Abstract

We predict theoretically that electromagnetic resonances supported by surface defects can be detected experimentally by study of the scattering of electromagnetic pulses from these defects, and we formulate the optimal conditions for such experiments. Numerical scattering simulations confirm that the proposed scattering probes unambiguously identify resonance signatures. The approach that we suggest proves to be superior to conventional analysis of features in the dependence of the far-field intensity of scattered monochromatic light on its frequency, since these features do not necessarily point at resonant frequencies.

© 1998 Optical Society of America

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