Abstract

An apparatus that can characterize and visualize temporal dynamics of spatial light modulators (SLM's) and flat-panel displays is constructed and evaluated by use of a commercially available SLM. The apparatus is based on the stroboscopic video sampling method and has a temporal resolution of the order of microseconds, permitting measurement of a long event >100 ms with a high signal-to-noise ratio. Experimental results demonstrate the visualization of the temporal image sequencing and addressing in an SLM.

© 1998 Optical Society of America

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References

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  1. U. Efron, ed., Spatial Light Modulator Technology, Materials, Devices and Applications (Dekker, New York, 1994).
  2. D. Casasent and C. L. Wilson, “Optical metrology for industrialization of optical information processing,” (National Institute of Standards and Technology, Gaithersburg, Md., September1997).
  3. J. C. Kirsch, D. Gregory, M. W. Thie, and B. K. Jones, Opt. Eng. 31, 963 (1992).
    [CrossRef]
  4. C. Soutar, S. E. Monroe, and J. Knopp, Opt. Eng. 33, 1061 (1994).
    [CrossRef]
  5. M. Moller and H.-J. Bruns, Proc. SPIE 2549, 2 (1995).
    [CrossRef]
  6. Certain commercial equipment or components are identified in this Letter only to specify the experimental procedure adequately. Use of this equipment or components does not constitute an endorsement by the National Institute of Standards and Technology or any other agency of the U.S. Department of Commerce.

1995 (1)

M. Moller and H.-J. Bruns, Proc. SPIE 2549, 2 (1995).
[CrossRef]

1994 (1)

C. Soutar, S. E. Monroe, and J. Knopp, Opt. Eng. 33, 1061 (1994).
[CrossRef]

1992 (1)

J. C. Kirsch, D. Gregory, M. W. Thie, and B. K. Jones, Opt. Eng. 31, 963 (1992).
[CrossRef]

Bruns, H.-J.

M. Moller and H.-J. Bruns, Proc. SPIE 2549, 2 (1995).
[CrossRef]

Casasent, D.

D. Casasent and C. L. Wilson, “Optical metrology for industrialization of optical information processing,” (National Institute of Standards and Technology, Gaithersburg, Md., September1997).

Gregory, D.

J. C. Kirsch, D. Gregory, M. W. Thie, and B. K. Jones, Opt. Eng. 31, 963 (1992).
[CrossRef]

Jones, B. K.

J. C. Kirsch, D. Gregory, M. W. Thie, and B. K. Jones, Opt. Eng. 31, 963 (1992).
[CrossRef]

Kirsch, J. C.

J. C. Kirsch, D. Gregory, M. W. Thie, and B. K. Jones, Opt. Eng. 31, 963 (1992).
[CrossRef]

Knopp, J.

C. Soutar, S. E. Monroe, and J. Knopp, Opt. Eng. 33, 1061 (1994).
[CrossRef]

Moller, M.

M. Moller and H.-J. Bruns, Proc. SPIE 2549, 2 (1995).
[CrossRef]

Monroe, S. E.

C. Soutar, S. E. Monroe, and J. Knopp, Opt. Eng. 33, 1061 (1994).
[CrossRef]

Soutar, C.

C. Soutar, S. E. Monroe, and J. Knopp, Opt. Eng. 33, 1061 (1994).
[CrossRef]

Thie, M. W.

J. C. Kirsch, D. Gregory, M. W. Thie, and B. K. Jones, Opt. Eng. 31, 963 (1992).
[CrossRef]

Wilson, C. L.

D. Casasent and C. L. Wilson, “Optical metrology for industrialization of optical information processing,” (National Institute of Standards and Technology, Gaithersburg, Md., September1997).

Opt. Eng. (2)

J. C. Kirsch, D. Gregory, M. W. Thie, and B. K. Jones, Opt. Eng. 31, 963 (1992).
[CrossRef]

C. Soutar, S. E. Monroe, and J. Knopp, Opt. Eng. 33, 1061 (1994).
[CrossRef]

Proc. SPIE (1)

M. Moller and H.-J. Bruns, Proc. SPIE 2549, 2 (1995).
[CrossRef]

Other (3)

Certain commercial equipment or components are identified in this Letter only to specify the experimental procedure adequately. Use of this equipment or components does not constitute an endorsement by the National Institute of Standards and Technology or any other agency of the U.S. Department of Commerce.

U. Efron, ed., Spatial Light Modulator Technology, Materials, Devices and Applications (Dekker, New York, 1994).

D. Casasent and C. L. Wilson, “Optical metrology for industrialization of optical information processing,” (National Institute of Standards and Technology, Gaithersburg, Md., September1997).

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Figures (3)

Fig. 1
Fig. 1

Stroboscopic temporal characterization and visualization of SLM's: FPD, flat-panel display.

Fig. 2
Fig. 2

Output intensities at two different points at the output plane (A and B, separated from each other by 12  ms in time) as a function of time delays. An image (the numeral 3) is loaded twice (even and odd frames) in 0.03  s.

Fig. 3
Fig. 3

Temporal development of a series of images loaded on a typical active matrix twisted nematic-liquid-crystal SLM. A series of images (the numerals 1, 2, 3, and 4) is presented at video rate, and blank images are added before and after the numbers to show writing and decay of images. The snapshot images are taken every 4  ms, and the delay times are measured with respect to the initial loading of the first pixel (top left-hand corner) of the first image, the numeral 1.

Equations (2)

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SCR=ΔtT×CR,
I×ΔtT×LS,

Metrics