Abstract

We apply time–frequency signal-analysis techniques to recover arbitrary distributions of axial strain along a fiber grating from its reflection spectral response. The proposed method permits accurate strain reconstruction with no restrictions on the applied strain profile or on the grating length. We demonstrate the validity and accuracy of the technique by reconstructing the strain field in a fiber grating with a nonmonotonic strain profile, which includes all the following: a constant strain section, high gradient variations, and strain discontinuities.

© 2000 Optical Society of America

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References

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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
  3. M. Volanthen, H. Geiger, M. J. Cole, and J. P. Dakin, Electron. Lett. 32, 1028 (1996).
    [CrossRef]
  4. M. M. Ohn, S. Y. Huang, R. M. Measures, and J. Chwang, Electron. Lett. 33, 1242 (1997).
    [CrossRef]
  5. M. A. Muriel, J. Azaña, and A. Carballar, Opt. Lett. 23, 1526 (1998).
    [CrossRef]
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    [CrossRef] [PubMed]
  7. C. J. Brooks, G. L. Vossler, and K. A. Winick, Appl. Phys. Lett. 66, 2168 (1995).
    [CrossRef]
  8. L. Cohen, Time-Frequency Analysis (Prentice-Hall, Englewood Cliffs, N.J., 1995).

1998 (1)

1997 (1)

M. M. Ohn, S. Y. Huang, R. M. Measures, and J. Chwang, Electron. Lett. 33, 1242 (1997).
[CrossRef]

1996 (3)

1995 (1)

C. J. Brooks, G. L. Vossler, and K. A. Winick, Appl. Phys. Lett. 66, 2168 (1995).
[CrossRef]

1978 (1)

Azaña, J.

Brooks, C. J.

C. J. Brooks, G. L. Vossler, and K. A. Winick, Appl. Phys. Lett. 66, 2168 (1995).
[CrossRef]

Butter, C. D.

Carballar, A.

Chwang, J.

M. M. Ohn, S. Y. Huang, R. M. Measures, and J. Chwang, Electron. Lett. 33, 1242 (1997).
[CrossRef]

Cohen, L.

L. Cohen, Time-Frequency Analysis (Prentice-Hall, Englewood Cliffs, N.J., 1995).

Cole, M. J.

M. Volanthen, H. Geiger, M. J. Cole, and J. P. Dakin, Electron. Lett. 32, 1028 (1996).
[CrossRef]

Dakin, J. P.

M. Volanthen, H. Geiger, M. J. Cole, and J. P. Dakin, Electron. Lett. 32, 1028 (1996).
[CrossRef]

Geiger, H.

M. Volanthen, H. Geiger, M. J. Cole, and J. P. Dakin, Electron. Lett. 32, 1028 (1996).
[CrossRef]

Guemes, A.

Hocker, G. B.

Huang, S.

Huang, S. Y.

M. M. Ohn, S. Y. Huang, R. M. Measures, and J. Chwang, Electron. Lett. 33, 1242 (1997).
[CrossRef]

M. Leblanc, S. Y. Huang, M. Ohn, R. M. Measures, A. Guemes, and A. Othonos, Opt. Lett. 21, 1405 (1996).
[CrossRef] [PubMed]

Leblanc, M.

Measures, R. M.

Muriel, M. A.

Ohn, M.

Ohn, M. M.

M. M. Ohn, S. Y. Huang, R. M. Measures, and J. Chwang, Electron. Lett. 33, 1242 (1997).
[CrossRef]

S. Huang, M. M. Ohn, and R. M. Measures, Appl. Opt. 35, 1135 (1996).
[CrossRef] [PubMed]

Othonos, A.

Volanthen, M.

M. Volanthen, H. Geiger, M. J. Cole, and J. P. Dakin, Electron. Lett. 32, 1028 (1996).
[CrossRef]

Vossler, G. L.

C. J. Brooks, G. L. Vossler, and K. A. Winick, Appl. Phys. Lett. 66, 2168 (1995).
[CrossRef]

Winick, K. A.

C. J. Brooks, G. L. Vossler, and K. A. Winick, Appl. Phys. Lett. 66, 2168 (1995).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. Lett. (1)

C. J. Brooks, G. L. Vossler, and K. A. Winick, Appl. Phys. Lett. 66, 2168 (1995).
[CrossRef]

Electron. Lett. (2)

M. Volanthen, H. Geiger, M. J. Cole, and J. P. Dakin, Electron. Lett. 32, 1028 (1996).
[CrossRef]

M. M. Ohn, S. Y. Huang, R. M. Measures, and J. Chwang, Electron. Lett. 33, 1242 (1997).
[CrossRef]

Opt. Lett. (2)

Other (1)

L. Cohen, Time-Frequency Analysis (Prentice-Hall, Englewood Cliffs, N.J., 1995).

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Figures (4)

Fig. 1
Fig. 1

TF technique for reconstructing the axial strain distribution along a FG length from the field reflection coefficient.

Fig. 2
Fig. 2

Unstrained uniform FG: (a) reflectivity, (b) intensity of the reflection temporal impulse response, (c) joint TF representation (with the WV distribution) of the field reflection coefficient rf. The inset in (c) shows the reconstructed strain distribution along the grating length.

Fig. 3
Fig. 3

FG under nonmonotonic strain distribution: (a) reflectivity, (b) intensity of the reflection temporal impulse response, (c) joint TF representation (with the WVS distribution) of field reflection coefficient rf.

Fig. 4
Fig. 4

Recovered and exact strain distributions along the grating length.

Equations (6)

Equations on this page are rendered with MathJax. Learn more.

zzfB0/fBz-11-n¯02ξ.
WVt,f=-+r*f+12frf-12f×exp-j2πftdf,
SPt,f=SFFTt,f2=-+rfgf-f×expj2πftdf2,
WVSt,f=WVt,f×SPt,f,
f¯t=-+fWVSt,fdf-+WVSt,fdf,
fBz=f¯t=2n¯0zc.

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