Abstract

We propose a method for suppressing the intensity of the worst ghost pulse (a single ghost pulse between two long marker blocks) resulting from intrachannel four-wave mixing (FWM) in strongly dispersion-managed on–off keying optical transmissions by inverting the optical phases of the marker blocks surrounding the ghost pulse. We show both analytically and numerically that the method provides substantial suppression of the maximum ghost pulse energy. The suppression is experimentally verified in 40Gbit/s transmission experiment over a 100-km non-zero-dispersion-shifted fiber. The proposed method may extend the reach of high-bit-rate optical transmission systems in which intrachannel FWM is the dominating nonlinear penalty.

© 2002 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. P. V. Mamyshev and N. A. Mamysheva, Opt. Lett. 24, 1454 (1999).
    [CrossRef]
  2. R. J. Essiambre, B. Mikkelsen, and G. Raybon, Electron. Lett. 35, 1576 (1999).
    [CrossRef]
  3. A. Mecozzi, C. B. Clausen, and M. Shtaif, IEEE Photon. Technol. Lett. 12, 392 (2000).
    [CrossRef]
  4. M. J. Ablowitz and T. Hirooka, Opt. Lett. 25, 1750 (2000).
    [CrossRef]
  5. P. Johannisson, D. Anderson, A. Berntson, and J. Martensson, Opt. Lett. 26, 1227 (2001).
    [CrossRef]
  6. R. I. Killey, H. J. Thiele, V. Mikhailov, and P. Bayvel, IEEE Photon. Technol. Lett. 12, 1624 (2000).
    [CrossRef]
  7. J. Martensson, A. Berntson, M. Westlund, A. Danielsson, P. Johannisson, D. Anderson, and M. Lisak, Opt. Lett. 26, 55 (2001).
    [CrossRef]
  8. S. Kumar, IEEE Photon. Technol. Lett. 13, 800 (2001).
    [CrossRef]
  9. K. S. Cheng and J. Conradi, IEEE Photon. Technol. Lett. 14, 98 (2002).
    [CrossRef]
  10. Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
    [CrossRef]
  11. A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
    [CrossRef]

2002 (1)

K. S. Cheng and J. Conradi, IEEE Photon. Technol. Lett. 14, 98 (2002).
[CrossRef]

2001 (3)

2000 (3)

R. I. Killey, H. J. Thiele, V. Mikhailov, and P. Bayvel, IEEE Photon. Technol. Lett. 12, 1624 (2000).
[CrossRef]

A. Mecozzi, C. B. Clausen, and M. Shtaif, IEEE Photon. Technol. Lett. 12, 392 (2000).
[CrossRef]

M. J. Ablowitz and T. Hirooka, Opt. Lett. 25, 1750 (2000).
[CrossRef]

1999 (4)

P. V. Mamyshev and N. A. Mamysheva, Opt. Lett. 24, 1454 (1999).
[CrossRef]

R. J. Essiambre, B. Mikkelsen, and G. Raybon, Electron. Lett. 35, 1576 (1999).
[CrossRef]

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
[CrossRef]

Ablowitz, M. J.

Anderson, D.

Bayvel, P.

R. I. Killey, H. J. Thiele, V. Mikhailov, and P. Bayvel, IEEE Photon. Technol. Lett. 12, 1624 (2000).
[CrossRef]

Berntson, A.

Cheng, K. S.

K. S. Cheng and J. Conradi, IEEE Photon. Technol. Lett. 14, 98 (2002).
[CrossRef]

Clausen, C. B.

A. Mecozzi, C. B. Clausen, and M. Shtaif, IEEE Photon. Technol. Lett. 12, 392 (2000).
[CrossRef]

Conradi, J.

K. S. Cheng and J. Conradi, IEEE Photon. Technol. Lett. 14, 98 (2002).
[CrossRef]

Danielsson, A.

Essiambre, R. J.

R. J. Essiambre, B. Mikkelsen, and G. Raybon, Electron. Lett. 35, 1576 (1999).
[CrossRef]

Hiramno, A.

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

Hirano, A.

A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
[CrossRef]

Hirooka, T.

Johannisson, P.

Killey, R. I.

R. I. Killey, H. J. Thiele, V. Mikhailov, and P. Bayvel, IEEE Photon. Technol. Lett. 12, 1624 (2000).
[CrossRef]

Kumar, S.

