Abstract

Speckles usually are of two kinds: laser speckle and white-light speckle. An additional kind, termed a sampled speckle, is proposed. Whereas laser speckles arise from multiple interference of light scattered from an object illuminated by a coherent laser beam and white-light speckles are a physically generated speckle pattern on the surface of the object, sampled speckles are generated as a result of the sampling of a digital image. The generation of these speckles and their application to displacement measurement are demonstrated.

© 2000 Optical Society of America

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References

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  1. J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).
  2. R. P. Khetan and F. P. Chiang, Appl. Opt. 15, 2205 (1976).
    [CrossRef] [PubMed]
  3. R. S. Sirohi, ed., Speckle Metrology (Marcel Dekker, New York, 1993).
  4. F. P. Chiang and A. Asundi, Appl. Opt. 18, 409 (1979).
    [CrossRef] [PubMed]
  5. A. Asundi and F. P. Chiang, Opt. Eng. 21, 570 (1982).
    [CrossRef]
  6. D. A. Chambless and J. A. Broadway, Exp. Mech. 19, 286 (1979).
    [CrossRef]
  7. T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Exp. Mech. 25, 232 (1985).
    [CrossRef]

1985 (1)

T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Exp. Mech. 25, 232 (1985).
[CrossRef]

1982 (1)

A. Asundi and F. P. Chiang, Opt. Eng. 21, 570 (1982).
[CrossRef]

1979 (2)

D. A. Chambless and J. A. Broadway, Exp. Mech. 19, 286 (1979).
[CrossRef]

F. P. Chiang and A. Asundi, Appl. Opt. 18, 409 (1979).
[CrossRef] [PubMed]

1976 (1)

1968 (1)

J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).

Asundi, A.

Broadway, J. A.

D. A. Chambless and J. A. Broadway, Exp. Mech. 19, 286 (1979).
[CrossRef]

Burch, J. M.

J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).

Chambless, D. A.

D. A. Chambless and J. A. Broadway, Exp. Mech. 19, 286 (1979).
[CrossRef]

Chiang, F. P.

Chu, T. C.

T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Exp. Mech. 25, 232 (1985).
[CrossRef]

Khetan, R. P.

Peters, W. H.

T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Exp. Mech. 25, 232 (1985).
[CrossRef]

Ranson, W. F.

T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Exp. Mech. 25, 232 (1985).
[CrossRef]

Sutton, M. A.

T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Exp. Mech. 25, 232 (1985).
[CrossRef]

Tokarski, J. M. J.

J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).

Appl. Opt. (2)

Exp. Mech. (2)

D. A. Chambless and J. A. Broadway, Exp. Mech. 19, 286 (1979).
[CrossRef]

T. C. Chu, W. F. Ranson, M. A. Sutton, and W. H. Peters, Exp. Mech. 25, 232 (1985).
[CrossRef]

Opt. Acta (1)

J. M. Burch and J. M. J. Tokarski, Opt. Acta 15, 101 (1968).

Opt. Eng. (1)

A. Asundi and F. P. Chiang, Opt. Eng. 21, 570 (1982).
[CrossRef]

Other (1)

R. S. Sirohi, ed., Speckle Metrology (Marcel Dekker, New York, 1993).

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Figures (5)

Fig. 1
Fig. 1

Gray-scale image and the speckles observed when the image is enlarged.

Fig. 2
Fig. 2

Speckle size as a function of sampling size.

Fig. 3
Fig. 3

(a) Single-exposed and (b) double-exposed sampled specklegrams and their Fourier transforms.

Fig. 4
Fig. 4

Multiexposed specklegram and its Fourier transform.

Fig. 5
Fig. 5

Fourier transforms with increasing image size resulting in reduced speckle size.

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