Abstract

A method for measuring the diffusion coefficient of homogeneous and layered media, based on multidistance measurements of time-resolved reflectance, is proposed. The diffusion coefficient is retrieved from the logarithm between two measurements of reflectance at two different distances. The proposed procedure is simpler than others usually employed and also provides a reliable criterion for retrieval of information on the layered structure of a diffusive medium.

© 2000 Optical Society of America

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