Abstract

A microscopic fluorescence imaging system is used to detect optically active centers located inside a transparent dielectric crystal. Defect centers in the bulk of KH2PO4 crystals are imaged based on their near-infrared emission following photoexcitation. The spatial resolution of the system is 1 μm in the image plane and 25 μm in depth. The experimental results indicate the presence of a large number of optically active defect clusters in different KH2PO4 crystals, whereas the concentration of these clusters depends on the crystal sector and growth method.

© 1999 Optical Society of America

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