Abstract

We report experimental results on the development of residual stress due to OH impurity in optical fibers. The effect of OH impurity on residual stress is demonstrated by direct residual stress measurement. The residual stress at the outer-cladding/jacketing-tube boundary of the fiber drawn at 3.48 N was found to be -61 MPa. The residual compressive stress is attributed to the viscosity decrease induced by a significant OH impurity at the boundary, as measured by a Fourier transform infrared microscope.

© 2002 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
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2002

2001

2000

G. A. Thomas, B. I. Shralman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[CrossRef] [PubMed]

1996

K. M. Davis, A. Agarwal, M. Tomozawa, and K. Hirao, J. Non-Cryst. Solids 203, 27–36 (1996).
[CrossRef]

1994

R. H. Doremus, Glass Science (Wiley, New York, 1994), Chap. 6.

1987

1980

G. W. Scherer, J. Non-Cryst. Solids 38&39, 201 (1980).
[CrossRef]

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

1979

S. E. Miller and A. G. Chynoweth, Optical Fiber Telecommunications (Academic, New York, 1979), Chap. 7.

T. Miya, Y. Terunuma, T. Hosaka, and T. Miyashita, Electron. Lett. 15, 106 (1979).
[CrossRef]

1977

M. Kawachi, M. Horiguchi, A. Kawana, and T. Miyashita, Electron. Lett. 13, 247 (1977).
[CrossRef]

1975

U. C. Paek and C. R. Kurkjian, J. Am. Ceram. Soc. 58, 330 (1975).
[CrossRef]

Agarwal, A.

K. M. Davis, A. Agarwal, M. Tomozawa, and K. Hirao, J. Non-Cryst. Solids 203, 27–36 (1996).
[CrossRef]

Ahn, T.-J.

Bachmann, P. K.

Biswas, D. R.

D. R. Biswas, in Fiber Optics Reliability and Testing, D. K. Paul, ed., Vol. CR50 of SPIE Critical Review Series (SPIE Optical Engineering Press, Bellingham, Wash., 1994), pp. 63–79.

Chida, K.

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

Chung, Y.

Chynoweth, A. G.

S. E. Miller and A. G. Chynoweth, Optical Fiber Telecommunications (Academic, New York, 1979), Chap. 7.

Davis, K. M.

K. M. Davis, A. Agarwal, M. Tomozawa, and K. Hirao, J. Non-Cryst. Solids 203, 27–36 (1996).
[CrossRef]

Doremus, R. H.

R. H. Doremus, Glass Science (Wiley, New York, 1994), Chap. 6.

Edahiro, T.

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

Fukuda, O.

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

Glodis, P. F.

G. A. Thomas, B. I. Shralman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[CrossRef] [PubMed]

Han, W.-T.

Hermann, W.

Hirao, K.

K. M. Davis, A. Agarwal, M. Tomozawa, and K. Hirao, J. Non-Cryst. Solids 203, 27–36 (1996).
[CrossRef]

Horiguchi, M.

M. Kawachi, M. Horiguchi, A. Kawana, and T. Miyashita, Electron. Lett. 13, 247 (1977).
[CrossRef]

Hosaka, T.

T. Miya, Y. Terunuma, T. Hosaka, and T. Miyashita, Electron. Lett. 15, 106 (1979).
[CrossRef]

Inada, K.

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

Kawachi, M.

M. Kawachi, M. Horiguchi, A. Kawana, and T. Miyashita, Electron. Lett. 13, 247 (1977).
[CrossRef]

Kawana, A.

M. Kawachi, M. Horiguchi, A. Kawana, and T. Miyashita, Electron. Lett. 13, 247 (1977).
[CrossRef]

Kim, B. H.

Kim, D. Y.

Kim, Y. H.

Kurkjian, C. R.

U. C. Paek and C. R. Kurkjian, J. Am. Ceram. Soc. 58, 330 (1975).
[CrossRef]

Lee, B. H.

Miller, S. E.

S. E. Miller and A. G. Chynoweth, Optical Fiber Telecommunications (Academic, New York, 1979), Chap. 7.

Miya, T.

