Abstract

SrBi2Ta2O9 (SBT) thin films on quartz substrates were prepared by use of the pulsed-laser deposition technique. The nonlinear refractive indices, n2, of the SBT films were measured by use of z-scan techniques with picosecond pulses. Large negative nonlinear refractive indices of 3.84 and 3.58 cm2/GW were obtained for the wavelengths 532  nm and 1.064 μm, respectively. The two-photon absorption coefficient was determined to be 7.3  cm/GW for 532  nm. The limiting behavior of SBT thin film on a quartz substrate was investigated in an f/5 defocusing geometry by use of 38-ps-duration, 532-nm, 1.064μm laser excitation.

© 2001 Optical Society of America

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