc. SPIE

J. I. Pankove, R. Hayes, A. Majerfeld, M. Hanna, E. G. Oh, D. M. Szmyd, D. Suda, S. Asher, R. Matson, D. J. Arent, G. Borghs, and M. G. Harvey, Proc. SPIE 963, 191 (1988).
[CrossRef]

SPIE Critical Review Series

R. Buczynski, T. Szoplik, I. Veretennicoff, and H. Thienpont, in Optoelectronic Information Processing: Optics for Information Systems, P. Refregier, B. Javidi, C. Ferreira, and S. Vallmitjana, eds., Vol. CR81 of SPIE Critical Review Series (SPIE Press, Bellingham, Wash., 2001), pp. 289¿313.

SPIE Milestone Series

T. Szoplik, ed., Mophological Image Processing: Fundamentals and Optoelectronic Implementations, Vol. MS127 of SPIE Milestone Series (SPIE Press, Bellingham, Wash., 1996).

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Figures (2)

Fig. 1
Fig. 1

Architecture of the MP built of comparator arrays of transceivers.

Fig. 2
Fig. 2

Experimental results of morphological (a), (b) erosions and (c), (d) dilations of binary 8×8 pixel images with (1:3 and 1:5) structuring elements.

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

xij=xij+,xij-.
uij=uij+,uij-=k=-rrl=-rrBk,lxi+k,j+l++I+, k=-rrl=-rrBk,lxi+k,j+l-+I-,
I+=0,    I-=k=-rrl=-rrBkl-1,
I+=k=-rrl=-rrBkl-1,    I-=0.
yij+=1uij+-uij-00uij+-uij-<0, yij-=1uij+-uij-<00uij+-uij-0.
B=010111010,    I+=0,  I-=4;
B=010111010,    I+=4,  I-=0.

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