Abstract

We report experimental results that show that the far-field correlation function is sensitive to a small local change in rough-surface geometry, where the speckle spatial correlation rather than the sample ensemble average is adopted. The angular cross-correlation function of the far-field speckles scattered by one-dimensional random rough surfaces is measured when a polarized beam of light is incident upon the rough surface from vacuum, where one part of the surface used is a thin dielectric film deposited upon a glass substrate and the other part is identical to the first except for a localized defect. We envisage application of this sensitivity property to inspection of a sample with a defect by means of speckle mapping.

© 1998 Optical Society of America

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References

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  1. S. Feng, C. Kane, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 61, 834 (1988).
    [CrossRef] [PubMed]
  2. R. Berkovits, M. Kaveh, and S. Feng, Phys. Rev. B 40, 737 (1989).
    [CrossRef]
  3. J. Q. Lu and Z-H. Gu, Appl. Opt. 36, 4562 (1997).
    [CrossRef] [PubMed]
  4. A. Z. Genack, in Scattering and Localization of Classical Waves in Random Media, P. Sheng, ed. (World Scientific, Singapore, 1990), pp. 207–311.
    [CrossRef]
  5. I. Freund, M. Rosenbluh, and S. Feng, Phys. Rev. Lett. 61, 2328 (1988).
    [CrossRef] [PubMed]
  6. T. Chan, Y. Kuga, and A. Ishimaru, in Proceedings of the 1996 IEEE Geoscience and Remote Sensing Symposium (IGARSS'96) (Institute of Electrical and Electronics Engineers, New York, 1996), pp. 2140–2142.
    [CrossRef]
  7. M. E. Knotts, T. R. Michel, and K. A. O'Donnell, J. Opt. Soc. Am. A 9, 1882 (1992).
    [CrossRef]
  8. Z. Q. Lin and Z-H. Gu, Waves Random Media 7, 435 (1997).
  9. E. R. Mendez, M. A. Ponce, V. Ruiz-Cortes, and Z-H. Gu, Appl. Opt. 30, 4103 (1991).
    [CrossRef]

1997 (2)

J. Q. Lu and Z-H. Gu, Appl. Opt. 36, 4562 (1997).
[CrossRef] [PubMed]

Z. Q. Lin and Z-H. Gu, Waves Random Media 7, 435 (1997).

1992 (1)

M. E. Knotts, T. R. Michel, and K. A. O'Donnell, J. Opt. Soc. Am. A 9, 1882 (1992).
[CrossRef]

1991 (1)

1989 (1)

R. Berkovits, M. Kaveh, and S. Feng, Phys. Rev. B 40, 737 (1989).
[CrossRef]

1988 (2)

S. Feng, C. Kane, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 61, 834 (1988).
[CrossRef] [PubMed]

I. Freund, M. Rosenbluh, and S. Feng, Phys. Rev. Lett. 61, 2328 (1988).
[CrossRef] [PubMed]

Berkovits, R.

R. Berkovits, M. Kaveh, and S. Feng, Phys. Rev. B 40, 737 (1989).
[CrossRef]

Chan, T.

T. Chan, Y. Kuga, and A. Ishimaru, in Proceedings of the 1996 IEEE Geoscience and Remote Sensing Symposium (IGARSS'96) (Institute of Electrical and Electronics Engineers, New York, 1996), pp. 2140–2142.
[CrossRef]

Feng, S.

R. Berkovits, M. Kaveh, and S. Feng, Phys. Rev. B 40, 737 (1989).
[CrossRef]

S. Feng, C. Kane, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 61, 834 (1988).
[CrossRef] [PubMed]

I. Freund, M. Rosenbluh, and S. Feng, Phys. Rev. Lett. 61, 2328 (1988).
[CrossRef] [PubMed]

Freund, I.

I. Freund, M. Rosenbluh, and S. Feng, Phys. Rev. Lett. 61, 2328 (1988).
[CrossRef] [PubMed]

Genack, A. Z.

A. Z. Genack, in Scattering and Localization of Classical Waves in Random Media, P. Sheng, ed. (World Scientific, Singapore, 1990), pp. 207–311.
[CrossRef]

Gu, Z-H.

Ishimaru, A.

