Abstract

We propose a method for single-shot measurement of the carrier-envelope phase of high-intensity laser pulses. The method is based on observation of the electrons’ spatial distribution ionized by a time-dependent polarization pulse generated by a combination of replicas of the measuring pulse. The dependence of the electrons’ angular distribution on carrier-envelope phase, pulse width, delay between two combining components, and a peak intensity is calculated. Important experimental issues such as broadening of the angular distribution, Gouy phase, difference between the two replicas, and asymmetric pulse shape are also discussed.

© 2002 Optical Society of America

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