Abstract

An algorithm for expanding the dynamic range of Shack--Hartmann sensors is proposed. The distribution of the spot dislocations is treated with a modified unwrapping algorithm that is widely used in interferometry. The algorithm unwraps the spot dislocations and assigns the spots to their original subapertures, leading to a huge expansion of the dynamic range. For the proposed algorithm there remains a limitation on the maximum wave-front curvature instead of on the maximum wave-front slope. Examples are given that show spot fields that were wrapped four times; the measured wave front had a peak-to-valley value of 116 lambda .

© 1998 America

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  1. I. Ghozeil, in ed. pp., in Optical Shop Testing, Wiley, York, 1978, 0323 349
  2. H. Sickinger, O. Falkenstrfer, N. Lindlein, and J. Schwider, Opt. Eng., 33, 2680, 1994
  3. T. L. Bruno, A. Wirth, and A. J. Jankevics, in Proc. SPIE, 1993
  4. H. Schreiber, O. Falkenstrfer, J. Schwider, and A. Zller, in Proc. SPIE, 1993
  5. N. H. Ching, D. Rosenfeld, and M. Braun, IEEE Trans. Image Process., 1, 355, 1992

1994

H. Sickinger, O. Falkenstrfer, N. Lindlein, and J. Schwider, Opt. Eng., 33, 2680, 1994

1992

N. H. Ching, D. Rosenfeld, and M. Braun, IEEE Trans. Image Process., 1, 355, 1992

1978

I. Ghozeil, in ed. pp., in Optical Shop Testing, Wiley, York, 1978, 0323 349

Braun, M.

N. H. Ching, D. Rosenfeld, and M. Braun, IEEE Trans. Image Process., 1, 355, 1992

Bruno, T. L.

T. L. Bruno, A. Wirth, and A. J. Jankevics, in Proc. SPIE, 1993

Ching, N. H.

N. H. Ching, D. Rosenfeld, and M. Braun, IEEE Trans. Image Process., 1, 355, 1992

Falkenstrfer, O.

H. Sickinger, O. Falkenstrfer, N. Lindlein, and J. Schwider, Opt. Eng., 33, 2680, 1994

H. Schreiber, O. Falkenstrfer, J. Schwider, and A. Zller, in Proc. SPIE, 1993

Ghozeil, I.

I. Ghozeil, in ed. pp., in Optical Shop Testing, Wiley, York, 1978, 0323 349

Jankevics, A. J.

T. L. Bruno, A. Wirth, and A. J. Jankevics, in Proc. SPIE, 1993

Lindlein, N.

H. Sickinger, O. Falkenstrfer, N. Lindlein, and J. Schwider, Opt. Eng., 33, 2680, 1994

Rosenfeld, D.

N. H. Ching, D. Rosenfeld, and M. Braun, IEEE Trans. Image Process., 1, 355, 1992

Schreiber, H.

H. Schreiber, O. Falkenstrfer, J. Schwider, and A. Zller, in Proc. SPIE, 1993

Schwider, J.

H. Sickinger, O. Falkenstrfer, N. Lindlein, and J. Schwider, Opt. Eng., 33, 2680, 1994

H. Schreiber, O. Falkenstrfer, J. Schwider, and A. Zller, in Proc. SPIE, 1993

Sickinger, H.

H. Sickinger, O. Falkenstrfer, N. Lindlein, and J. Schwider, Opt. Eng., 33, 2680, 1994

Wirth, A.

T. L. Bruno, A. Wirth, and A. J. Jankevics, in Proc. SPIE, 1993

Zller, A.

H. Schreiber, O. Falkenstrfer, J. Schwider, and A. Zller, in Proc. SPIE, 1993

IEEE Trans. Image Process.

N. H. Ching, D. Rosenfeld, and M. Braun, IEEE Trans. Image Process., 1, 355, 1992

Opt. Eng.

H. Sickinger, O. Falkenstrfer, N. Lindlein, and J. Schwider, Opt. Eng., 33, 2680, 1994

Other

T. L. Bruno, A. Wirth, and A. J. Jankevics, in Proc. SPIE, 1993

H. Schreiber, O. Falkenstrfer, J. Schwider, and A. Zller, in Proc. SPIE, 1993

I. Ghozeil, in ed. pp., in Optical Shop Testing, Wiley, York, 1978, 0323 349

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