Abstract

We demonstrate a new kind of picosecond laser source in the UV at a high repetition rate of -45 kHz, using only passive, compact, and simple elements. This system is based on a microchip laser and a very efficient multipass amplifier, both pumped with recently developed high-brightness laser diodes. The system has been optimized to deliver, at a high repetition rate, subnanosecond pulses at the wavelength 355  nm with an energy per pulse of close to 1 μJ (38-mW average power). This source is to our knowledge the first totally passive 300-ps UV laser source at this high repetition rate.

© 1999 Optical Society of America

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References

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1996 (1)

M. Tsunekane, N. Taguchi, and H. Inaba, Electron. Lett. 32, 40 (1996).
[CrossRef]

1995 (2)

C. Larat, M. Schwarz, J. P. Pocholle, G. Feugnet, and M. R. Rapuchon, Proc. SPIE 2381, 256 (1995).
[CrossRef]

J. J. Degnan, IEEE J. Quantum Electron. 31, 1890 (1995).
[CrossRef]

1993 (1)

1992 (2)

1991 (3)

A. E. Siegman, IEEE J. Quantum Electron. 27, 1146 (1991).
[CrossRef]

F. Salin, J. Squier, G. Mourou, and G. Vailancourt, Opt. Lett. 16, 1964 (1991).
[CrossRef] [PubMed]

J. J. Zayhowski and P. L. Kelley, IEEE J. Quantum Electron. 27, 2220 (1991).
[CrossRef]

1965 (1)

A. Szabo and R. A. Stein, J. Appl. Phys. 36, 1562 (1965).
[CrossRef]

Chen, Y. C.

Degnan, J. J.

J. J. Degnan, IEEE J. Quantum Electron. 31, 1890 (1995).
[CrossRef]

Dill, C.

Ferrand, B.

L. Fulbert, J. Marty, B. Ferrand, and E. Molva, in Conference on Lasers and Electro-Optics, Vol. 15 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1995), p. 176.

Feugnet, G.

C. Larat, M. Schwarz, J. P. Pocholle, G. Feugnet, and M. R. Rapuchon, Proc. SPIE 2381, 256 (1995).
[CrossRef]

Fulbert, L.

L. Fulbert, J. Marty, B. Ferrand, and E. Molva, in Conference on Lasers and Electro-Optics, Vol. 15 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1995), p. 176.

Inaba, H.

M. Tsunekane, N. Taguchi, and H. Inaba, Electron. Lett. 32, 40 (1996).
[CrossRef]

Kelley, P. L.

J. J. Zayhowski and P. L. Kelley, IEEE J. Quantum Electron. 27, 2220 (1991).
[CrossRef]

Larat, C.

C. Larat, M. Schwarz, J. P. Pocholle, G. Feugnet, and M. R. Rapuchon, Proc. SPIE 2381, 256 (1995).
[CrossRef]

Lee, K. K.

Li, S.

Marty, J.

L. Fulbert, J. Marty, B. Ferrand, and E. Molva, in Conference on Lasers and Electro-Optics, Vol. 15 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1995), p. 176.

Molva, E.

L. Fulbert, J. Marty, B. Ferrand, and E. Molva, in Conference on Lasers and Electro-Optics, Vol. 15 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1995), p. 176.

Mourou, G.

Norris, T. B.

Pocholle, J. P.

C. Larat, M. Schwarz, J. P. Pocholle, G. Feugnet, and M. R. Rapuchon, Proc. SPIE 2381, 256 (1995).
[CrossRef]

Rapuchon, M. R.

C. Larat, M. Schwarz, J. P. Pocholle, G. Feugnet, and M. R. Rapuchon, Proc. SPIE 2381, 256 (1995).
[CrossRef]

Salin, F.

Schwarz, M.

C. Larat, M. Schwarz, J. P. Pocholle, G. Feugnet, and M. R. Rapuchon, Proc. SPIE 2381, 256 (1995).
[CrossRef]

Siegman, A. E.

A. E. Siegman, IEEE J. Quantum Electron. 27, 1146 (1991).
[CrossRef]

Squier, J.

Stein, R. A.

A. Szabo and R. A. Stein, J. Appl. Phys. 36, 1562 (1965).
[CrossRef]

Szabo, A.

A. Szabo and R. A. Stein, J. Appl. Phys. 36, 1562 (1965).
[CrossRef]

Taguchi, N.

M. Tsunekane, N. Taguchi, and H. Inaba, Electron. Lett. 32, 40 (1996).
[CrossRef]

Tsunekane, M.

M. Tsunekane, N. Taguchi, and H. Inaba, Electron. Lett. 32, 40 (1996).
[CrossRef]

Vailancourt, G.

Zayhowski, J. J.

J. J. Zayhowski and C. Dill, Opt. Lett. 17, 1201 (1992)Opt. Lett. 19, 1427 (1994).
[CrossRef] [PubMed]

J. J. Zayhowski and P. L. Kelley, IEEE J. Quantum Electron. 27, 2220 (1991).
[CrossRef]

J. J. Zayhowski, in Conference on Lasers and Electro-Optics, Vol. 9 of 1996 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1996), p. 236.

Zhou, S.

Electron. Lett. (1)

M. Tsunekane, N. Taguchi, and H. Inaba, Electron. Lett. 32, 40 (1996).
[CrossRef]

IEEE J. Quantum Electron. (3)

J. J. Zayhowski and P. L. Kelley, IEEE J. Quantum Electron. 27, 2220 (1991).
[CrossRef]

J. J. Degnan, IEEE J. Quantum Electron. 31, 1890 (1995).
[CrossRef]

A. E. Siegman, IEEE J. Quantum Electron. 27, 1146 (1991).
[CrossRef]

J. Appl. Phys. (1)

A. Szabo and R. A. Stein, J. Appl. Phys. 36, 1562 (1965).
[CrossRef]

Opt. Lett. (4)

Proc. SPIE (1)

C. Larat, M. Schwarz, J. P. Pocholle, G. Feugnet, and M. R. Rapuchon, Proc. SPIE 2381, 256 (1995).
[CrossRef]

Other (2)

J. J. Zayhowski, in Conference on Lasers and Electro-Optics, Vol. 9 of 1996 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1996), p. 236.

L. Fulbert, J. Marty, B. Ferrand, and E. Molva, in Conference on Lasers and Electro-Optics, Vol. 15 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1995), p. 176.

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Figures (3)

Fig. 1
Fig. 1

Repetition rate versus pumping-system brightness.

Fig. 2
Fig. 2

Experimental setup (see text).

Fig. 3
Fig. 3

Output power of the source for the fundamental and the harmonic waves.

Tables (1)

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Table 1 Influence of the Pump System Brightness on Microlaser Performance

Equations (1)

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Prf=CζPp/M2,

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