T. Miya, Y. Terunuma, T. Hosaka, and T. Miyashita, Electron. Lett. 15, 106 (1979).
[CrossRef]

Miyashita, T.

T. Miya, Y. Terunuma, T. Hosaka, and T. Miyashita, Electron. Lett. 15, 106 (1979).
[CrossRef]

M. Kawachi, M. Horiguchi, A. Kawana, and T. Miyashita, Electron. Lett. 13, 247 (1977).
[CrossRef]

Moriyama, T.

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

Paek, U. C.

Paek, U.-C.

Park, Y.

Sanada, K.

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

Scherer, G. W.

G. W. Scherer, J. Non-Cryst. Solids 38&39, 201 (1980).
[CrossRef]

Shralman, B. I.

G. A. Thomas, B. I. Shralman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[CrossRef] [PubMed]

Stephen, M. J.

G. A. Thomas, B. I. Shralman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[CrossRef] [PubMed]

Terunuma, Y.

T. Miya, Y. Terunuma, T. Hosaka, and T. Miyashita, Electron. Lett. 15, 106 (1979).
[CrossRef]

Thomas, G. A.

G. A. Thomas, B. I. Shralman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[CrossRef] [PubMed]

Tomozawa, M.

K. M. Davis, A. Agarwal, M. Tomozawa, and K. Hirao, J. Non-Cryst. Solids 203, 27–36 (1996).
[CrossRef]

Wehr, H.

Wiechert, D. U.

Appl. Opt.

Electron. Lett.

T. Miya, Y. Terunuma, T. Hosaka, and T. Miyashita, Electron. Lett. 15, 106 (1979).
[CrossRef]

T. Moriyama, O. Fukuda, K. Sanada, K. Inada, T. Edahiro, and K. Chida, Electron. Lett. 16, 699 (1980).
[CrossRef]

M. Kawachi, M. Horiguchi, A. Kawana, and T. Miyashita, Electron. Lett. 13, 247 (1977).
[CrossRef]

J. Am. Ceram. Soc.

U. C. Paek and C. R. Kurkjian, J. Am. Ceram. Soc. 58, 330 (1975).
[CrossRef]

J. Non-Cryst. Solids

G. W. Scherer, J. Non-Cryst. Solids 38&39, 201 (1980).
[CrossRef]

K. M. Davis, A. Agarwal, M. Tomozawa, and K. Hirao, J. Non-Cryst. Solids 203, 27–36 (1996).
[CrossRef]

Nature

G. A. Thomas, B. I. Shralman, P. F. Glodis, and M. J. Stephen, Nature 404, 262 (2000).
[CrossRef] [PubMed]

Opt. Lett.

SPIE Critical Review Series

D. R. Biswas, in Fiber Optics Reliability and Testing, D. K. Paul, ed., Vol. CR50 of SPIE Critical Review Series (SPIE Optical Engineering Press, Bellingham, Wash., 1994), pp. 63–79.

Other

S. E. Miller and A. G. Chynoweth, Optical Fiber Telecommunications (Academic, New York, 1979), Chap. 7.

GE Quartz Catalog (General Electric, Cleveland, Oh.).

R. H. Doremus, Glass Science (Wiley, New York, 1994), Chap. 6.

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Figures (3)

Fig. 1
Fig. 1

Axial stress profiles of fibers FB 1–FB 3, drawn at different drawing forces.

Fig. 2
Fig. 2

Radial distribution of OH impurity in the (a) preform and (b) axial stress profile of fiber FB 3. Inset, FTIR spectra in the regions of A and B.

Fig. 3
Fig. 3

Axial stress profiles of the fibers FB 1 and FB 2 drawn at (a) 0.53 N and (b) 3.48 N before (thin solid curves) and after (thick solid curves) CO2-laser irradiation with output power of 72.1 W for 15 min and estimated mechanical stress profiles (filled circles).

Equations (3)

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σzthr=TrT*Er,T1-νr,Tαr,T-cTdT,
cT=2R20Rαr,Trdr.
σzmer=Fηr0R2πηrrdr-Er0R2πErrdr,

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