Abstract

A gas filter correlation (GFC) instrument for air monitoring at submillimeter wavelengths has been developed. We used a high-power terahertz radiation source in combination with a specific gas filter cell to obtain a highly selective instrument to differentiate species present in an unknown mixture. This approach provides a new method for survey measurements in the spectrum from 100 to 1000??GHz, in which many molecular rotational lines appear. Basic operational considerations and preliminary experiments with hydrogen sulfide are described.

© 1999 Optical Society of America

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  1. P. L. Hanst and S. T. Hanst, in Air Monitoring by Spectroscopy Techniques, M. W. Sigrist, ed. (Wiley, New York, 1997), p. 455.
  2. R. Goody, J. Opt. Soc. Am. 5, 900 (1968).
    [CrossRef]
  3. H. S. Lee, H. H. Zwick, and S. M. Till, Rev. Sci. Instrum. 59, 1812 (1985).
    [CrossRef]
  4. J. Sandsten, H. Edner, and S. Svanberg, Opt. Lett. 21, 1945 (1996).
    [CrossRef] [PubMed]
  5. D. M. Mittleman, R. H. Jacobsen, and M. C. Nuss, IEEE J. Sel. Topics Quantum Electron. 2, 679 (1996).
    [CrossRef]
  6. S. E. Ralph and D. Grischkowsky, Appl. Phys. Lett. 60, 1070 (1992).
    [CrossRef]
  7. R. A. Cheville and D. Grischkowsky, Opt. Lett. 20, 1646 (1995).
    [CrossRef] [PubMed]
  8. M. van Exter, C. Fattinger, and D. Grischkowsky, Opt. Lett. 14, 1128 (1989).
    [CrossRef]
  9. D. Grischkowsky, in Frontiers in Nonlinear Optics, H. Walther, N. Koroteev, and M. O. Scully, eds. (Institute of Physics, Philadelphia, Pa., 1993), pp. 196–227.
  10. R. H. Jacobsen, D. M. Mittleman, and M. C. Nuss, Opt. Lett. 21, 2011 (1996).
    [CrossRef] [PubMed]
  11. G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
    [CrossRef]
  12. P. F. Goldsmith, Proc. IEEE 80, 1729 (1989).
    [CrossRef]
  13. N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
    [CrossRef]

1998 (1)

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

1996 (4)

N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
[CrossRef]

D. M. Mittleman, R. H. Jacobsen, and M. C. Nuss, IEEE J. Sel. Topics Quantum Electron. 2, 679 (1996).
[CrossRef]

J. Sandsten, H. Edner, and S. Svanberg, Opt. Lett. 21, 1945 (1996).
[CrossRef] [PubMed]

R. H. Jacobsen, D. M. Mittleman, and M. C. Nuss, Opt. Lett. 21, 2011 (1996).
[CrossRef] [PubMed]

1995 (1)

1992 (1)

S. E. Ralph and D. Grischkowsky, Appl. Phys. Lett. 60, 1070 (1992).
[CrossRef]

1989 (2)

1985 (1)

H. S. Lee, H. H. Zwick, and S. M. Till, Rev. Sci. Instrum. 59, 1812 (1985).
[CrossRef]

1968 (1)

R. Goody, J. Opt. Soc. Am. 5, 900 (1968).
[CrossRef]

Bakhtiari, S.

N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
[CrossRef]

Bocquet, R.

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Boucher, D.

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Chen, W.

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Cheville, R. A.

DeLucia, F. D.

N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
[CrossRef]

Dieckman, S. L.

N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
[CrossRef]

Edner, H.

Fattinger, C.

Goldsmith, P. F.

P. F. Goldsmith, Proc. IEEE 80, 1729 (1989).
[CrossRef]

Goody, R.

R. Goody, J. Opt. Soc. Am. 5, 900 (1968).
[CrossRef]

Gopalsami, N.

N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
[CrossRef]

Grischkowsky, D.

R. A. Cheville and D. Grischkowsky, Opt. Lett. 20, 1646 (1995).
[CrossRef] [PubMed]

S. E. Ralph and D. Grischkowsky, Appl. Phys. Lett. 60, 1070 (1992).
[CrossRef]

M. van Exter, C. Fattinger, and D. Grischkowsky, Opt. Lett. 14, 1128 (1989).
[CrossRef]

D. Grischkowsky, in Frontiers in Nonlinear Optics, H. Walther, N. Koroteev, and M. O. Scully, eds. (Institute of Physics, Philadelphia, Pa., 1993), pp. 196–227.

