Abstract

A hybrid micro–macro-optical shuffle interconnection approach is described. The new concept minimizes distortion in multichip smart-pixel shuffle interconnection systems that use macro-optics to link dense arrays of vertical-cavity surface-emitting laser (VCSEL) sources and matching arrays of detectors. The typical narrow-beam cones of VCSEL’s are exploited by use of beam-deflecting micro-optics to create an optical system that is symmetric about its aperture. Since symmetric systems are well known to cancel distortion, this novel concept provides the means to achieve the required high degree of interchip registration accuracy.

© 1999 Optical Society of America

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References

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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]

1998 (2)

M. W. Haney and M. P. Christensen, Appl. Opt. 37, 2879 (1998).
[CrossRef]

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

1996 (1)

1993 (1)

Bounnak, S.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Buchdahl, H. A.

H. A. Buchdahl, An Introduction to Hamiltonian Optics (Cambridge University, Cambridge, England, 1970).

Chandramani, P.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Christensen, M. P.

M. W. Haney and M. P. Christensen, Appl. Opt. 37, 2879 (1998).
[CrossRef]

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Ekman, J.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Fukushima, S.

Haney, M. W.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

M. W. Haney and M. P. Christensen, Appl. Opt. 37, 2879 (1998).
[CrossRef]

M. W. Haney, Opt. Lett. 18, 2047 (1993).
[CrossRef]

Hibbs-Brener, M. K.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Kalweit, E.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Kiamilev, F. E.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Kingslake, R.

R. Kingslake, Lens Design Fundamentals (Academic, San Diego, Calif., 1978).

Kurokawa, T.

Liu, Y.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Marta, T.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Matsuo, S.

Milojkovic, P.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Nakahara, T.

Nohava, J.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Rozier, R. G.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Smith, T.

T. Smith, Trans. Opt. Soc. 23, 139 (1921/1922).

Steward, G. C.

G. C. Steward, The Symmetrical Optical System (Cambridge University, Cambridge, England, 1928).

Walterson, B.

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Appl. Opt. (2)

Opt. Lett. (1)

Proc. SPIE (1)

M. W. Haney, M. P. Christensen, P. Milojkovic, J. Ekman, P. Chandramani, R. G. Rozier, F. E. Kiamilev, Y. Liu, M. K. Hibbs-Brener, J. Nohava, E. Kalweit, S. Bounnak, T. Marta, and B. Walterson, Proc. SPIE 3288, 194 (1998).
[CrossRef]

Trans. Opt. Soc. (1)

T. Smith, Trans. Opt. Soc. 23, 139 (1921/1922).

Other (3)

G. C. Steward, The Symmetrical Optical System (Cambridge University, Cambridge, England, 1928).

R. Kingslake, Lens Design Fundamentals (Academic, San Diego, Calif., 1978).

H. A. Buchdahl, An Introduction to Hamiltonian Optics (Cambridge University, Cambridge, England, 1970).

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Figures (6)

Fig. 1
Fig. 1

Schematic side view of global optical shuffle interconnection. There is one lens over each chip. Each chip communicates with every chip in the receiving array. The system can be folded along the dotted line to facilitate packaging and alignment.3

Fig. 2
Fig. 2

VCSEL beams as they pass through the on-axis interconnection system. The VCSEL planes are on the left, and the detector planes are on the right. (a) telecentric interconnection system, (b) symmetric interconnection system, (c) symmetric interconnect system with auxilliary microbeam deflection elements.

Fig. 3
Fig. 3

Geometry for deflection-angle calculation.

Fig. 4
Fig. 4

A collection of deflecting prisms or gratings forms a discrete negative lens.

Fig. 5
Fig. 5

Multichip off-axis interconnection with VCSEL beam deflection to effect a central system aperture.

Fig. 6
Fig. 6

Geometry for off-axis analysis.

Equations (9)

Equations on this page are rendered with MathJax. Learn more.

tanθ=xf=2xLf#Nf,
tanϕ=Δxd=xL-xf.
ϕ=arctanxfN2f#-1.
feff=fN/2f#-1.
tanθ1=xcf=2xofff#Nf,
tanθ2=xc+xf=2xoff+xLf#Nf,
tanϕ=Δxd=xL-x-xcf.
ϕ=arctan1fNx2f#-x-xc.
Δxx=dfN2f#-1.

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