T. Chan, Y. Kuga, and A. Ishimaru, in Proceedings of the 1996 IEEE Geoscience and Remote Sensing Symposium (IGARSS'96) (Institute of Electrical and Electronics Engineers, New York, 1996), pp. 2140–2142.
[CrossRef]

Kane, C.

S. Feng, C. Kane, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 61, 834 (1988).
[CrossRef] [PubMed]

Kaveh, M.

R. Berkovits, M. Kaveh, and S. Feng, Phys. Rev. B 40, 737 (1989).
[CrossRef]

Knotts, M. E.

M. E. Knotts, T. R. Michel, and K. A. O'Donnell, J. Opt. Soc. Am. A 9, 1882 (1992).
[CrossRef]

Kuga, Y.

T. Chan, Y. Kuga, and A. Ishimaru, in Proceedings of the 1996 IEEE Geoscience and Remote Sensing Symposium (IGARSS'96) (Institute of Electrical and Electronics Engineers, New York, 1996), pp. 2140–2142.
[CrossRef]

Lee, P. A.

S. Feng, C. Kane, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 61, 834 (1988).
[CrossRef] [PubMed]

Lin, Z. Q.

Z. Q. Lin and Z-H. Gu, Waves Random Media 7, 435 (1997).

Lu, J. Q.

Mendez, E. R.

Michel, T. R.

M. E. Knotts, T. R. Michel, and K. A. O'Donnell, J. Opt. Soc. Am. A 9, 1882 (1992).
[CrossRef]

O'Donnell, K. A.

M. E. Knotts, T. R. Michel, and K. A. O'Donnell, J. Opt. Soc. Am. A 9, 1882 (1992).
[CrossRef]

Ponce, M. A.

Rosenbluh, M.

I. Freund, M. Rosenbluh, and S. Feng, Phys. Rev. Lett. 61, 2328 (1988).
[CrossRef] [PubMed]

Ruiz-Cortes, V.

Stone, A. D.

S. Feng, C. Kane, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 61, 834 (1988).
[CrossRef] [PubMed]

Appl. Opt. (2)

J. Opt. Soc. Am. A (1)

M. E. Knotts, T. R. Michel, and K. A. O'Donnell, J. Opt. Soc. Am. A 9, 1882 (1992).
[CrossRef]

Phys. Rev. B (1)

R. Berkovits, M. Kaveh, and S. Feng, Phys. Rev. B 40, 737 (1989).
[CrossRef]

Phys. Rev. Lett. (2)

I. Freund, M. Rosenbluh, and S. Feng, Phys. Rev. Lett. 61, 2328 (1988).
[CrossRef] [PubMed]

S. Feng, C. Kane, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 61, 834 (1988).
[CrossRef] [PubMed]

Waves Random Media (1)

Z. Q. Lin and Z-H. Gu, Waves Random Media 7, 435 (1997).

Other (2)

T. Chan, Y. Kuga, and A. Ishimaru, in Proceedings of the 1996 IEEE Geoscience and Remote Sensing Symposium (IGARSS'96) (Institute of Electrical and Electronics Engineers, New York, 1996), pp. 2140–2142.
[CrossRef]

A. Z. Genack, in Scattering and Localization of Classical Waves in Random Media, P. Sheng, ed. (World Scientific, Singapore, 1990), pp. 207–311.
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Scattering geometry.

Fig. 2
Fig. 2

Angular memory and test lines.

Fig. 3
Fig. 3

Geometry of the sample.

Fig. 4
Fig. 4

Schematic of a sample. Part A is a one-dimensional thin dielectric film deposited upon a glass substrate, and part B is identical to A except for a localized defect.

Fig. 5
Fig. 5

Correlation versus the difference of the scattering angle, Δθs: experimental results for a local defect on the rough surface.

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

ζ0x1=0; ζ0x1ζ0x1=σ2 exp-x12/a2.
ζx1=P exp-x12/b2.
Cθi1, θs1; θi2, θs2=Iθi1, θs1Iθi2, θs2-Iθi1, θs1Iθi2, θs2Iθi1, θs12-Iθi1, θs12Iθi2, θs22-Iθi2, θs221/2,
sinθi1-sinθs1=sinθi2-sinθs2.

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