Abstract

A trapped-particle near-field scanning optical microscope is constructed by use of submicrometer- or micrometer-sized metallic particles (gold and silver) to increase scattering efficiency. The image contrast of the evanescent-wave interference pattern on the surface of a prism upon total internal reflection, obtained with trapped gold particles of diameter 0.1 and 2 μm, is improved by a factor of approximately 2 and 1.5, respectively, compared with that obtained with trapped polystyrene particles of similar size. The use of a 2μm gold particle leads to image contrast that is approximately three times as great as that obtained with a 0.1μm gold particle, and interference patterns of a subwavelength period are obtained in both cases.

© 1999 Optical Society of America

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References

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1998 (1)

1997 (1)

1994 (8)

1993 (1)

1990 (1)

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).
[CrossRef]

Berns, M.

Block, S. M.

Bopp, M.

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).
[CrossRef]

Chilcott, D.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).
[CrossRef]

Ferrell, T.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).
[CrossRef]

Furukawa, H.

Ghislain, L.

Gu, M.

P. C. Ke and M. Gu, “Characterization of trapping force on metallic Mie particles,” Appl. Opt. (to be published).

Herada, Y.

Hertz, M.

Hipp, M.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).
[CrossRef]

Inouye, Y.

Kawata, S.

Ke, P. C.

P. C. Ke and M. Gu, “Characterization of trapping force on metallic Mie particles,” Appl. Opt. (to be published).

Malmqvist, L.

Marti, O.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).
[CrossRef]

Meixner, A.

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).
[CrossRef]

Mertz, J.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).
[CrossRef]

Mlynek, J.

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).
[CrossRef]

Moyer, P.

M. Paesler and P. Moyer, Near-Field Optics (Wiley, New York, 1996).

Nakamura, O.

Okada, T.

Paesler, M.

M. Paesler and P. Moyer, Near-Field Optics (Wiley, New York, 1996).

Reddick, R.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).
[CrossRef]

Sato, S.

Sharp, S.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).
[CrossRef]

Sonek, G.

Sugiura, T.

T. Sugiura, T. Okada, Y. Inouye, O. Nakamura, and S. Kawata, Opt. Lett. 22, 1663 (1997).
[CrossRef]

S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994).
[CrossRef]

Svoboda, K.

Tarrach, G.

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).
[CrossRef]

Warmack, R.

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).
[CrossRef]

Waseda, Y.

Webb, W.

Wright, W.

Yamaguchi, I.

Appl. Opt. (2)

W. Wright, G. Sonek, and M. Berns, Appl. Opt. 33, 1735 (1994).
[CrossRef] [PubMed]

A. Meixner, M. Bopp, and G. Tarrach, Appl. Opt. 34, 7995 (1994).
[CrossRef]

Appl. Phys. Lett. (1)

J. Mertz, M. Hipp, J. Mlynek, and O. Marti, Appl. Phys. Lett. 64, 2338 (1994).
[CrossRef]

Jpn. J. Appl. Phys. (1)

S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994).
[CrossRef]

Opt. Lett. (7)

Rev. Sci. Instrum. (1)

R. Reddick, R. Warmack, D. Chilcott, S. Sharp, and T. Ferrell, Rev. Sci. Instrum. 61, 3669 (1990).
[CrossRef]

Other (2)

M. Paesler and P. Moyer, Near-Field Optics (Wiley, New York, 1996).

P. C. Ke and M. Gu, “Characterization of trapping force on metallic Mie particles,” Appl. Opt. (to be published).

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Figures (3)

Fig. 1
Fig. 1

Schematic diagram of the trapped-particle near-field microscope.

Fig. 2
Fig. 2

Images of the evanescent-wave interference pattern recorded with a trapped particle of diameter 0.1 μm: (a) polystyrene, (b) gold.

Fig. 3
Fig. 3

Images of the evanescent-wave interference pattern recorded with a trapped particle of diameter 2 μm: (a) polystyrene, (b) gold, (c) silver.

Tables (1)

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Table 1 Scattered-Signal Strength for Different Types of Trapped Particles with Evanescent Waves from the Surface of a Prism

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