Abstract

A new approach to measuring displacement and temperature simultaneously by use of a specially designed isosceles triangular cantilevered beam as a strain agent is demonstrated. A fiber Bragg grating epoxied onto the beam surface is experimentally demonstrated to have a temperature sensitivity of 0.113 nm/°C below 60 °C and a displacement sensitivity of 9.24×10-2 nm/mm.

© 2000 Optical Society of America

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References

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1999

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

1998

G. C. Lin, L. Wang, C. C. Yang, M. C. Shih, and T. J. Chuang, IEEE Photon. Technol. Lett. 10, 406 (1998).
[CrossRef]

1996

M. LeBlanc, S. Y. Huang, M. Ohn, R. M. Measures, A. Guemes, and A. Othonos, Opt. Lett. 21, 1405 (1996).
[CrossRef] [PubMed]

S. W. James, M. L. Dockney, and R. P. Tatam, Electron. Lett. 32, 1133 (1996).
[CrossRef]

H. J. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[CrossRef]

1995

1994

M. G. Xu, J.-L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[CrossRef]

1992

Archambault, J.-L.

M. G. Xu, J.-L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[CrossRef]

Ball, G. A.

Cheng, C.

C. Cheng and C. Liu, Chemical Building Material Handbook, 1st ed. (Jiangxi Science and Technology Press, Nanchang, China, 1997), pp. 140–143.

Chuang, T. J.

G. C. Lin, L. Wang, C. C. Yang, M. C. Shih, and T. J. Chuang, IEEE Photon. Technol. Lett. 10, 406 (1998).
[CrossRef]

Chung, W.

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

Dakin, J. P.

M. G. Xu, J.-L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[CrossRef]

Demokan, M. S.

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

Dockney, M. L.

S. W. James, M. L. Dockney, and R. P. Tatam, Electron. Lett. 32, 1133 (1996).
[CrossRef]

Geng, S.

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

Guemes, A.

Handerek, V. A.

Huang, S. Y.

James, S. W.

S. W. James, M. L. Dockney, and R. P. Tatam, Electron. Lett. 32, 1133 (1996).
[CrossRef]

Kanellopoulos, S. E.

Kersey, A. D.

H. J. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[CrossRef]

LeBlanc, M.

Lin, G. C.

G. C. Lin, L. Wang, C. C. Yang, M. C. Shih, and T. J. Chuang, IEEE Photon. Technol. Lett. 10, 406 (1998).
[CrossRef]

Liu, C.

C. Cheng and C. Liu, Chemical Building Material Handbook, 1st ed. (Jiangxi Science and Technology Press, Nanchang, China, 1997), pp. 140–143.

Liu, Z.

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

Measures, R. M.

Morey, W. W.

Ohn, M.

Othonos, A.

Patrick, H. J.

H. J. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[CrossRef]

Pedrazzani, J. R.

H. J. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[CrossRef]

Reekie, L.

M. G. Xu, J.-L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[CrossRef]

Rogers, A. J.

Shih, M. C.

G. C. Lin, L. Wang, C. C. Yang, M. C. Shih, and T. J. Chuang, IEEE Photon. Technol. Lett. 10, 406 (1998).
[CrossRef]

Tam, H.

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

Tatam, R. P.

S. W. James, M. L. Dockney, and R. P. Tatam, Electron. Lett. 32, 1133 (1996).
[CrossRef]

Vengsarkar, A. M.

H. J. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[CrossRef]

Wang, L.

G. C. Lin, L. Wang, C. C. Yang, M. C. Shih, and T. J. Chuang, IEEE Photon. Technol. Lett. 10, 406 (1998).
[CrossRef]

Williams, G. M.

H. J. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[CrossRef]

Xu, M. G.

M. G. Xu, J.-L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[CrossRef]

Yang, C. C.

G. C. Lin, L. Wang, C. C. Yang, M. C. Shih, and T. J. Chuang, IEEE Photon. Technol. Lett. 10, 406 (1998).
[CrossRef]

Yu, Y.

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

Electron. Lett.

M. G. Xu, J.-L. Archambault, L. Reekie, and J. P. Dakin, Electron. Lett. 30, 1085 (1994).
[CrossRef]

S. W. James, M. L. Dockney, and R. P. Tatam, Electron. Lett. 32, 1133 (1996).
[CrossRef]

IEEE Photon. Technol. Lett.

H. J. Patrick, G. M. Williams, A. D. Kersey, J. R. Pedrazzani, and A. M. Vengsarkar, IEEE Photon. Technol. Lett. 8, 1223 (1996).
[CrossRef]

G. C. Lin, L. Wang, C. C. Yang, M. C. Shih, and T. J. Chuang, IEEE Photon. Technol. Lett. 10, 406 (1998).
[CrossRef]

Jpn. J. Appl. Phys.

Y. Yu, H. Tam, S. Geng, M. S. Demokan, Z. Liu, and W. Chung, Jpn. J. Appl. Phys. 38, L1032 (1999).
[CrossRef]

Opt. Lett.

Other

C. Cheng and C. Liu, Chemical Building Material Handbook, 1st ed. (Jiangxi Science and Technology Press, Nanchang, China, 1997), pp. 140–143.

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Figures (5)

Fig. 1
Fig. 1

Experimental setup for simultaneous measurement of displacement and temperature: LED, light-emitting diode; OSA, optical spectrum analyzer.

Fig. 2
Fig. 2

Relationship between the difference in wavelength of the two sides and the measured displacement. Dashed curve, experiment; solid curve, theory.

Fig. 3
Fig. 3

Experimental plot of ΔλBr versus ω (b) for T=18 C°.

Fig. 4
Fig. 4

Reflected spectra of the sensing FBG at three temperatures: a, T=0 C°; b, T=18 C°; c, T=35 C°.

Fig. 5
Fig. 5

Relationship between ΔλBr and T for ωb=0 mm. Solid curve, theory; dashed curve, experiment.

Equations (8)

Equations on this page are rendered with MathJax. Learn more.

ϵx=6LFEch2,
ΔλBlλB=26F1-Pea+bEch12+α+ξΔTx<0,
ΔλBrλB=6F1-Pea+bEchr2+α+ξΔTx>0,
F=Ecωb6a+bb2hr3+2abhl3+a2hl3.
ΔλBrlΔλBr=K11K12K21K22ωbΔT,
K11=1-Pe1hr2-1hl2λBb2hr3+2abhl3+a2hl3, K12=0, K21=1-PeλBhr2b2hr3+2abhl3+a2hl3, K22=α+ξλB.
K11K12K21K22=0.094 nm/mm0 nm/°C0.17 nm/mm0.119 nm/°C.
ΔλBrlΔλBr=9.24×10-2 nm/mm0 nm/°C0.169 nm/mm0.113 nm/°C×ωbΔT.

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