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Dispersive-scan measurement of the fast component of the third-order nonlinearity of bulk materials and waveguides

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Abstract

A new, simple method to measure the nonlinear refraction and absorption of bulk material and waveguides is proposed. The method relies on the evolution of the intensity and width of femtosecond-pulse spectra, owing to self-phase modulation, as a function of variable chirp and stretching introduced at the input.

© 1999 Optical Society of America

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