Abstract

A new type of optical filter is predicted theoretically and verified experimentally. The filter operates under guided-mode resonance conditions in a thin-film waveguide grating. A high-efficiency reflection filter response is produced at the Brewster angle at which TM reflection is classically prohibited. Low-reflectance sidebands are obtained that are adjacent to the resonance peak induced by the Brewster effect in the neighborhood of the resonance peak. A double-layer waveguide grating yields 94% experimental reflectance at the thin-film Brewster angle for a Gaussian laser beam with TM polarization at the 1064-nm wavelength.

© 1998 Optical Society of America

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1997

S. Tibuleac and R. Magnusson, IEEE Photon. Technol. Lett. 9, 464 (1997).
[CrossRef]

D. Shin, S. Tibuleac, T. A. Maldonado, and R. Magnusson, Proc. SPIE 3133, 273 (1997).
[CrossRef]

1996

1995

1994

R. Magnusson, S. S. Wang, T. D. Black, and A. Sohn, IEEE Trans. Antennas Propag. 42, 567 (1994).
[CrossRef]

S. S. Wang and R. Magnusson, Opt. Lett. 19, 919 (1994).
[CrossRef] [PubMed]

1993

1992

R. Magnusson and S. S. Wang, Appl. Phys. Lett. 61, 1022 (1992).
[CrossRef]

1990

M. T. Gale, K. Knop, and R. H. Morf, Proc. SPIE 1210, 83 (1990).
[CrossRef]

1989

S. Zhang and T. Tamir, J. Opt. Soc. Am. A 6, 1368 (1989).
[CrossRef]

I. A. Avrutsky and V. A. Sychugov, J. Mod. Opt. 36, 1527 (1989).
[CrossRef]

1985

L. Mashev and E. Popov, Opt. Commun. 55, 377 (1985).
[CrossRef]

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

1965

A. Hessel and A. A. Oliner, Appl. Opt. 10, 1275 (1965).
[CrossRef]

Avrutsky, I. A.

I. A. Avrutsky and V. A. Sychugov, J. Mod. Opt. 36, 1527 (1989).
[CrossRef]

Black, T. D.

R. Magnusson, S. S. Wang, T. D. Black, and A. Sohn, IEEE Trans. Antennas Propag. 42, 567 (1994).
[CrossRef]

Engel, H.

Friesem, A. A.

Gale, M. T.

M. T. Gale, K. Knop, and R. H. Morf, Proc. SPIE 1210, 83 (1990).
[CrossRef]

Gaylord, T. K.

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

Hessel, A.

A. Hessel and A. A. Oliner, Appl. Opt. 10, 1275 (1965).
[CrossRef]

Knop, K.

M. T. Gale, K. Knop, and R. H. Morf, Proc. SPIE 1210, 83 (1990).
[CrossRef]

Magnusson, R.

D. Shin, S. Tibuleac, T. A. Maldonado, and R. Magnusson, Proc. SPIE 3133, 273 (1997).
[CrossRef]

S. Tibuleac and R. Magnusson, IEEE Photon. Technol. Lett. 9, 464 (1997).
[CrossRef]

S. S. Wang and R. Magnusson, Appl. Opt. 34, 2414 (1995).
[CrossRef] [PubMed]

R. Magnusson, S. S. Wang, T. D. Black, and A. Sohn, IEEE Trans. Antennas Propag. 42, 567 (1994).
[CrossRef]

S. S. Wang and R. Magnusson, Opt. Lett. 19, 919 (1994).
[CrossRef] [PubMed]

S. S. Wang and R. Magnusson, Appl. Opt. 32, 2606 (1993).
[CrossRef] [PubMed]

R. Magnusson and S. S. Wang, Appl. Phys. Lett. 61, 1022 (1992).
[CrossRef]

Maldonado, T. A.

D. Shin, S. Tibuleac, T. A. Maldonado, and R. Magnusson, Proc. SPIE 3133, 273 (1997).
[CrossRef]

Mashev, L.

L. Mashev and E. Popov, Opt. Commun. 55, 377 (1985).
[CrossRef]

Moharam, M. G.

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

Morf, R. H.

