Abstract

An optical correlation setup is used to image transparent objects through scattering media, and 10μm longitudinal and 2.5μm transverse resolution are achieved. Spectral-bandwidth sampling of the light source is made possible by a tunable dye laser and leads to signal enhancement as a result of sampling interferogram filtering. An optical system allows observation of sample slices without the need for a translation stage.

© 2001 Optical Society of America

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References

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  1. W. Drexler, U. Morgner, F. X. Kärtner, C. Pitris, S. A. Boppart, X. D. Li, E. P. Ippen, and J. G. Fujimoto, Opt. Lett. 24, 1221 (1999).
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  7. G. Brun, I. Verrier, D. Troadec, C. Veillas, and J. P. Goure, Opt. Commun. 168, 261 (1999).
    [CrossRef]
  8. A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
    [CrossRef]

2000

D. Hölscher, C. Kemmer, F. Rupp, and V. Blazck, Proc. SPIE 3915, 83 (2000).
[CrossRef]

R. Leitgeb, M. Wojtkowski, A. Kowalaczyk, C. K. Hitzenberger, M. Sticker, and A. F. Fercher, Opt. Lett. 25, 820 (2000).
[CrossRef]

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

1999

1997

I. Zeylikovich and R. R. Alfano, Opt. Commun. 135, 217 (1997).
[CrossRef]

Alfano, R. R.

I. Zeylikovich and R. R. Alfano, Opt. Commun. 135, 217 (1997).
[CrossRef]

Blazck, V.

D. Hölscher, C. Kemmer, F. Rupp, and V. Blazck, Proc. SPIE 3915, 83 (2000).
[CrossRef]

Boppart, S. A.

Brun, G.

G. Brun, I. Verrier, D. Troadec, C. Veillas, and J. P. Goure, Opt. Commun. 168, 261 (1999).
[CrossRef]

Chak, A.

Drexler, W.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

W. Drexler, U. Morgner, F. X. Kärtner, C. Pitris, S. A. Boppart, X. D. Li, E. P. Ippen, and J. G. Fujimoto, Opt. Lett. 24, 1221 (1999).
[CrossRef]

Fercher, A. F.

R. Leitgeb, M. Wojtkowski, A. Kowalaczyk, C. K. Hitzenberger, M. Sticker, and A. F. Fercher, Opt. Lett. 25, 820 (2000).
[CrossRef]

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

Fujimoto, J. G.

Goure, J. P.

G. Brun, I. Verrier, D. Troadec, C. Veillas, and J. P. Goure, Opt. Commun. 168, 261 (1999).
[CrossRef]

Hitzenberger, C. K.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

R. Leitgeb, M. Wojtkowski, A. Kowalaczyk, C. K. Hitzenberger, M. Sticker, and A. F. Fercher, Opt. Lett. 25, 820 (2000).
[CrossRef]

Hölscher, D.

D. Hölscher, C. Kemmer, F. Rupp, and V. Blazck, Proc. SPIE 3915, 83 (2000).
[CrossRef]

Ippen, E. P.

Itoh, M.

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

Izatt, J. A.

Kärtner, F. X.

Kemmer, C.

D. Hölscher, C. Kemmer, F. Rupp, and V. Blazck, Proc. SPIE 3915, 83 (2000).
[CrossRef]

Kobayashi, K.

Kowalaczyk, A.

Leitgeb, R.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

R. Leitgeb, M. Wojtkowski, A. Kowalaczyk, C. K. Hitzenberger, M. Sticker, and A. F. Fercher, Opt. Lett. 25, 820 (2000).
[CrossRef]

Li, X. D.

Moreno-Barriuso, E.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

Morgner, U.

Mori, M.

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

Nakama, M.

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

Pitris, C.

Rollins, A. M.

Rupp, F.

D. Hölscher, C. Kemmer, F. Rupp, and V. Blazck, Proc. SPIE 3915, 83 (2000).
[CrossRef]

Sattman, H.

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

Sivak, M. V.

Sticker, M.

R. Leitgeb, M. Wojtkowski, A. Kowalaczyk, C. K. Hitzenberger, M. Sticker, and A. F. Fercher, Opt. Lett. 25, 820 (2000).
[CrossRef]

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

Sutoh, Y.

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

Troadec, D.

G. Brun, I. Verrier, D. Troadec, C. Veillas, and J. P. Goure, Opt. Commun. 168, 261 (1999).
[CrossRef]

Ung-Arunyawee, R.

Veillas, C.

G. Brun, I. Verrier, D. Troadec, C. Veillas, and J. P. Goure, Opt. Commun. 168, 261 (1999).
[CrossRef]

Verrier, I.

G. Brun, I. Verrier, D. Troadec, C. Veillas, and J. P. Goure, Opt. Commun. 168, 261 (1999).
[CrossRef]

Wojtkowski, M.

Wong, R. C. K.

Yasuno, Y.

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

Yatagi, T.

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

Zeylikovich, I.

I. Zeylikovich and R. R. Alfano, Opt. Commun. 135, 217 (1997).
[CrossRef]

Opt. Commun.

I. Zeylikovich and R. R. Alfano, Opt. Commun. 135, 217 (1997).
[CrossRef]

Y. Yasuno, M. Nakama, Y. Sutoh, M. Itoh, M. Mori, and T. Yatagi, Opt. Commun. 186, 51 (2000).
[CrossRef]

G. Brun, I. Verrier, D. Troadec, C. Veillas, and J. P. Goure, Opt. Commun. 168, 261 (1999).
[CrossRef]

A. F. Fercher, C. K. Hitzenberger, M. Sticker, E. Moreno-Barriuso, R. Leitgeb, W. Drexler, and H. Sattman, Opt. Commun. 185, 57 (2000).
[CrossRef]

Opt. Lett.

Proc. SPIE

D. Hölscher, C. Kemmer, F. Rupp, and V. Blazck, Proc. SPIE 3915, 83 (2000).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Experimental setup: TDL, tunable dye laser; BSs, beam splitters; Ms, mirrors; DL, delay line; Gs, gratings; AS, afocal systems; S, sample; L, lens; CCD, photodiode matrice.

Fig. 2
Fig. 2

Filtering example: (a) one spectral component interferogram, (b) total correlation signal, (c) spatial Fourier transform of image (a), (d) filtered spectral component interferogram, (e) filtered total correlation signal, (f) filtered total correlation-signal modulus.

Fig. 3
Fig. 3

Afocal system for slice imaging.

Fig. 4
Fig. 4

Results of the point scan experiment: (a) scanned object scheme, (b) corner scan.

Fig. 5
Fig. 5

Results of the vertical-slice analysis. Thin-plate stacking (a) scheme and (b) correlation signal. Fresnel lens (c) scheme and (d) correlation signal.

Equations (2)

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Er=-Ar2r,ν+At2r,νdν+2Rexp-i2πQ̃x×FTνQxArr,νFTνQxAtr,νexp-i2πδν/c,
E˜r=FTν-QxArr,νFTν-QxAtr,νexpi2πδν/c×expi2πQ˜x.

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