Focusing light through an interface leads to an aberrated intensity distribution that is highly extended with a relatively low peak intensity. We present a method, using a well-chosen annular aperture, that can greatly improve the localization of the intensity about a prescribed point on the axis. Also, the intensity at that point can be increased significantly. By continuously varying the annulus radii, we can scan the intensity peak through the second medium. This localization and scanning method has possible applications in three-dimensional imaging and lithography.
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