Abstract

Scintillation of scattered radiation caused by particulate matter is studied. By use of stochastic theory, expressions for mathematical expectation, variance, and scintillation index are derived. A method of measuring particulate-mass concentration with the scintillation index is proposed. The major advantage of this method is its insensitivity to lens contamination and particle-color change.

© 2000 Optical Society of America

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References

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  1. A. Ishimaru, Wave Propagation and Scattering in Random Media (Academic, New York, 1978).
  2. V. I. Taatarskii, Wave Propagation in a Turbulent Medium (McGraw-Hill, New York, 1961).
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef] [PubMed]
  6. M. H. A. J. Herben, Arch. Elektr. Uebertrag. 37, 339 (1983).
  7. D. Sarma and R. J. Hill, Int. J. Infrared Millim. Waves 12, 997 (1991).
    [CrossRef]
  8. T. Wang and S. F. Clifford, J. Opt. Soc. Am. 65, 147 (1975).
  9. J. A. Hermann, Opt. Laser Technol. 28, 603 (1996).
    [CrossRef]
  10. W. Averdiack, Environ. Eng. 7, 27 (1994).
  11. B. Bahar, Am. Ceram. Soc. Bull. 73, 64 (1994).
  12. A. Chen, J. Hao, Z. Zhou, and J. Zu, Opt. Commun. 166, 15 (1999).
    [CrossRef]

1999

A. Chen, J. Hao, Z. Zhou, and J. Zu, Opt. Commun. 166, 15 (1999).
[CrossRef]

1996

J. A. Hermann, Opt. Laser Technol. 28, 603 (1996).
[CrossRef]

1994

W. Averdiack, Environ. Eng. 7, 27 (1994).

B. Bahar, Am. Ceram. Soc. Bull. 73, 64 (1994).

P. A. Lightsey, Opt. Eng. 33, 2535 (1994).
[CrossRef]

1991

D. Sarma and R. J. Hill, Int. J. Infrared Millim. Waves 12, 997 (1991).
[CrossRef]

1988

1983

M. H. A. J. Herben, Arch. Elektr. Uebertrag. 37, 339 (1983).

1975

T. Wang and S. F. Clifford, J. Opt. Soc. Am. 65, 147 (1975).

Averdiack, W.

W. Averdiack, Environ. Eng. 7, 27 (1994).

Bahar, B.

B. Bahar, Am. Ceram. Soc. Bull. 73, 64 (1994).

Borovoy, A. G.

Chen, A.

A. Chen, J. Hao, Z. Zhou, and J. Zu, Opt. Commun. 166, 15 (1999).
[CrossRef]

Clifford, S. F.

T. Wang and S. F. Clifford, J. Opt. Soc. Am. 65, 147 (1975).

Hao, J.

A. Chen, J. Hao, Z. Zhou, and J. Zu, Opt. Commun. 166, 15 (1999).
[CrossRef]

Herben, M. H. A. J.

M. H. A. J. Herben, Arch. Elektr. Uebertrag. 37, 339 (1983).

Hermann, J. A.

J. A. Hermann, Opt. Laser Technol. 28, 603 (1996).
[CrossRef]

Hill, R. J.

D. Sarma and R. J. Hill, Int. J. Infrared Millim. Waves 12, 997 (1991).
[CrossRef]

Ishimaru, A.

A. Ishimaru, Wave Propagation and Scattering in Random Media (Academic, New York, 1978).

Kabanov, M. V.

Lightsey, P. A.

P. A. Lightsey, Opt. Eng. 33, 2535 (1994).
[CrossRef]

Patrushev, G. Ya

Petrov, A. I.

Sarma, D.

D. Sarma and R. J. Hill, Int. J. Infrared Millim. Waves 12, 997 (1991).
[CrossRef]

Taatarskii, V. I.

V. I. Taatarskii, Wave Propagation in a Turbulent Medium (McGraw-Hill, New York, 1961).

Tsvyk, R. Sh.

Wang, T.

