Abstract

We propose and experimentally demonstrate a simple digital holographic method that allows reconstruction of three-dimensional object images with a narrow depth of focus or axial resolution. A number of holograms are optically generated by use of different wavelengths spaced at regular intervals. The holograms are recorded on a digital camera and reconstructed numerically. Multiwavelength interference of the holograms results in images of the contour plane whose thickness can be made arbitrarily narrow. Objects at different distances from the hologram plane are imaged clearly and independently, with complete suppression of the out-of-focus images. The technique is available only in digital holography and should have useful applications in holographic microscopy.

© 1999 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  4. U. Schnars and W. P. O. Jüptner, Laser Optoelektron. 26, 40 (1994) [in German]; U. Schnars, M. Thomas, and W. P. Jüptner, Opt. Eng. 35, 977 (1996).
    [CrossRef]
  5. T. M. Kreis, M. Adams, and W. P. O. Jüptner, Proc. SPIE 3096, 224 (1997).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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1999 (1)

1998 (5)

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. I. Dimitrov, and E. Wenger, Opt. Lasers Eng. 29, 361 (1998).
[CrossRef]

H. G. Yang, C. Y. Ryu, and E. S. Kim, J. Korea Inst. Electron. Eng. D 35, 76 (1998) [in Korean]; H. Yang, K. T. Kim, J. H. Kim, and E. S. Kim, Proc. SPIE 3389, 169 (1998).
[CrossRef]

S. Seebacher, W. Osten, and W. Jüptner, Proc. SPIE 3479, 104 (1998); T. M. Kreis, W. P. O. Jeuptner, and J. Geldmacher, Proc. SPIE 3407, 169 (1998).
[CrossRef]

G. C. Brown and R. J. Pryputniewicz, Opt. Eng. 37, 1398 (1998).
[CrossRef]

T. Zhang and I. Yamaguchi, Opt. Lett. 23, 1221 (1998).
[CrossRef]

1997 (1)

T. M. Kreis, M. Adams, and W. P. O. Jüptner, Proc. SPIE 3096, 224 (1997).
[CrossRef]

1996 (1)

S. Trester, Am. J. Phys. 64, 472 (1996).
[CrossRef]

1995 (3)

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

T. C. Poon, K. B. Doh, and B. W. Schilling, Opt. Eng. 34, 1338 (1995).?This paper presents a novel method of depth measurement by use of a time-dependent Fresnel zone pattern.
[CrossRef]

S. C. W. Hyde, N. P. Barry, R. Jones, J. C. Dainty, and P. M. W. French, Opt. Lett. 20, 2330 (1995); T. C. Poon, K. B. Doh, and B. W. Schilling, Opt. Eng. 34, 1338 (1995).
[CrossRef]

1994 (1)

U. Schnars and W. P. O. Jüptner, Laser Optoelektron. 26, 40 (1994) [in German]; U. Schnars, M. Thomas, and W. P. Jüptner, Opt. Eng. 35, 977 (1996).
[CrossRef]

1992 (1)

Adams, M.

T. M. Kreis, M. Adams, and W. P. O. Jüptner, Proc. SPIE 3096, 224 (1997).
[CrossRef]

Barry, N. P.

Bevilacqua, F.

Brown, G. C.

G. C. Brown and R. J. Pryputniewicz, Opt. Eng. 37, 1398 (1998).
[CrossRef]

Cuche, E.

Dainty, J. C.

Depeursinge, C.

Dimitrov, L. I.

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. I. Dimitrov, and E. Wenger, Opt. Lasers Eng. 29, 361 (1998).
[CrossRef]

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

Doh, K. B.

T. C. Poon, K. B. Doh, and B. W. Schilling, Opt. Eng. 34, 1338 (1995).?This paper presents a novel method of depth measurement by use of a time-dependent Fresnel zone pattern.
[CrossRef]

French, P. M. W.

Hariharan, P.

P. Hariharan, Optical Holography (Cambridge U. Press, Cambridge, 1996).
[CrossRef]

Hyde, S. C. W.

Jones, R.

Jüptner, W.

