Abstract

We show that a continuous-wave laser beam at an infrared wavelength of 800  nm can be used for two-photon three-dimensional bit data storage in a photobleaching polymer. We successfully demonstrate recording and reading of six layers of data bits with a transverse bit separation of 4.3 μm and an axial layer separation of 20 μm. This result leads to a three-dimensional bit density of approximately 3 Gbits/cm3.

© 1999 Optical Society of America

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1998 (4)

1997 (1)

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

1996 (1)

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

1994 (1)

P. Hänninen, E. Soni, and S. Hell, J. Microsc. 176, 222 (1994).
[CrossRef]

1991 (1)

1990 (1)

D. A. Parthenopoulos and P. M. Rentzepis, J. Appl. Phys. 68, 5814 (1990).
[CrossRef]

1989 (1)

D. A. Parthenopoulos and P. M. Rentzepis, Science 245, 843 (1989).
[CrossRef] [PubMed]

Arndt-Jovin, D.

Bhawalkar, J.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Booth, M.

Cheng, P. C.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Day, D.

Gu, M.

Hänninen, P.

P. Hänninen, E. Soni, and S. Hell, J. Microsc. 176, 222 (1994).
[CrossRef]

He, G.

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Hell, S.

Ishitobi, H.

Jovin, T.

Kawata, S.

Kawata, Y.

Kirsch, A.

Kumar, N. D.

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Liou, W.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Pan, S.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Park, M.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

Parthenopoulos, D. A.

D. A. Parthenopoulos and P. M. Rentzepis, J. Appl. Phys. 68, 5814 (1990).
[CrossRef]

D. A. Parthenopoulos and P. M. Rentzepis, Science 245, 843 (1989).
[CrossRef] [PubMed]

Prasad, P. N.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Rentzepis, P. M.

D. A. Parthenopoulos and P. M. Rentzepis, J. Appl. Phys. 68, 5814 (1990).
[CrossRef]

D. A. Parthenopoulos and P. M. Rentzepis, Science 245, 843 (1989).
[CrossRef] [PubMed]

Ruland, G. E.

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Samarabandu, J.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Schnetter, C.

Shih, A.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

Soni, E.

P. Hänninen, E. Soni, and S. Hell, J. Microsc. 176, 222 (1994).
[CrossRef]

Strickler, J. H.

Swiatakiewicz, J.

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Swiatkiewicz, J.

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

Toriumi, A.

Webb, W. W.

Wilms, S.

Appl. Opt. (1)

J. Appl. Phys. (1)

D. A. Parthenopoulos and P. M. Rentzepis, J. Appl. Phys. 68, 5814 (1990).
[CrossRef]

J. Microsc. (1)

P. Hänninen, E. Soni, and S. Hell, J. Microsc. 176, 222 (1994).
[CrossRef]

Opt. Lett. (4)

Scanning (2)

S. Pan, A. Shih, W. Liou, M. Park, J. Bhawalkar, J. Swiatkiewicz, J. Samarabandu, P. N. Prasad, and P. C. Cheng, Scanning 19, 156 (1997).

P. C. Cheng, J. Bhawalkar, S. Pan, J. Swiatakiewicz, J. Samarabandu, W. Liou, G. He, G. E. Ruland, N. D. Kumar, and P. N. Prasad, Scanning 18, 129 (1996).

Science (1)

D. A. Parthenopoulos and P. M. Rentzepis, Science 245, 843 (1989).
[CrossRef] [PubMed]

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Figures (4)

Fig. 1
Fig. 1

Schematic diagram of the two-photon fluorescence microscope used to record and read 3-D data bits in a photobleaching polymer.

Fig. 2
Fig. 2

Two-photon fluorescence intensity from the photobleaching polymer as a function of the incident intensity under cw (squares) and ultrashort pulsed (diamonds) illumination.

Fig. 3
Fig. 3

Two-photon bleached data bits recorded in the photobleaching under (a) cw and (b) ultrashort pulsed illumination. The bit separation is 4.3 μm.

Fig. 4
Fig. 4

Two-photon bleached data bits recorded at different depths in the photobleaching polymer under cw illumination. The spacing between adjacent layers is 20 μm, and the transverse bit separation is 4.3 μm. (a) The second layer, including the letter B; (b) the third layer, including the letter C; (c) the fifth layer, including the letter E; (d) the sixth layer, including the letter F.

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