T. Wang and S. F. Clifford, J. Opt. Soc. Am. 65, 147 (1975).

Zhou, Z.

A. Chen, J. Hao, Z. Zhou, and J. Zu, Opt. Commun. 166, 15 (1999).
[CrossRef]

Zhukov, A. F.

Zu, J.

A. Chen, J. Hao, Z. Zhou, and J. Zu, Opt. Commun. 166, 15 (1999).
[CrossRef]

Am. Ceram. Soc. Bull.

B. Bahar, Am. Ceram. Soc. Bull. 73, 64 (1994).

Appl. Opt.

Arch. Elektr. Uebertrag.

M. H. A. J. Herben, Arch. Elektr. Uebertrag. 37, 339 (1983).

Environ. Eng.

W. Averdiack, Environ. Eng. 7, 27 (1994).

Int. J. Infrared Millim. Waves

D. Sarma and R. J. Hill, Int. J. Infrared Millim. Waves 12, 997 (1991).
[CrossRef]

J. Opt. Soc. Am.

T. Wang and S. F. Clifford, J. Opt. Soc. Am. 65, 147 (1975).

Opt. Commun.

A. Chen, J. Hao, Z. Zhou, and J. Zu, Opt. Commun. 166, 15 (1999).
[CrossRef]

Opt. Eng.

P. A. Lightsey, Opt. Eng. 33, 2535 (1994).
[CrossRef]

Opt. Laser Technol.

J. A. Hermann, Opt. Laser Technol. 28, 603 (1996).
[CrossRef]

Other

A. Ishimaru, Wave Propagation and Scattering in Random Media (Academic, New York, 1978).

V. I. Taatarskii, Wave Propagation in a Turbulent Medium (McGraw-Hill, New York, 1961).

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Figures (2)

Fig. 1
Fig. 1

Scattered-radiation detection.

Fig. 2
Fig. 2

Simulated detector output.

Tables (1)

Tables Icon

Table 1 Particle-Size Distribution by Weight Percent Measured in a Stack Airflow

Equations (14)

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Pk=μkk! exp-μ,
Iw0S0+S1++Sk-1,
ϕ=Iηw0Ti=0kSi=βIi=0kSi,
pS0,S1,,Sk-1;k=pS0pSk-1Pk,
Eϕ=-+ϕpϕdϕ=k=0+Sk-1S0ϕpS0,S1,,Sk-1;k×dS0dS1dSk-1=k=0+Sk-1S0Iβk=0+Si×pS0pS1pSk-1Pk×dS0dS1dSk-1=k=0+PkSk-1S0Iβk=0+SipSi×dS0dSk-1=k=0+IβPkk=0+Si=0SipSidSi=k=0+Iβkmμkk! exp-μ=Iβmμ exp-μk=1+μk-1k-1!=Iβmμ=IβVNm,
Dϕ=Eϕ2-Eϕ2.
ϕ2=I2β2i=0j=0k-1SiSj,
Eϕ2=-+ϕ2pϕdϕ=I2β2i=0j=0k-1SiSj×pS0,S1,,Sk-1;k×dS0dS1dSk-1dk=I2β2k=0i=0k-1Si=0Si2pSidSi+i=0j=0ijk-1Si=0Sj=0SiSjpSipSjdSidSjPk=I2β2k=0kσ2+m2+kk-1m2Pk=I2β2k=1σ2+m2μμk-1k-1! exp-μ+I2β2k=2m2μ2μk-2k-2! exp-μ=I2β2μσ2+m2+I2β2m2μ2,
Dϕ=I2β2μσ2+m2+I2β2m2μ2-Eϕ2=I2β2μσ2+m2=I2β2VNσ2+m2.
Eϕ2Dϕ=m2m2+σ2μ=m2m2+σ2VN
N=1V1+σ2m2Eϕ2Dϕ.
μ=NV=C/wV,
C=w¯V1+σ2m2Eϕ2Dϕ=KEϕ2Dϕ,
K=w¯V1+σ2m2.

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