Abstract

We report on phase-dispersion optical tomography, a new imaging technique based on phase measurements using low-coherence interferometry. The technique simultaneously probes the target with fundamental and second-harmonic light and interferometrically measures the relative phase shift of the backscattered light fields. This phase change can arise either from reflection at an interface within a sample or from bulk refraction. We show that this highly sensitive 5° phase technique can complement optical coherence tomography, which measures electric field amplitude, by revealing otherwise undetectable dispersive variations in the sample.

© 2001 Optical Society of America

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References

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  1. C. Yang, A. Wax, I. Georgakoudi, E. B. Hanlon, K. Badizadegan, R. R. Dasari, and M. S. Feld, Opt. Lett. 25, 1526 (2000).
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
  6. A. B. Carlson, Communication Systems, 3rd ed. (McGraw-Hill, New York, 1986).
  7. C. Yang, A. Wax, and M. S. Feld, Opt. Lett. 26, 235 (2001).
    [CrossRef]
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    [CrossRef]
  9. H. Matsumoto, Rev. Sci. Instrum. 65, 2894 (1994).
    [CrossRef]
  10. R. C. Weast, ed., CRC Handbook of Chemistry and Physics, 64th ed. (CRC, Boca Raton, Fla., 1983).

2001 (1)

2000 (2)

1999 (2)

1997 (1)

1994 (1)

H. Matsumoto, Rev. Sci. Instrum. 65, 2894 (1994).
[CrossRef]

1993 (1)

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Badizadegan, K.

Bevilacqua, F.

Carlson, A. B.

A. B. Carlson, Communication Systems, 3rd ed. (McGraw-Hill, New York, 1986).

Chen, Z.

Cuche, E.

Dasari, R. R.

de Boer, J. F.

Depeursinge, C.

Feld, M. S.

Fercher, A. F.

Fujimoto, J. G.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Georgakoudi, I.

Hanlon, E. B.

Hee, M. R.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Hitzenberger, C. K.

Huang, D.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Izatt, J. A.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Lin, C. P.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Matsumoto, H.

H. Matsumoto, Rev. Sci. Instrum. 65, 2894 (1994).
[CrossRef]

Milner, T. E.

Nelson, J. S.

Puliafito, C. A.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Saxer, C.

Schuman, J. S.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Swanson, E. A.

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

van Gemert, M. J. C.

Wax, A.

Xiang, S.

Yang, C.

Zhao, Y.

Opt. Lett. (6)

Opt. Photon. News (1)

J. A. Izatt, M. R. Hee, D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, Opt. Photon. News 4(10) 14 (1993).
[CrossRef]

Rev. Sci. Instrum. (1)

H. Matsumoto, Rev. Sci. Instrum. 65, 2894 (1994).
[CrossRef]

Other (2)

R. C. Weast, ed., CRC Handbook of Chemistry and Physics, 64th ed. (CRC, Boca Raton, Fla., 1983).

A. B. Carlson, Communication Systems, 3rd ed. (McGraw-Hill, New York, 1986).

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Figures (3)

Fig. 1
Fig. 1

Experimental setup: M, reference mirror; BS, beam splitter; O1, O2, microscope objectives; D1, D2, photodetectors; DM, 408nm/816nm dichroic mirror. ADC, analog-to-digital converter.

Fig. 2
Fig. 2

Images of the sample studied with PDOT: (a) geometrical arrangement; (b) PDOT phase image, ΨRL; (c) processed PDOT image, in which the intrinsic dispersion-related phase shift, ΨDiLi, is plotted.

Fig. 3
Fig. 3

OCT images of the sample: (a) 816  nm, (b) 408  nm.

Tables (1)

Tables Icon

Table 1 Measurements of Ψinterface for Various Surfaces

Equations (3)

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ΨRL=mod2π2k10Ln1z-n2zdz+2ϕ1-ϕ2,
ΨRL=0=Ψinterface=mod2π2ϕ1-ϕ2.
ΨD,iLi=mod2π2k1n1,i-n2,iLi,

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