S. Kumar, IEEE Photon. Technol. Lett. 13, 800 (2001).
[CrossRef]

Lisak, M.

Mamyshev, P. V.

Mamysheva, N. A.

Martensson, J.

Mecozzi, A.

A. Mecozzi, C. B. Clausen, and M. Shtaif, IEEE Photon. Technol. Lett. 12, 392 (2000).
[CrossRef]

Mikhailov, V.

R. I. Killey, H. J. Thiele, V. Mikhailov, and P. Bayvel, IEEE Photon. Technol. Lett. 12, 1624 (2000).
[CrossRef]

Mikkelsen, B.

R. J. Essiambre, B. Mikkelsen, and G. Raybon, Electron. Lett. 35, 1576 (1999).
[CrossRef]

Mitomi, O.

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

Miyamoto, Y.

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
[CrossRef]

Murata, K.

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

Raybon, G.

R. J. Essiambre, B. Mikkelsen, and G. Raybon, Electron. Lett. 35, 1576 (1999).
[CrossRef]

Sano, A.

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
[CrossRef]

Shtaif, M.

A. Mecozzi, C. B. Clausen, and M. Shtaif, IEEE Photon. Technol. Lett. 12, 392 (2000).
[CrossRef]

Thiele, H. J.

R. I. Killey, H. J. Thiele, V. Mikhailov, and P. Bayvel, IEEE Photon. Technol. Lett. 12, 1624 (2000).
[CrossRef]

Toba, H.

A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
[CrossRef]

Toba, Hi

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

Westlund, M.

Yonenaga, K.

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
[CrossRef]

Electron. Lett. (3)

R. J. Essiambre, B. Mikkelsen, and G. Raybon, Electron. Lett. 35, 1576 (1999).
[CrossRef]

Y. Miyamoto, A. Hiramno, K. Yonenaga, A. Sano, Hi Toba, K. Murata, and O. Mitomi, Electron. Lett. 35, 2041 (1999).
[CrossRef]

A. Hirano, Y. Miyamoto, K. Yonenaga, A. Sano, and H. Toba, Electron. Lett. 35, 2213 (1999).
[CrossRef]

IEEE Photon. Technol. Lett. (4)

A. Mecozzi, C. B. Clausen, and M. Shtaif, IEEE Photon. Technol. Lett. 12, 392 (2000).
[CrossRef]

R. I. Killey, H. J. Thiele, V. Mikhailov, and P. Bayvel, IEEE Photon. Technol. Lett. 12, 1624 (2000).
[CrossRef]

S. Kumar, IEEE Photon. Technol. Lett. 13, 800 (2001).
[CrossRef]

K. S. Cheng and J. Conradi, IEEE Photon. Technol. Lett. 14, 98 (2002).
[CrossRef]

Opt. Lett. (4)

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (4)

Fig. 1
Fig. 1

Schematic of the proposed OOK format with phase inversion between adjacent marker blocks. Phases 0 and π are represented by + and -, respectively.

Fig. 2
Fig. 2

Top, simulated dispersion map; bottom, evolution of ghost pulse amplitude with transmission distance.

Fig. 3
Fig. 3

Portion of (top row) input and (bottom row) output bit sequences after 3000-km transmission of a simulated WDM channel (left) without and (right) with the phase-inversion method. The dispersion map is the same as that used in Fig. 2.

Fig. 4
Fig. 4

Portion of experimental bit sequence of 40Gbit/s data after transmission (top) without and (bottom) with the phase-inversion method at (left) 0 dBm and (right) 9 dBm of launch power.

Equations (6)

Equations on this page are rendered with MathJax. Learn more.

dA0dz=l,m,n=l+mDlmnγAlAmAn*F0l+m-nz,
fkz=kcTλ2Daccumz,
Akz=A0 exp-2 ln2fkzΔfFWHM2,
ϕkz2=ϕk0-πcT2λ2Daccumzk2.
F0l+m-nz=expiϕl0+ϕm0-ϕn0-iπcT2λ2Daccumzl2+m2-n2.
F0l+m-nzF0-l+-m--nz=expiϕl0+ϕm0-ϕn0expiϕ-l0+ϕ-m0-ϕ-n0.

Metrics