Abstract

A novel interferometry technique is presented by which, in one shot, one can measure phase changes with a resolution of tens of femtoseconds while extending the measurement over picoseconds or even longer. The method is based on spectral (frequency-domain) interferometry with a pair of linearly chirped pules as probes. With this technique we obtained single-shot measurements of the rapid phase changes induced by optical field ionization of air. This allowed us to calculate the time profile of the electron density created by an intense short laser pulse.

© 2000 Optical Society of America

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