Abstract

A real-time, frequency-translated holographic imaging system has been developed by use of bacteriorhodopsin film. The system provides a capability for imaging surface acoustic waves and has been utilized to detect and characterize surface-breaking defects through near-field ultrasonic scattering effects. Frequency-plane filtering was used to discriminate between ultrasonic standing-wave and near-field scattering features, dramatically enhancing the holographic visualization of the defect sites. A detailed description of the system is presented, along with representative holographic images showing the interaction of surface acoustic waves with surface-breaking cracks and small notches in aluminum and titanium substrates.

© 2002 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef]

2001 (1)

J. Scales and K. Van Wijk, Appl. Phys. Lett. 79, 2294 (2001).
[CrossRef]

2000 (1)

1999 (2)

J. Doyle, Mater. Evaluation 57, 426 (1999).

N. Hampp, A. Seitz, T. Juchem, and O. Dieter, Proc. SPIE 3623, 243 (1999).
[CrossRef]

1998 (1)

H. Xiao and P. Nagy, J. Appl. Phys. 83, 7453 (1998).
[CrossRef]

1997 (2)

T. Hale, K. Telshow, and V. Deason, Appl. Opt. 36, 8248 (1997).
[CrossRef]

K. Nakano, K. Hane, S. Okuma, and T. Eguchi, Opt. Rev. 4, 265 (1997).
[CrossRef]

1992 (1)

C. Fitzpatrick, Proc. SPIE 1667, 225 (1992).
[CrossRef]

1975 (1)

S. Shiokawa, T. Morizzumi, and T. Yasuda, Appl. Phys. Lett. 27, (1975).
[CrossRef]

1974 (1)

S. Shiokawa, M. Ueda, T. Moriizumi, and T. Yasuda, Jpn. J. Appl. Phys. 13, (1974).
[CrossRef]

1971 (1)

Aleksoff, C.

Deason, V.

Dieter, O.

N. Hampp, A. Seitz, T. Juchem, and O. Dieter, Proc. SPIE 3623, 243 (1999).
[CrossRef]

Doyle, J.

J. Doyle, Mater. Evaluation 57, 426 (1999).

Drain, L.

C. Scruby and L. Drain, Laser Ultrasonics—Techniques and Applications (Adam Hilger, London, 1990).

Eguchi, T.

K. Nakano, K. Hane, S. Okuma, and T. Eguchi, Opt. Rev. 4, 265 (1997).
[CrossRef]

Fitzpatrick, C.

C. Fitzpatrick, Proc. SPIE 1667, 225 (1992).
[CrossRef]

Hale, T.

Hampp, N.

N. Hampp, A. Seitz, T. Juchem, and O. Dieter, Proc. SPIE 3623, 243 (1999).
[CrossRef]

Hane, K.

K. Nakano, K. Hane, S. Okuma, and T. Eguchi, Opt. Rev. 4, 265 (1997).
[CrossRef]

Juchem, T.

N. Hampp, A. Seitz, T. Juchem, and O. Dieter, Proc. SPIE 3623, 243 (1999).
[CrossRef]

Knuuttila, J.

Moriizumi, T.

S. Shiokawa, M. Ueda, T. Moriizumi, and T. Yasuda, Jpn. J. Appl. Phys. 13, (1974).
[CrossRef]

Morizzumi, T.

S. Shiokawa, T. Morizzumi, and T. Yasuda, Appl. Phys. Lett. 27, (1975).
[CrossRef]

Nagy, P.

H. Xiao and P. Nagy, J. Appl. Phys. 83, 7453 (1998).
[CrossRef]

Nakano, K.

K. Nakano, K. Hane, S. Okuma, and T. Eguchi, Opt. Rev. 4, 265 (1997).
[CrossRef]

Okuma, S.

K. Nakano, K. Hane, S. Okuma, and T. Eguchi, Opt. Rev. 4, 265 (1997).
[CrossRef]

Salomaa, M.

Scales, J.

J. Scales and K. Van Wijk, Appl. Phys. Lett. 79, 2294 (2001).
[CrossRef]

Scruby, C.

C. Scruby and L. Drain, Laser Ultrasonics—Techniques and Applications (Adam Hilger, London, 1990).

Seitz, A.

N. Hampp, A. Seitz, T. Juchem, and O. Dieter, Proc. SPIE 3623, 243 (1999).
[CrossRef]

Shiokawa, S.

S. Shiokawa, T. Morizzumi, and T. Yasuda, Appl. Phys. Lett. 27, (1975).
[CrossRef]

S. Shiokawa, M. Ueda, T. Moriizumi, and T. Yasuda, Jpn. J. Appl. Phys. 13, (1974).
[CrossRef]

Telshow, K.

Tikka, P.

Ueda, M.

S. Shiokawa, M. Ueda, T. Moriizumi, and T. Yasuda, Jpn. J. Appl. Phys. 13, (1974).
[CrossRef]

Van Wijk, K.

J. Scales and K. Van Wijk, Appl. Phys. Lett. 79, 2294 (2001).
[CrossRef]

Xiao, H.

H. Xiao and P. Nagy, J. Appl. Phys. 83, 7453 (1998).
[CrossRef]

Yasuda, T.

S. Shiokawa, T. Morizzumi, and T. Yasuda, Appl. Phys. Lett. 27, (1975).
[CrossRef]

S. Shiokawa, M. Ueda, T. Moriizumi, and T. Yasuda, Jpn. J. Appl. Phys. 13, (1974).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. Lett. (2)

J. Scales and K. Van Wijk, Appl. Phys. Lett. 79, 2294 (2001).
[CrossRef]

S. Shiokawa, T. Morizzumi, and T. Yasuda, Appl. Phys. Lett. 27, (1975).
[CrossRef]

J. Appl. Phys. (1)

H. Xiao and P. Nagy, J. Appl. Phys. 83, 7453 (1998).
[CrossRef]

Jpn. J. Appl. Phys. (1)

S. Shiokawa, M. Ueda, T. Moriizumi, and T. Yasuda, Jpn. J. Appl. Phys. 13, (1974).
[CrossRef]

Mater. Evaluation (1)

J. Doyle, Mater. Evaluation 57, 426 (1999).

Opt. Lett. (1)

Opt. Rev. (1)

K. Nakano, K. Hane, S. Okuma, and T. Eguchi, Opt. Rev. 4, 265 (1997).
[CrossRef]

Proc. SPIE (2)

C. Fitzpatrick, Proc. SPIE 1667, 225 (1992).
[CrossRef]

N. Hampp, A. Seitz, T. Juchem, and O. Dieter, Proc. SPIE 3623, 243 (1999).
[CrossRef]

Other (2)

P. Morre and P. McIntire, eds., Special Nondestructive Testing Methods, Vol. 9 of Nondestructive Testing Handbook (American Society for Nondestructive Testing, New York, 1995).

C. Scruby and L. Drain, Laser Ultrasonics—Techniques and Applications (Adam Hilger, London, 1990).

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Figures (4)

Fig. 1
Fig. 1

Real-time frequency-translated holography system.

Fig. 2
Fig. 2

Visualization of a through-the-thickness crack in aluminum with real-time, frequency-translated holography.

Fig. 3
Fig. 3

Visualization of a large surface crack in aluminum with real-time, frequency-translated holography.

Fig. 4
Fig. 4

Visualization of a small electrical discharge machined notch in titanium with real-time, frequency-translated holography.

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