Abstract

We propose and demonstrate a novel method for recording second-harmonic volume index gratings in photorefractive crystals. The fundamental component of the index grating is eliminated by means of a π-phase shifted double-exposure process that uses the Mach–Zehnder interferometric technique. Experimental results for K0.5Na0.50.2Sr0.75Ba0.250.9Nb2O6 crystals are presented and discussed.

© 1999 Optical Society of America

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