Hanst, P. L.

P. L. Hanst and S. T. Hanst, in Air Monitoring by Spectroscopy Techniques, M. W. Sigrist, ed. (Wiley, New York, 1997), p. 455.

Hanst, S. T.

P. L. Hanst and S. T. Hanst, in Air Monitoring by Spectroscopy Techniques, M. W. Sigrist, ed. (Wiley, New York, 1997), p. 455.

Jacobsen, R. H.

D. M. Mittleman, R. H. Jacobsen, and M. C. Nuss, IEEE J. Sel. Topics Quantum Electron. 2, 679 (1996).
[CrossRef]

R. H. Jacobsen, D. M. Mittleman, and M. C. Nuss, Opt. Lett. 21, 2011 (1996).
[CrossRef] [PubMed]

Lee, H. S.

H. S. Lee, H. H. Zwick, and S. M. Till, Rev. Sci. Instrum. 59, 1812 (1985).
[CrossRef]

Lippens, D.

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Mittleman, D. M.

D. M. Mittleman, R. H. Jacobsen, and M. C. Nuss, IEEE J. Sel. Topics Quantum Electron. 2, 679 (1996).
[CrossRef]

R. H. Jacobsen, D. M. Mittleman, and M. C. Nuss, Opt. Lett. 21, 2011 (1996).
[CrossRef] [PubMed]

Mounaix, P.

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Mouret, G.

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Nuss, M. C.

D. M. Mittleman, R. H. Jacobsen, and M. C. Nuss, IEEE J. Sel. Topics Quantum Electron. 2, 679 (1996).
[CrossRef]

R. H. Jacobsen, D. M. Mittleman, and M. C. Nuss, Opt. Lett. 21, 2011 (1996).
[CrossRef] [PubMed]

Ralph, S. E.

S. E. Ralph and D. Grischkowsky, Appl. Phys. Lett. 60, 1070 (1992).
[CrossRef]

Raptis, A. C.

N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
[CrossRef]

Sandsten, J.

Svanberg, S.

Théron, D.

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Till, S. M.

H. S. Lee, H. H. Zwick, and S. M. Till, Rev. Sci. Instrum. 59, 1812 (1985).
[CrossRef]

van Exter, M.

Zwick, H. H.

H. S. Lee, H. H. Zwick, and S. M. Till, Rev. Sci. Instrum. 59, 1812 (1985).
[CrossRef]

Appl. Phys. Lett. (1)

S. E. Ralph and D. Grischkowsky, Appl. Phys. Lett. 60, 1070 (1992).
[CrossRef]

IEEE J. Sel. Topics Quantum Electron. (1)

D. M. Mittleman, R. H. Jacobsen, and M. C. Nuss, IEEE J. Sel. Topics Quantum Electron. 2, 679 (1996).
[CrossRef]

IEEE Trans. Instrum. Meas. (1)

N. Gopalsami, S. Bakhtiari, A. C. Raptis, S. L. Dieckman, and F. D. DeLucia, IEEE Trans. Instrum. Meas. 45, 225 (1996).
[CrossRef]

J. Opt. Soc. Am. (1)

R. Goody, J. Opt. Soc. Am. 5, 900 (1968).
[CrossRef]

Microwave Opt. Technol. Lett. (1)

G. Mouret, W. Chen, D. Boucher, R. Bocquet, P. Mounaix, D. Théron, and D. Lippens, Microwave Opt. Technol. Lett. 17, 23 (1998).
[CrossRef]

Opt. Lett. (4)

Proc. IEEE (1)

P. F. Goldsmith, Proc. IEEE 80, 1729 (1989).
[CrossRef]

Rev. Sci. Instrum. (1)

H. S. Lee, H. H. Zwick, and S. M. Till, Rev. Sci. Instrum. 59, 1812 (1985).
[CrossRef]

Other (2)

P. L. Hanst and S. T. Hanst, in Air Monitoring by Spectroscopy Techniques, M. W. Sigrist, ed. (Wiley, New York, 1997), p. 455.

D. Grischkowsky, in Frontiers in Nonlinear Optics, H. Walther, N. Koroteev, and M. O. Scully, eds. (Institute of Physics, Philadelphia, Pa., 1993), pp. 196–227.

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