S. Seebacher, W. Osten, and W. Jüptner, Proc. SPIE 3479, 104 (1998); T. M. Kreis, W. P. O. Jeuptner, and J. Geldmacher, Proc. SPIE 3407, 169 (1998).
[CrossRef]

Jüptner, W. P. O.

T. M. Kreis, M. Adams, and W. P. O. Jüptner, Proc. SPIE 3096, 224 (1997).
[CrossRef]

U. Schnars and W. P. O. Jüptner, Laser Optoelektron. 26, 40 (1994) [in German]; U. Schnars, M. Thomas, and W. P. Jüptner, Opt. Eng. 35, 977 (1996).
[CrossRef]

Karnaukhov, V. N.

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. I. Dimitrov, and E. Wenger, Opt. Lasers Eng. 29, 361 (1998).
[CrossRef]

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

Kim, E. S.

H. G. Yang, C. Y. Ryu, and E. S. Kim, J. Korea Inst. Electron. Eng. D 35, 76 (1998) [in Korean]; H. Yang, K. T. Kim, J. H. Kim, and E. S. Kim, Proc. SPIE 3389, 169 (1998).
[CrossRef]

Kreis, T. M.

T. M. Kreis, M. Adams, and W. P. O. Jüptner, Proc. SPIE 3096, 224 (1997).
[CrossRef]

Marron, J. C.

Merzlyakov, N. S.

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. I. Dimitrov, and E. Wenger, Opt. Lasers Eng. 29, 361 (1998).
[CrossRef]

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

Mozerov, M. G.

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. I. Dimitrov, and E. Wenger, Opt. Lasers Eng. 29, 361 (1998).
[CrossRef]

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

Osten, W.

S. Seebacher, W. Osten, and W. Jüptner, Proc. SPIE 3479, 104 (1998); T. M. Kreis, W. P. O. Jeuptner, and J. Geldmacher, Proc. SPIE 3407, 169 (1998).
[CrossRef]

Poon, T. C.

T. C. Poon, K. B. Doh, and B. W. Schilling, Opt. Eng. 34, 1338 (1995).?This paper presents a novel method of depth measurement by use of a time-dependent Fresnel zone pattern.
[CrossRef]

Pryputniewicz, R. J.

G. C. Brown and R. J. Pryputniewicz, Opt. Eng. 37, 1398 (1998).
[CrossRef]

Ryu, C. Y.

H. G. Yang, C. Y. Ryu, and E. S. Kim, J. Korea Inst. Electron. Eng. D 35, 76 (1998) [in Korean]; H. Yang, K. T. Kim, J. H. Kim, and E. S. Kim, Proc. SPIE 3389, 169 (1998).
[CrossRef]

Schilling, B. W.

T. C. Poon, K. B. Doh, and B. W. Schilling, Opt. Eng. 34, 1338 (1995).?This paper presents a novel method of depth measurement by use of a time-dependent Fresnel zone pattern.
[CrossRef]

Schnars, U.

U. Schnars and W. P. O. Jüptner, Laser Optoelektron. 26, 40 (1994) [in German]; U. Schnars, M. Thomas, and W. P. Jüptner, Opt. Eng. 35, 977 (1996).
[CrossRef]

Schroeder, K. S.

Seebacher, S.

S. Seebacher, W. Osten, and W. Jüptner, Proc. SPIE 3479, 104 (1998); T. M. Kreis, W. P. O. Jeuptner, and J. Geldmacher, Proc. SPIE 3407, 169 (1998).
[CrossRef]

Sheppard, C. J. R.

C. J. R. Sheppard and D. M. Shotton, Confocal Laser Scanning Microscopy (Springer, New York, 1997).

Shotton, D. M.

C. J. R. Sheppard and D. M. Shotton, Confocal Laser Scanning Microscopy (Springer, New York, 1997).

Trester, S.

S. Trester, Am. J. Phys. 64, 472 (1996).
[CrossRef]

Wenger, E.

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. I. Dimitrov, and E. Wenger, Opt. Lasers Eng. 29, 361 (1998).
[CrossRef]

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

Yamaguchi, I.

Yang, H. G.