M. T. Gale, K. Knop, and R. H. Morf, Proc. SPIE 1210, 83 (1990).
[CrossRef]

Morris, G. M.

Oliner, A. A.

A. Hessel and A. A. Oliner, Appl. Opt. 10, 1275 (1965).
[CrossRef]

Peng, S.

Popov, E.

L. Mashev and E. Popov, Opt. Commun. 55, 377 (1985).
[CrossRef]

Rosenblatt, D.

Sharon, A.

Shin, D.

D. Shin, S. Tibuleac, T. A. Maldonado, and R. Magnusson, Proc. SPIE 3133, 273 (1997).
[CrossRef]

Sohn, A.

R. Magnusson, S. S. Wang, T. D. Black, and A. Sohn, IEEE Trans. Antennas Propag. 42, 567 (1994).
[CrossRef]

Steingrueber, R.

Sychugov, V. A.

I. A. Avrutsky and V. A. Sychugov, J. Mod. Opt. 36, 1527 (1989).
[CrossRef]

Tamir, T.

Tibuleac, S.

S. Tibuleac and R. Magnusson, IEEE Photon. Technol. Lett. 9, 464 (1997).
[CrossRef]

D. Shin, S. Tibuleac, T. A. Maldonado, and R. Magnusson, Proc. SPIE 3133, 273 (1997).
[CrossRef]

Wang, S. S.

Weber, H. G.

Zhang, S.

Appl. Opt.

Appl. Phys. Lett.

R. Magnusson and S. S. Wang, Appl. Phys. Lett. 61, 1022 (1992).
[CrossRef]

IEEE Photon. Technol. Lett.

S. Tibuleac and R. Magnusson, IEEE Photon. Technol. Lett. 9, 464 (1997).
[CrossRef]

IEEE Trans. Antennas Propag.

R. Magnusson, S. S. Wang, T. D. Black, and A. Sohn, IEEE Trans. Antennas Propag. 42, 567 (1994).
[CrossRef]

J. Mod. Opt.

I. A. Avrutsky and V. A. Sychugov, J. Mod. Opt. 36, 1527 (1989).
[CrossRef]

J. Opt. Soc. Am. A

Opt. Commun.

L. Mashev and E. Popov, Opt. Commun. 55, 377 (1985).
[CrossRef]

Opt. Lett.

Proc. IEEE

T. K. Gaylord and M. G. Moharam, Proc. IEEE 73, 894 (1985).
[CrossRef]

Proc. SPIE

D. Shin, S. Tibuleac, T. A. Maldonado, and R. Magnusson, Proc. SPIE 3133, 273 (1997).
[CrossRef]

M. T. Gale, K. Knop, and R. H. Morf, Proc. SPIE 1210, 83 (1990).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Angular response of a single-layer GMR filter for a TM-polarized incident wave with 632.8-nm wavelength. The parameters are nc=1.0, ns=n1L=1.52, n1H=2.0, f=0.5, d1=178.1 nm, and Λ=266.2 nm.

Fig. 2
Fig. 2

Spectral response of the single-layer filter given in Fig.  1 for a TM-polarized wave that is incident at an angle of θ=57.88°.

Fig. 3
Fig. 3

Comparison of the experimentally measured and theoretically calculated angular response of a double-layer GMR filter for a TM-polarized incident wave. A Gaussian laser beam (cw Nd:YAG) with λ=1064 nm and 1mm beam diameter was used for the experiment. The photoresist grating has a sinusoidal grating shape. The parameters used to fit the measured reflectance curve are nc=n1L=1.0, n1H=1.63, n2=1.97, ns=1.45, d1=175 nm, d2=260 nm, and Λ=453.2 nm. The curve in the inset represents the response of the filter, including the substrate, which has a thickness of 2015 µm.

Fig. 4
Fig. 4

Comparison of the experimentally measured and theoretically calculated angular response of a double-layer GMR filter for a TE-polarized incident wave. The parameters are the same as in Fig.  3.

Fig. 5
Fig. 5

Theoretically calculated angular response of the filter described in Fig.  3, including the substrate, which has a thickness of 2015 µm, for a TE-polarized incident wave.

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