H. G. Yang, C. Y. Ryu, and E. S. Kim, J. Korea Inst. Electron. Eng. D 35, 76 (1998) [in Korean]; H. Yang, K. T. Kim, J. H. Kim, and E. S. Kim, Proc. SPIE 3389, 169 (1998).
[CrossRef]

Yaroslavsky, L. P.

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

Zhang, T.

Am. J. Phys. (1)

S. Trester, Am. J. Phys. 64, 472 (1996).
[CrossRef]

Appl. Opt. (1)

J. Korea Inst. Electron. Eng. D (1)

H. G. Yang, C. Y. Ryu, and E. S. Kim, J. Korea Inst. Electron. Eng. D 35, 76 (1998) [in Korean]; H. Yang, K. T. Kim, J. H. Kim, and E. S. Kim, Proc. SPIE 3389, 169 (1998).
[CrossRef]

Laser Optoelektron. (1)

U. Schnars and W. P. O. Jüptner, Laser Optoelektron. 26, 40 (1994) [in German]; U. Schnars, M. Thomas, and W. P. Jüptner, Opt. Eng. 35, 977 (1996).
[CrossRef]

Opt. Eng. (2)

G. C. Brown and R. J. Pryputniewicz, Opt. Eng. 37, 1398 (1998).
[CrossRef]

T. C. Poon, K. B. Doh, and B. W. Schilling, Opt. Eng. 34, 1338 (1995).?This paper presents a novel method of depth measurement by use of a time-dependent Fresnel zone pattern.
[CrossRef]

Opt. Lasers Eng. (1)

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. I. Dimitrov, and E. Wenger, Opt. Lasers Eng. 29, 361 (1998).
[CrossRef]

Opt. Lett. (3)

Proc. SPIE (3)

S. Seebacher, W. Osten, and W. Jüptner, Proc. SPIE 3479, 104 (1998); T. M. Kreis, W. P. O. Jeuptner, and J. Geldmacher, Proc. SPIE 3407, 169 (1998).
[CrossRef]

T. M. Kreis, M. Adams, and W. P. O. Jüptner, Proc. SPIE 3096, 224 (1997).
[CrossRef]

V. N. Karnaukhov, N. S. Merzlyakov, M. G. Mozerov, L. P. Yaroslavsky, L. I. Dimitrov, and E. Wenger, Proc. SPIE 2363, 164 (1995).
[CrossRef]

Other (2)

P. Hariharan, Optical Holography (Cambridge U. Press, Cambridge, 1996).
[CrossRef]

C. J. R. Sheppard and D. M. Shotton, Confocal Laser Scanning Microscopy (Springer, New York, 1997).

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Figures (4)

Fig. 1
Fig. 1

Apparatus for wavelength-scanning digital interference holography. See text for details.

Fig. 2
Fig. 2

Reconstruction of the image of a single object (OBJ1) by use of a single wavelength: (a) interference between reference and object, (b) intensity pattern of (a) minus those of the reference and object beams, (c) numerically reconstructed image at zi=zo=149 cm.

Fig. 3
Fig. 3

Reconstruction of the images of two objects (OBJ1 and OBJ2) by use of (a) a single wavelength at zi=zo2=165 cm (the image at 149 cm is quite indistinguishable from this image), (b) 11 holograms at zi=zo1=149 cm, or (c) 11 holograms at zi=zo2=165 cm.

Fig. 4
Fig. 4

Reconstructed image patterns as functions of image distance. The horizontal axis is zi (in centimeters) and the vertical axis is a slice of the reconstructed image (in millimeters) along the dotted line in Fig. 3(a): (a) single wavelength or frequency; (b) combination of two holograms at relative frequencies, 0.0 and 1.0 GHz; (c) three relative frequencies, 0.0, 1.0, and 2.0 GHz; (d) 11 relative frequencies, 0.0,1.0,2.0,,10.0 GHz.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

EkQPd3rP APexpikrP.
EQkPd3rP APexpikrPPd3rP APδrP-rQAQ.
Ex,y;z=expik2zx2+y2×FE0x0,y0Sx0,y0;zκx,κy,
Sx,y;z=-ikzexpikz+ik2zx2+y2,

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